TWI890749B - 探針頭 - Google Patents

探針頭

Info

Publication number
TWI890749B
TWI890749B TW110108716A TW110108716A TWI890749B TW I890749 B TWI890749 B TW I890749B TW 110108716 A TW110108716 A TW 110108716A TW 110108716 A TW110108716 A TW 110108716A TW I890749 B TWI890749 B TW I890749B
Authority
TW
Taiwan
Prior art keywords
guide
substrate
guide pin
hole
diameter
Prior art date
Application number
TW110108716A
Other languages
English (en)
Chinese (zh)
Other versions
TW202136787A (zh
Inventor
軣木岳史
Original Assignee
日商友華股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商友華股份有限公司 filed Critical 日商友華股份有限公司
Publication of TW202136787A publication Critical patent/TW202136787A/zh
Application granted granted Critical
Publication of TWI890749B publication Critical patent/TWI890749B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
TW110108716A 2020-03-23 2021-03-11 探針頭 TWI890749B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020-050842 2020-03-23
JP2020050842A JP7578404B2 (ja) 2020-03-23 2020-03-23 プローブヘッド

Publications (2)

Publication Number Publication Date
TW202136787A TW202136787A (zh) 2021-10-01
TWI890749B true TWI890749B (zh) 2025-07-21

Family

ID=77848493

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110108716A TWI890749B (zh) 2020-03-23 2021-03-11 探針頭

Country Status (3)

Country Link
JP (1) JP7578404B2 (enExample)
TW (1) TWI890749B (enExample)
WO (1) WO2021193098A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120720321A (zh) * 2025-09-04 2025-09-30 成都迈特航空制造有限公司 一种桶形游动自锁螺母

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008039496A (ja) * 2006-08-03 2008-02-21 Enplas Corp 電気接触子，電気接触子の第１接触部材の成形方法及び電気部品用ソケット
JP2009204619A (ja) * 2004-07-28 2009-09-10 Fujitsu Ltd 基板ユニット及びプリント回路板

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60178550U (ja) * 1984-05-02 1985-11-27 黒田精工株式会社 工具ヘツドの取付位置決め装置
JPH0221269A (ja) * 1988-07-08 1990-01-24 Tokyo Electron Ltd プローブ装置
JPH02205782A (ja) * 1989-02-06 1990-08-15 Pfu Ltd 電子機器の完成検査用ピンベースの位置決め機構
JP2971491B2 (ja) * 1989-12-13 1999-11-08 イビデン株式会社 検査装置
JPH04268469A (ja) * 1991-02-25 1992-09-24 Hitachi Ltd 位置決め機構付き測定用プロービング装置
JP3003529B2 (ja) * 1994-12-14 2000-01-31 三菱電機株式会社 変圧器
JPH10311746A (ja) * 1997-05-13 1998-11-24 Furukawa Electric Co Ltd:The ロータリーエンコーダー用センサーユニット
JP3614003B2 (ja) * 1998-11-11 2005-01-26 松下電器産業株式会社 プローブカードの位置決め機構
JP2002156415A (ja) 2000-11-16 2002-05-31 Aiwa Co Ltd 基板検査治具
JP2006266869A (ja) * 2005-03-24 2006-10-05 Enplas Corp コンタクトピン及び電気部品用ソケット
JP4978867B2 (ja) 2008-11-19 2012-07-18 関東自動車工業株式会社 自動車のバックドアのガラス組付構造
JP7220524B2 (ja) * 2018-06-08 2023-02-10 株式会社エンプラス Ｉｃソケット

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009204619A (ja) * 2004-07-28 2009-09-10 Fujitsu Ltd 基板ユニット及びプリント回路板
JP2008039496A (ja) * 2006-08-03 2008-02-21 Enplas Corp 電気接触子，電気接触子の第１接触部材の成形方法及び電気部品用ソケット

Also Published As

Publication number Publication date
JP2021148699A (ja) 2021-09-27
TW202136787A (zh) 2021-10-01
WO2021193098A1 (ja) 2021-09-30
JP7578404B2 (ja) 2024-11-06

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