JPS60131700A - 不揮発性半導体メモリ - Google Patents

不揮発性半導体メモリ

Info

Publication number
JPS60131700A
JPS60131700A JP58240316A JP24031683A JPS60131700A JP S60131700 A JPS60131700 A JP S60131700A JP 58240316 A JP58240316 A JP 58240316A JP 24031683 A JP24031683 A JP 24031683A JP S60131700 A JPS60131700 A JP S60131700A
Authority
JP
Japan
Prior art keywords
test
row
column
cells
row decoder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58240316A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0232720B2 (enrdf_load_stackoverflow
Inventor
Misao Higuchi
樋口　三佐男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP58240316A priority Critical patent/JPS60131700A/ja
Publication of JPS60131700A publication Critical patent/JPS60131700A/ja
Publication of JPH0232720B2 publication Critical patent/JPH0232720B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP58240316A 1983-12-20 1983-12-20 不揮発性半導体メモリ Granted JPS60131700A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58240316A JPS60131700A (ja) 1983-12-20 1983-12-20 不揮発性半導体メモリ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58240316A JPS60131700A (ja) 1983-12-20 1983-12-20 不揮発性半導体メモリ

Publications (2)

Publication Number Publication Date
JPS60131700A true JPS60131700A (ja) 1985-07-13
JPH0232720B2 JPH0232720B2 (enrdf_load_stackoverflow) 1990-07-23

Family

ID=17057649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58240316A Granted JPS60131700A (ja) 1983-12-20 1983-12-20 不揮発性半導体メモリ

Country Status (1)

Country Link
JP (1) JPS60131700A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62128099A (ja) * 1985-11-28 1987-06-10 Fujitsu Ltd ワンタイムｒｏｍの試験回路
JPH04106795A (ja) * 1990-08-28 1992-04-08 Nec Corp 半導体記憶装置
JP2001210098A (ja) * 2000-01-26 2001-08-03 Fujitsu Ltd 半導体記憶装置及び半導体記憶装置のワード線欠陥検出方法
CN1096571C (zh) * 1997-09-30 2002-12-18 株式会社荏原制作所 涡轮式流体机械

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5466042A (en) * 1977-11-04 1979-05-28 Nec Corp Programable read-only memory

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5466042A (en) * 1977-11-04 1979-05-28 Nec Corp Programable read-only memory

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62128099A (ja) * 1985-11-28 1987-06-10 Fujitsu Ltd ワンタイムｒｏｍの試験回路
JPH04106795A (ja) * 1990-08-28 1992-04-08 Nec Corp 半導体記憶装置
CN1096571C (zh) * 1997-09-30 2002-12-18 株式会社荏原制作所 涡轮式流体机械
JP2001210098A (ja) * 2000-01-26 2001-08-03 Fujitsu Ltd 半導体記憶装置及び半導体記憶装置のワード線欠陥検出方法

Also Published As

Publication number Publication date
JPH0232720B2 (enrdf_load_stackoverflow) 1990-07-23

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