JPH02135762A - 半導体装置 - Google Patents
半導体装置Info
- Publication number
- JPH02135762A JPH02135762A JP63290779A JP29077988A JPH02135762A JP H02135762 A JPH02135762 A JP H02135762A JP 63290779 A JP63290779 A JP 63290779A JP 29077988 A JP29077988 A JP 29077988A JP H02135762 A JPH02135762 A JP H02135762A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor element
- substrate
- adhesive
- bump
- sealing cap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 50
- 239000000758 substrate Substances 0.000 claims abstract description 30
- 238000007789 sealing Methods 0.000 claims abstract description 22
- 239000000853 adhesive Substances 0.000 claims abstract description 14
- 230000001070 adhesive effect Effects 0.000 claims abstract description 14
- 239000004020 conductor Substances 0.000 claims abstract description 13
- 230000017525 heat dissipation Effects 0.000 abstract description 12
- 238000001723 curing Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000004519 grease Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 230000035882 stress Effects 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 230000008646 thermal stress Effects 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000000016 photochemical curing Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16152—Cap comprising a cavity for hosting the device, e.g. U-shaped cap
Landscapes
- Wire Bonding (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63290779A JPH02135762A (ja) | 1988-11-16 | 1988-11-16 | 半導体装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63290779A JPH02135762A (ja) | 1988-11-16 | 1988-11-16 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02135762A true JPH02135762A (ja) | 1990-05-24 |
JPH0583186B2 JPH0583186B2 (enrdf_load_stackoverflow) | 1993-11-25 |
Family
ID=17760404
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63290779A Granted JPH02135762A (ja) | 1988-11-16 | 1988-11-16 | 半導体装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02135762A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6271058B1 (en) | 1998-01-06 | 2001-08-07 | Nec Corporation | Method of manufacturing semiconductor device in which semiconductor chip is mounted facedown on board |
US6294408B1 (en) * | 1999-01-06 | 2001-09-25 | International Business Machines Corporation | Method for controlling thermal interface gap distance |
JP2002313972A (ja) * | 2001-04-18 | 2002-10-25 | Matsushita Electric Ind Co Ltd | 電子部品組立体および電子部品組立体の製造方法 |
JP2016122783A (ja) * | 2014-12-25 | 2016-07-07 | セイコーNpc株式会社 | 真空封止型モジュール及びその製造方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63118185A (ja) * | 1986-11-06 | 1988-05-23 | 松下電器産業株式会社 | 平板型表示装置の電極接続構造体 |
JPS63133554A (ja) * | 1986-11-25 | 1988-06-06 | Nec Corp | 半導体装置 |
JPS63261841A (ja) * | 1987-04-20 | 1988-10-28 | Fuji Electric Co Ltd | 半導体装置の多層配線基板内埋込実装構造 |
-
1988
- 1988-11-16 JP JP63290779A patent/JPH02135762A/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63118185A (ja) * | 1986-11-06 | 1988-05-23 | 松下電器産業株式会社 | 平板型表示装置の電極接続構造体 |
JPS63133554A (ja) * | 1986-11-25 | 1988-06-06 | Nec Corp | 半導体装置 |
JPS63261841A (ja) * | 1987-04-20 | 1988-10-28 | Fuji Electric Co Ltd | 半導体装置の多層配線基板内埋込実装構造 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6271058B1 (en) | 1998-01-06 | 2001-08-07 | Nec Corporation | Method of manufacturing semiconductor device in which semiconductor chip is mounted facedown on board |
US6294408B1 (en) * | 1999-01-06 | 2001-09-25 | International Business Machines Corporation | Method for controlling thermal interface gap distance |
JP2002313972A (ja) * | 2001-04-18 | 2002-10-25 | Matsushita Electric Ind Co Ltd | 電子部品組立体および電子部品組立体の製造方法 |
JP2016122783A (ja) * | 2014-12-25 | 2016-07-07 | セイコーNpc株式会社 | 真空封止型モジュール及びその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH0583186B2 (enrdf_load_stackoverflow) | 1993-11-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |