JPH0119524B2 - - Google Patents
Info
- Publication number
- JPH0119524B2 JPH0119524B2 JP679782A JP679782A JPH0119524B2 JP H0119524 B2 JPH0119524 B2 JP H0119524B2 JP 679782 A JP679782 A JP 679782A JP 679782 A JP679782 A JP 679782A JP H0119524 B2 JPH0119524 B2 JP H0119524B2
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- stage
- scale
- measurement
- micrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 13
- 239000011521 glass Substances 0.000 claims description 6
- 239000012790 adhesive layer Substances 0.000 description 14
- 238000000691 measurement method Methods 0.000 description 4
- 241001422033 Thestylus Species 0.000 description 3
- 230000010365 information processing Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP679782A JPS58124901A (ja) | 1982-01-21 | 1982-01-21 | 缶胴等の厚さ測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP679782A JPS58124901A (ja) | 1982-01-21 | 1982-01-21 | 缶胴等の厚さ測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58124901A JPS58124901A (ja) | 1983-07-25 |
| JPH0119524B2 true JPH0119524B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1989-04-12 |
Family
ID=11648162
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP679782A Granted JPS58124901A (ja) | 1982-01-21 | 1982-01-21 | 缶胴等の厚さ測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58124901A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108775855B (zh) * | 2018-07-16 | 2021-02-12 | 哈尔滨工业大学 | 一种静态破碎过程中通孔环向应变的测量装置 |
-
1982
- 1982-01-21 JP JP679782A patent/JPS58124901A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58124901A (ja) | 1983-07-25 |