JP7711071B2 - 半導体装置、及び電子機器 - Google Patents

半導体装置、及び電子機器

Info

Publication number
JP7711071B2
JP7711071B2 JP2022546727A JP2022546727A JP7711071B2 JP 7711071 B2 JP7711071 B2 JP 7711071B2 JP 2022546727 A JP2022546727 A JP 2022546727A JP 2022546727 A JP2022546727 A JP 2022546727A JP 7711071 B2 JP7711071 B2 JP 7711071B2
Authority
JP
Japan
Prior art keywords
insulator
transistor
oxide
conductor
potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2022546727A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2022049448A1 (https=
JPWO2022049448A5 (https=
Inventor
隆徳 松嵜
達也 大貫
舜平 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Publication of JPWO2022049448A1 publication Critical patent/JPWO2022049448A1/ja
Publication of JPWO2022049448A5 publication Critical patent/JPWO2022049448A5/ja
Application granted granted Critical
Publication of JP7711071B2 publication Critical patent/JP7711071B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/221Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements using ferroelectric capacitors
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1078Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
    • G11C7/1096Write circuits, e.g. I/O line write drivers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4096Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C14/00Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
    • G11C14/0009Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a DRAM cell
    • G11C14/0027Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a DRAM cell and the nonvolatile element is a ferroelectric element
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N97/00Electric solid-state thin-film or thick-film devices, not otherwise provided for

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Databases & Information Systems (AREA)
  • Thin Film Transistor (AREA)
  • Semiconductor Memories (AREA)
JP2022546727A 2020-09-06 2021-08-23 半導体装置、及び電子機器 Active JP7711071B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020149505 2020-09-06
JP2020149505 2020-09-06
PCT/IB2021/057699 WO2022049448A1 (ja) 2020-09-06 2021-08-23 半導体装置、及び電子機器

Publications (3)

Publication Number Publication Date
JPWO2022049448A1 JPWO2022049448A1 (https=) 2022-03-10
JPWO2022049448A5 JPWO2022049448A5 (https=) 2024-08-20
JP7711071B2 true JP7711071B2 (ja) 2025-07-22

Family

ID=80490684

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022546727A Active JP7711071B2 (ja) 2020-09-06 2021-08-23 半導体装置、及び電子機器

Country Status (5)

Country Link
US (1) US12230358B2 (https=)
JP (1) JP7711071B2 (https=)
KR (1) KR20230058645A (https=)
CN (1) CN116018644A (https=)
WO (1) WO2022049448A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102544503B1 (ko) * 2021-08-06 2023-06-16 고려대학교 산학협력단 아날로그 캐패시터 메모리 회로의 오차 보상 회로
US12426272B2 (en) * 2022-06-14 2025-09-23 Taiwan Semiconductor Manufacturing Company, Ltd. Ferroelectric tunnel junction memory devices with enhanced read window

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017121046A (ja) 2015-12-28 2017-07-06 株式会社半導体エネルギー研究所 半導体装置
WO2017158465A1 (ja) 2016-03-18 2017-09-21 株式会社半導体エネルギー研究所 記憶装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09120685A (ja) * 1995-10-24 1997-05-06 Sony Corp 強誘電体記憶装置
JP2001102465A (ja) 1999-09-30 2001-04-13 Rohm Co Ltd 不揮発性メモリ
JP2003092533A (ja) * 2001-09-18 2003-03-28 Matsushita Electric Ind Co Ltd 半導体回路及びその駆動方法
JP3960030B2 (ja) 2001-12-11 2007-08-15 富士通株式会社 強誘電体メモリ
WO2005064681A2 (en) 2003-12-22 2005-07-14 Koninklijke Philips Electronics N.V. Non-volatile ferroelectric memory device and manufacturing method
JP5190275B2 (ja) 2008-01-09 2013-04-24 パナソニック株式会社 半導体メモリセル及びそれを用いた半導体メモリアレイ
JP2012256821A (ja) 2010-09-13 2012-12-27 Semiconductor Energy Lab Co Ltd 記憶装置
KR102421299B1 (ko) 2016-09-12 2022-07-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 기억 장치, 이의 구동 방법, 반도체 장치, 전자 부품, 및 전자 기기
US10867675B2 (en) * 2017-07-13 2020-12-15 Micron Technology, Inc. Apparatuses and methods for memory including ferroelectric memory cells and dielectric memory cells
US11985827B2 (en) 2020-01-17 2024-05-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, driving method of semiconductor device, and electronic device
WO2022064308A1 (ja) * 2020-09-22 2022-03-31 株式会社半導体エネルギー研究所 半導体装置の駆動方法
CN116114019A (zh) * 2020-09-22 2023-05-12 株式会社半导体能源研究所 半导体装置及电子设备
US11538520B1 (en) * 2021-09-23 2022-12-27 International Business Machines Corporation Negative-capacitance ferroelectric transistor assisted resistive memory programming

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017121046A (ja) 2015-12-28 2017-07-06 株式会社半導体エネルギー研究所 半導体装置
WO2017158465A1 (ja) 2016-03-18 2017-09-21 株式会社半導体エネルギー研究所 記憶装置

Also Published As

Publication number Publication date
US20230317125A1 (en) 2023-10-05
KR20230058645A (ko) 2023-05-03
US12230358B2 (en) 2025-02-18
WO2022049448A1 (ja) 2022-03-10
JPWO2022049448A1 (https=) 2022-03-10
CN116018644A (zh) 2023-04-25

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