JPH0234142B2 - - Google Patents
Info
- Publication number
- JPH0234142B2 JPH0234142B2 JP56025459A JP2545981A JPH0234142B2 JP H0234142 B2 JPH0234142 B2 JP H0234142B2 JP 56025459 A JP56025459 A JP 56025459A JP 2545981 A JP2545981 A JP 2545981A JP H0234142 B2 JPH0234142 B2 JP H0234142B2
- Authority
- JP
- Japan
- Prior art keywords
- lens
- selected area
- sample
- objective lens
- electron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010894 electron beam technology Methods 0.000 claims description 28
- 230000005284 excitation Effects 0.000 claims description 22
- 238000003384 imaging method Methods 0.000 claims description 14
- 230000004075 alteration Effects 0.000 description 30
- 230000004907 flux Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 1
- 238000001239 high-resolution electron microscopy Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2545981A JPS57141851A (en) | 1981-02-25 | 1981-02-25 | Transmission-type electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2545981A JPS57141851A (en) | 1981-02-25 | 1981-02-25 | Transmission-type electron microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57141851A JPS57141851A (en) | 1982-09-02 |
JPH0234142B2 true JPH0234142B2 (fr) | 1990-08-01 |
Family
ID=12166606
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2545981A Granted JPS57141851A (en) | 1981-02-25 | 1981-02-25 | Transmission-type electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57141851A (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57212755A (en) * | 1981-06-25 | 1982-12-27 | Internatl Precision Inc | Transmission-type electron microscope |
JPS6113540A (ja) * | 1984-06-28 | 1986-01-21 | Internatl Precision Inc | 電子顕微鏡 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6029187A (ja) * | 1983-07-26 | 1985-02-14 | アカベ・オブ・スウエ−デン・アクチボラグ | ミシンへ衣服を案内する方法およびこの方法を遂行するための自動ミシン |
-
1981
- 1981-02-25 JP JP2545981A patent/JPS57141851A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6029187A (ja) * | 1983-07-26 | 1985-02-14 | アカベ・オブ・スウエ−デン・アクチボラグ | ミシンへ衣服を案内する方法およびこの方法を遂行するための自動ミシン |
Also Published As
Publication number | Publication date |
---|---|
JPS57141851A (en) | 1982-09-02 |
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