JPH01314950A - 検体検査装置 - Google Patents

検体検査装置

Info

Publication number
JPH01314950A
JPH01314950A JP14709588A JP14709588A JPH01314950A JP H01314950 A JPH01314950 A JP H01314950A JP 14709588 A JP14709588 A JP 14709588A JP 14709588 A JP14709588 A JP 14709588A JP H01314950 A JPH01314950 A JP H01314950A
Authority
JP
Japan
Prior art keywords
wavelength
beams
light
wavelengths
absorbance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14709588A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0574020B2 (en, 2012
Inventor
Moritoshi Miyamoto
守敏 宮本
Kazuo Yoshinaga
和夫 吉永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP14709588A priority Critical patent/JPH01314950A/ja
Publication of JPH01314950A publication Critical patent/JPH01314950A/ja
Priority to US07/701,376 priority patent/US5123731A/en
Publication of JPH0574020B2 publication Critical patent/JPH0574020B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
JP14709588A 1988-02-01 1988-06-15 検体検査装置 Granted JPH01314950A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP14709588A JPH01314950A (ja) 1988-06-15 1988-06-15 検体検査装置
US07/701,376 US5123731A (en) 1988-02-01 1991-05-13 Particle measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14709588A JPH01314950A (ja) 1988-06-15 1988-06-15 検体検査装置

Publications (2)

Publication Number Publication Date
JPH01314950A true JPH01314950A (ja) 1989-12-20
JPH0574020B2 JPH0574020B2 (en, 2012) 1993-10-15

Family

ID=15422369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14709588A Granted JPH01314950A (ja) 1988-02-01 1988-06-15 検体検査装置

Country Status (1)

Country Link
JP (1) JPH01314950A (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013064705A (ja) * 2011-09-20 2013-04-11 Hitachi High-Technologies Corp 自動分析装置及び分析方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013064705A (ja) * 2011-09-20 2013-04-11 Hitachi High-Technologies Corp 自動分析装置及び分析方法

Also Published As

Publication number Publication date
JPH0574020B2 (en, 2012) 1993-10-15

Similar Documents

Publication Publication Date Title
US5123731A (en) Particle measuring device
JPH01282447A (ja) 散乱された全内部反射による免疫定量系
US4799796A (en) Method and apparatus for measuring immunological reaction with the aid of phase-modulation of light
JPS62291547A (ja) 物質の濃度測定方法
JPH06174724A (ja) 免疫学的測定装置
JP2675895B2 (ja) 検体処理方法及び検体測定方法及び検体測定装置
CA2539910A1 (en) Method and device for the detection of very small quantities of particles
JPH01314950A (ja) 検体検査装置
JPH03154850A (ja) 検体検査装置
JPH01313737A (ja) 検体検査装置
JPH07113635B2 (ja) 免疫反応におけるプロゾ−ン判定方法
JPS6128866A (ja) 光強度ゆらぎを用いる免疫反応の測定方法および装置
JPH01314949A (ja) 検体検査装置
JPS61173138A (ja) 光強度ゆらぎによる免疫反応測定方法
JPS6259841A (ja) 直線偏光を用いる免疫反応の測定方法および装置
JPH03274462A (ja) 検体検査方法及び装置、並びに検体検査用試薬
JPS6166150A (ja) 免疫反応測定方法
JPH01207663A (ja) 検体検査方法
JPH01270643A (ja) 検体検査方法
JPS61173139A (ja) 光強度ゆらぎによる免疫反応測定方法
JPS63247644A (ja) 免疫反応測定方法
JPH01274038A (ja) 検体検査方法及び検体検査装置
JPH0329836A (ja) 免疫反応の測定方法
JPH03274463A (ja) 検体検査方法及び装置
JPH0436637A (ja) 検体測定方法及び検体測定装置

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees