JPH01179351U - - Google Patents
Info
- Publication number
- JPH01179351U JPH01179351U JP7633088U JP7633088U JPH01179351U JP H01179351 U JPH01179351 U JP H01179351U JP 7633088 U JP7633088 U JP 7633088U JP 7633088 U JP7633088 U JP 7633088U JP H01179351 U JPH01179351 U JP H01179351U
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- sample
- electron microscope
- preliminary
- vacuum valve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010894 electron beam technology Methods 0.000 claims description 2
- 230000005484 gravity Effects 0.000 claims 1
- 238000000386 microscopy Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 230000005284 excitation Effects 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7633088U JPH0615390Y2 (ja) | 1988-06-10 | 1988-06-10 | 試料予備室を備えた電子顕微鏡 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7633088U JPH0615390Y2 (ja) | 1988-06-10 | 1988-06-10 | 試料予備室を備えた電子顕微鏡 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01179351U true JPH01179351U (enrdf_load_stackoverflow) | 1989-12-22 |
JPH0615390Y2 JPH0615390Y2 (ja) | 1994-04-20 |
Family
ID=31301360
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7633088U Expired - Lifetime JPH0615390Y2 (ja) | 1988-06-10 | 1988-06-10 | 試料予備室を備えた電子顕微鏡 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0615390Y2 (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002313271A (ja) * | 2001-04-10 | 2002-10-25 | Jeol Ltd | 電子顕微鏡 |
CN111948240A (zh) * | 2020-08-17 | 2020-11-17 | 浙江祺跃科技有限公司 | 一种原位高温蠕变疲劳扫描电子显微镜 |
-
1988
- 1988-06-10 JP JP7633088U patent/JPH0615390Y2/ja not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002313271A (ja) * | 2001-04-10 | 2002-10-25 | Jeol Ltd | 電子顕微鏡 |
CN111948240A (zh) * | 2020-08-17 | 2020-11-17 | 浙江祺跃科技有限公司 | 一种原位高温蠕变疲劳扫描电子显微镜 |
CN111948240B (zh) * | 2020-08-17 | 2023-12-22 | 浙江祺跃科技有限公司 | 一种原位高温蠕变疲劳扫描电子显微镜 |
Also Published As
Publication number | Publication date |
---|---|
JPH0615390Y2 (ja) | 1994-04-20 |
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