JP7578404B2 - プローブヘッド - Google Patents

プローブヘッド Download PDF

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Publication number
JP7578404B2
JP7578404B2 JP2020050842A JP2020050842A JP7578404B2 JP 7578404 B2 JP7578404 B2 JP 7578404B2 JP 2020050842 A JP2020050842 A JP 2020050842A JP 2020050842 A JP2020050842 A JP 2020050842A JP 7578404 B2 JP7578404 B2 JP 7578404B2
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JP
Japan
Prior art keywords
guide
guide pin
hole
diameter
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2020050842A
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English (en)
Japanese (ja)
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JP2021148699A (ja
JP2021148699A5 (enExample
Inventor
岳史 軣木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Co Ltd filed Critical Yokowo Co Ltd
Priority to JP2020050842A priority Critical patent/JP7578404B2/ja
Priority to TW110108716A priority patent/TWI890749B/zh
Priority to PCT/JP2021/009786 priority patent/WO2021193098A1/ja
Publication of JP2021148699A publication Critical patent/JP2021148699A/ja
Publication of JP2021148699A5 publication Critical patent/JP2021148699A5/ja
Application granted granted Critical
Publication of JP7578404B2 publication Critical patent/JP7578404B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
JP2020050842A 2020-03-23 2020-03-23 プローブヘッド Active JP7578404B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2020050842A JP7578404B2 (ja) 2020-03-23 2020-03-23 プローブヘッド
TW110108716A TWI890749B (zh) 2020-03-23 2021-03-11 探針頭
PCT/JP2021/009786 WO2021193098A1 (ja) 2020-03-23 2021-03-11 プローブヘッド

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020050842A JP7578404B2 (ja) 2020-03-23 2020-03-23 プローブヘッド

Publications (3)

Publication Number Publication Date
JP2021148699A JP2021148699A (ja) 2021-09-27
JP2021148699A5 JP2021148699A5 (enExample) 2023-03-09
JP7578404B2 true JP7578404B2 (ja) 2024-11-06

Family

ID=77848493

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020050842A Active JP7578404B2 (ja) 2020-03-23 2020-03-23 プローブヘッド

Country Status (3)

Country Link
JP (1) JP7578404B2 (enExample)
TW (1) TWI890749B (enExample)
WO (1) WO2021193098A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120720321A (zh) * 2025-09-04 2025-09-30 成都迈特航空制造有限公司 一种桶形游动自锁螺母

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002156415A (ja) 2000-11-16 2002-05-31 Aiwa Co Ltd 基板検査治具
JP2008039496A (ja) 2006-08-03 2008-02-21 Enplas Corp 電気接触子，電気接触子の第１接触部材の成形方法及び電気部品用ソケット
JP2009204619A (ja) 2004-07-28 2009-09-10 Fujitsu Ltd 基板ユニット及びプリント回路板
JP2010120520A (ja) 2008-11-19 2010-06-03 Kanto Auto Works Ltd 自動車のバックドアのガラス組付構造

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60178550U (ja) * 1984-05-02 1985-11-27 黒田精工株式会社 工具ヘツドの取付位置決め装置
JPH0221269A (ja) * 1988-07-08 1990-01-24 Tokyo Electron Ltd プローブ装置
JPH02205782A (ja) * 1989-02-06 1990-08-15 Pfu Ltd 電子機器の完成検査用ピンベースの位置決め機構
JP2971491B2 (ja) * 1989-12-13 1999-11-08 イビデン株式会社 検査装置
JPH04268469A (ja) * 1991-02-25 1992-09-24 Hitachi Ltd 位置決め機構付き測定用プロービング装置
JP3003529B2 (ja) * 1994-12-14 2000-01-31 三菱電機株式会社 変圧器
JPH10311746A (ja) * 1997-05-13 1998-11-24 Furukawa Electric Co Ltd:The ロータリーエンコーダー用センサーユニット
JP3614003B2 (ja) * 1998-11-11 2005-01-26 松下電器産業株式会社 プローブカードの位置決め機構
JP2006266869A (ja) * 2005-03-24 2006-10-05 Enplas Corp コンタクトピン及び電気部品用ソケット
JP7220524B2 (ja) * 2018-06-08 2023-02-10 株式会社エンプラス Ｉｃソケット

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002156415A (ja) 2000-11-16 2002-05-31 Aiwa Co Ltd 基板検査治具
JP2009204619A (ja) 2004-07-28 2009-09-10 Fujitsu Ltd 基板ユニット及びプリント回路板
JP2008039496A (ja) 2006-08-03 2008-02-21 Enplas Corp 電気接触子，電気接触子の第１接触部材の成形方法及び電気部品用ソケット
JP2010120520A (ja) 2008-11-19 2010-06-03 Kanto Auto Works Ltd 自動車のバックドアのガラス組付構造

Also Published As

Publication number Publication date
JP2021148699A (ja) 2021-09-27
TWI890749B (zh) 2025-07-21
TW202136787A (zh) 2021-10-01
WO2021193098A1 (ja) 2021-09-30

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