JPH0232720B2 - - Google Patents

Info

Publication number
JPH0232720B2
JPH0232720B2 JP58240316A JP24031683A JPH0232720B2 JP H0232720 B2 JPH0232720 B2 JP H0232720B2 JP 58240316 A JP58240316 A JP 58240316A JP 24031683 A JP24031683 A JP 24031683A JP H0232720 B2 JPH0232720 B2 JP H0232720B2
Authority
JP
Japan
Prior art keywords
test
column
row
lines
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58240316A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60131700A (ja
Inventor
Misao Higuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP58240316A priority Critical patent/JPS60131700A/ja
Publication of JPS60131700A publication Critical patent/JPS60131700A/ja
Publication of JPH0232720B2 publication Critical patent/JPH0232720B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP58240316A 1983-12-20 1983-12-20 不揮発性半導体メモリ Granted JPS60131700A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58240316A JPS60131700A (ja) 1983-12-20 1983-12-20 不揮発性半導体メモリ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58240316A JPS60131700A (ja) 1983-12-20 1983-12-20 不揮発性半導体メモリ

Publications (2)

Publication Number Publication Date
JPS60131700A JPS60131700A (ja) 1985-07-13
JPH0232720B2 true JPH0232720B2 (enrdf_load_stackoverflow) 1990-07-23

Family

ID=17057649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58240316A Granted JPS60131700A (ja) 1983-12-20 1983-12-20 不揮発性半導体メモリ

Country Status (1)

Country Link
JP (1) JPS60131700A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62128099A (ja) * 1985-11-28 1987-06-10 Fujitsu Ltd ワンタイムｒｏｍの試験回路
JPH04106795A (ja) * 1990-08-28 1992-04-08 Nec Corp 半導体記憶装置
JP3352924B2 (ja) * 1997-09-30 2002-12-03 株式会社荏原製作所 流体機械
JP4727785B2 (ja) * 2000-01-26 2011-07-20 富士通セミコンダクター株式会社 半導体記憶装置及び半導体記憶装置のワード線欠陥検出方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6027120B2 (ja) * 1977-11-04 1985-06-27 日本電気株式会社 プログラマブルメモリ

Also Published As

Publication number Publication date
JPS60131700A (ja) 1985-07-13

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