JPH0227488Y2 - - Google Patents
Info
- Publication number
- JPH0227488Y2 JPH0227488Y2 JP1982163995U JP16399582U JPH0227488Y2 JP H0227488 Y2 JPH0227488 Y2 JP H0227488Y2 JP 1982163995 U JP1982163995 U JP 1982163995U JP 16399582 U JP16399582 U JP 16399582U JP H0227488 Y2 JPH0227488 Y2 JP H0227488Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- axis
- rotation
- moving
- stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16399582U JPS5967850U (ja) | 1982-10-29 | 1982-10-29 | 試料移動装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16399582U JPS5967850U (ja) | 1982-10-29 | 1982-10-29 | 試料移動装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5967850U JPS5967850U (ja) | 1984-05-08 |
JPH0227488Y2 true JPH0227488Y2 (enrdf_load_stackoverflow) | 1990-07-25 |
Family
ID=30359663
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16399582U Granted JPS5967850U (ja) | 1982-10-29 | 1982-10-29 | 試料移動装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5967850U (enrdf_load_stackoverflow) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53109471A (en) * | 1977-03-07 | 1978-09-25 | Hitachi Ltd | Test piece fine adjuster |
JPS5413765A (en) * | 1977-07-04 | 1979-02-01 | Jeol Ltd | Sample slanting equipment of scanning electron microscope or the like |
-
1982
- 1982-10-29 JP JP16399582U patent/JPS5967850U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5967850U (ja) | 1984-05-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6211988B1 (en) | Optical device for scanning a beam in two axes that are substantially perpendicular to each other | |
JP3500514B2 (ja) | イオン注入機用の走査及び傾動装置 | |
US5329125A (en) | Device for corpuscular-optical examination and/or processing of material samples | |
JP2011067840A (ja) | レーザー加工装置 | |
JPH09236755A (ja) | 顕微鏡の試料ステージの位置補正方法および試料ステージ | |
JPH0414744A (ja) | 電子線ホログラフィ装置 | |
JPH0227488Y2 (enrdf_load_stackoverflow) | ||
TW201203440A (en) | Supporting device and light exposure device | |
JP2019129210A (ja) | ステージ装置、及び処理装置 | |
JPH0530278Y2 (enrdf_load_stackoverflow) | ||
JPS594442Y2 (ja) | 走査電子顕微鏡 | |
JP2000021955A (ja) | 半導体ウエハの外観検査装置 | |
JP2000019093A (ja) | 走査型プローブ顕微鏡の光軸調整機構 | |
JP3702685B2 (ja) | 荷電粒子線装置 | |
JPH07120693A (ja) | 光ビーム走査装置 | |
JP2919598B2 (ja) | X線トポグラフィ装置 | |
JPH08162057A (ja) | 荷電粒子線装置 | |
JP3710023B2 (ja) | クラツキ型スリット装置 | |
JPS6336925Y2 (enrdf_load_stackoverflow) | ||
JPH07161799A (ja) | ステージ装置 | |
JPH06294899A (ja) | 湾曲全反射ミラーカメラ | |
JPH0544726Y2 (enrdf_load_stackoverflow) | ||
JPS59123150A (ja) | 電子線装置における試料移動装置 | |
JPH05273455A (ja) | レーザ加工機の光中継装置 | |
JPS5850610Y2 (ja) | 電子顕微鏡等における試料装置 |