JPS5967850U - 試料移動装置 - Google Patents
試料移動装置Info
- Publication number
- JPS5967850U JPS5967850U JP16399582U JP16399582U JPS5967850U JP S5967850 U JPS5967850 U JP S5967850U JP 16399582 U JP16399582 U JP 16399582U JP 16399582 U JP16399582 U JP 16399582U JP S5967850 U JPS5967850 U JP S5967850U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- moving device
- sample moving
- optical axis
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims 3
- 238000010586 diagram Methods 0.000 description 3
- 230000005284 excitation Effects 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16399582U JPS5967850U (ja) | 1982-10-29 | 1982-10-29 | 試料移動装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16399582U JPS5967850U (ja) | 1982-10-29 | 1982-10-29 | 試料移動装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5967850U true JPS5967850U (ja) | 1984-05-08 |
JPH0227488Y2 JPH0227488Y2 (enrdf_load_stackoverflow) | 1990-07-25 |
Family
ID=30359663
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16399582U Granted JPS5967850U (ja) | 1982-10-29 | 1982-10-29 | 試料移動装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5967850U (enrdf_load_stackoverflow) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53109471A (en) * | 1977-03-07 | 1978-09-25 | Hitachi Ltd | Test piece fine adjuster |
JPS5413765A (en) * | 1977-07-04 | 1979-02-01 | Jeol Ltd | Sample slanting equipment of scanning electron microscope or the like |
-
1982
- 1982-10-29 JP JP16399582U patent/JPS5967850U/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53109471A (en) * | 1977-03-07 | 1978-09-25 | Hitachi Ltd | Test piece fine adjuster |
JPS5413765A (en) * | 1977-07-04 | 1979-02-01 | Jeol Ltd | Sample slanting equipment of scanning electron microscope or the like |
Also Published As
Publication number | Publication date |
---|---|
JPH0227488Y2 (enrdf_load_stackoverflow) | 1990-07-25 |
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