JPH01133344A - 半導体集積回路の製造方法 - Google Patents
半導体集積回路の製造方法Info
- Publication number
- JPH01133344A JPH01133344A JP62292406A JP29240687A JPH01133344A JP H01133344 A JPH01133344 A JP H01133344A JP 62292406 A JP62292406 A JP 62292406A JP 29240687 A JP29240687 A JP 29240687A JP H01133344 A JPH01133344 A JP H01133344A
- Authority
- JP
- Japan
- Prior art keywords
- region
- lower electrode
- conductivity type
- forming
- type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 14
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 239000010408 film Substances 0.000 claims abstract description 26
- 238000002955 isolation Methods 0.000 claims abstract description 16
- 239000010409 thin film Substances 0.000 claims abstract description 15
- 238000000034 method Methods 0.000 claims description 30
- 239000003990 capacitor Substances 0.000 claims description 22
- 239000000758 substrate Substances 0.000 claims description 17
- 239000012535 impurity Substances 0.000 claims description 5
- 238000000151 deposition Methods 0.000 claims description 2
- 238000009792 diffusion process Methods 0.000 abstract description 25
- 238000010438 heat treatment Methods 0.000 abstract description 7
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 abstract description 4
- 229910052796 boron Inorganic materials 0.000 abstract description 4
- 230000003321 amplification Effects 0.000 abstract description 3
- 238000003199 nucleic acid amplification method Methods 0.000 abstract description 3
- 238000005121 nitriding Methods 0.000 abstract 2
- 230000008021 deposition Effects 0.000 abstract 1
- 238000000926 separation method Methods 0.000 description 9
- 150000004767 nitrides Chemical class 0.000 description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 229910052698 phosphorus Inorganic materials 0.000 description 4
- 239000011574 phosphorus Substances 0.000 description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 238000010292 electrical insulation Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 229910052787 antimony Inorganic materials 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 238000001505 atmospheric-pressure chemical vapour deposition Methods 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Landscapes
- Bipolar Integrated Circuits (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62292406A JPH01133344A (ja) | 1987-11-19 | 1987-11-19 | 半導体集積回路の製造方法 |
| KR1019880015179A KR910009784B1 (ko) | 1987-11-17 | 1988-11-17 | 반도체집적회로의제조방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62292406A JPH01133344A (ja) | 1987-11-19 | 1987-11-19 | 半導体集積回路の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01133344A true JPH01133344A (ja) | 1989-05-25 |
| JPH0583191B2 JPH0583191B2 (enExample) | 1993-11-25 |
Family
ID=17781371
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62292406A Granted JPH01133344A (ja) | 1987-11-17 | 1987-11-19 | 半導体集積回路の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01133344A (enExample) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54109388A (en) * | 1978-02-15 | 1979-08-27 | Matsushita Electric Ind Co Ltd | Semiconductor integrated circuit |
| JPS621259A (ja) * | 1985-06-26 | 1987-01-07 | Sharp Corp | 半導体抵抗素子の形成方法 |
-
1987
- 1987-11-19 JP JP62292406A patent/JPH01133344A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54109388A (en) * | 1978-02-15 | 1979-08-27 | Matsushita Electric Ind Co Ltd | Semiconductor integrated circuit |
| JPS621259A (ja) * | 1985-06-26 | 1987-01-07 | Sharp Corp | 半導体抵抗素子の形成方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0583191B2 (enExample) | 1993-11-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH10256270A (ja) | 相補型バイポーラトランジスタおよびその製造方法 | |
| JPS62277745A (ja) | 半導体集積回路 | |
| JPH0123949B2 (enExample) | ||
| JPS6050958A (ja) | トランジスタ集積回路 | |
| JPH02101747A (ja) | 半導体集積回路とその製造方法 | |
| JP2725773B2 (ja) | 半導体集積回路及びその製造方法 | |
| JPH01133344A (ja) | 半導体集積回路の製造方法 | |
| JP2000277622A (ja) | 半導体装置およびその製造方法 | |
| JP2740177B2 (ja) | 半導体集積回路 | |
| JPH01130553A (ja) | 半導体集積回路の製造方法 | |
| JPH01133346A (ja) | 半導体集積回路の製造方法 | |
| JPH01133345A (ja) | 半導体集積回路及びその製造方法 | |
| JPH02135770A (ja) | 半導体集積回路 | |
| JPH01133350A (ja) | 半導体集積回路の製造方法 | |
| JPH01133347A (ja) | 半導体集積回路の製造方法 | |
| JPH02137257A (ja) | 半導体集積回路 | |
| JP2614519B2 (ja) | Mis容量素子を組込んだ半導体集積回路の製造方法 | |
| JPH02137258A (ja) | 半導体集積回路の製造方法 | |
| KR910009784B1 (ko) | 반도체집적회로의제조방법 | |
| JPH0425711B2 (enExample) | ||
| JPH061807B2 (ja) | 半導体集積回路の製造方法 | |
| JP2000294563A (ja) | ラテラルバイポーラトランジスタ | |
| JP2708764B2 (ja) | 半導体集積回路およびその製造方法 | |
| JPH01161749A (ja) | 半導体集積回路の製造方法 | |
| JPH01133349A (ja) | 半導体集積回路の製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |