JP7393873B2 - 電気的接触子及びプローブカード - Google Patents

電気的接触子及びプローブカード Download PDF

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Publication number
JP7393873B2
JP7393873B2 JP2019065829A JP2019065829A JP7393873B2 JP 7393873 B2 JP7393873 B2 JP 7393873B2 JP 2019065829 A JP2019065829 A JP 2019065829A JP 2019065829 A JP2019065829 A JP 2019065829A JP 7393873 B2 JP7393873 B2 JP 7393873B2
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JP
Japan
Prior art keywords
contact
probe
electrical
substrate
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2019065829A
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English (en)
Japanese (ja)
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JP2020165773A (ja
JP2020165773A5 (enrdf_load_stackoverflow
Inventor
正吾 水谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2019065829A priority Critical patent/JP7393873B2/ja
Priority to TW109103447A priority patent/TWI743670B/zh
Priority to KR1020200020772A priority patent/KR102265641B1/ko
Priority to CN202010216399.2A priority patent/CN111751584B/zh
Publication of JP2020165773A publication Critical patent/JP2020165773A/ja
Publication of JP2020165773A5 publication Critical patent/JP2020165773A5/ja
Application granted granted Critical
Publication of JP7393873B2 publication Critical patent/JP7393873B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06744—Microprobes, i.e. having dimensions as IC details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2019065829A 2019-03-29 2019-03-29 電気的接触子及びプローブカード Active JP7393873B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2019065829A JP7393873B2 (ja) 2019-03-29 2019-03-29 電気的接触子及びプローブカード
TW109103447A TWI743670B (zh) 2019-03-29 2020-02-05 電性接觸元件及探針卡
KR1020200020772A KR102265641B1 (ko) 2019-03-29 2020-02-20 전기적 접촉자 및 프로브 카드
CN202010216399.2A CN111751584B (zh) 2019-03-29 2020-03-25 悬臂型探针及探针卡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019065829A JP7393873B2 (ja) 2019-03-29 2019-03-29 電気的接触子及びプローブカード

Publications (3)

Publication Number Publication Date
JP2020165773A JP2020165773A (ja) 2020-10-08
JP2020165773A5 JP2020165773A5 (enrdf_load_stackoverflow) 2022-03-18
JP7393873B2 true JP7393873B2 (ja) 2023-12-07

Family

ID=72673146

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019065829A Active JP7393873B2 (ja) 2019-03-29 2019-03-29 電気的接触子及びプローブカード

Country Status (4)

Country Link
JP (1) JP7393873B2 (enrdf_load_stackoverflow)
KR (1) KR102265641B1 (enrdf_load_stackoverflow)
CN (1) CN111751584B (enrdf_load_stackoverflow)
TW (1) TWI743670B (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102409029B1 (ko) * 2022-04-12 2022-06-14 이시훈 프로브 핀
KR102791729B1 (ko) * 2022-12-26 2025-04-08 주식회사 코리아 인스트루먼트 본딩 안정성이 개선된 프로브

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011117761A (ja) 2009-12-01 2011-06-16 Japan Electronic Materials Corp プローブカードおよびプローブカードの製造方法
JP2016148566A (ja) 2015-02-12 2016-08-18 日本電子材料株式会社 プローブカード

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3675989B2 (ja) * 1995-11-17 2005-07-27 株式会社テセック 電子部品用コネクタ
JP3307823B2 (ja) * 1996-02-23 2002-07-24 松下電器産業株式会社 電子部品検査用接触体の製造方法
US6535003B2 (en) * 1999-01-29 2003-03-18 Advantest, Corp. Contact structure having silicon finger contactor
JP2006132982A (ja) * 2004-11-02 2006-05-25 Tokyo Electron Ltd プローブ
US8253430B2 (en) * 2005-04-22 2012-08-28 Hewlett-Packard Development Company Circuit board testing using a probe
KR20060124562A (ko) * 2005-05-31 2006-12-05 가부시키가이샤 니혼 마이크로닉스 통전시험용 프로브
JP4792465B2 (ja) * 2005-08-09 2011-10-12 株式会社日本マイクロニクス 通電試験用プローブ
JP5113392B2 (ja) * 2007-01-22 2013-01-09 株式会社日本マイクロニクス プローブおよびそれを用いた電気的接続装置
JP2008203036A (ja) * 2007-02-19 2008-09-04 Micronics Japan Co Ltd 電気的接続装置
KR101369406B1 (ko) * 2008-01-21 2014-03-04 (주) 미코에스앤피 탐침 구조물 및 이를 갖는 전기적 검사 장치
KR100876077B1 (ko) * 2008-04-14 2008-12-26 이억기 초소형 프로브 구조체
JP5968158B2 (ja) * 2012-08-10 2016-08-10 株式会社日本マイクロニクス コンタクトプローブ及びプローブカード
JP2015032285A (ja) * 2013-08-07 2015-02-16 三菱鉛筆株式会社 タッチパネルに用いられるスタイラスペン
JP6532755B2 (ja) * 2014-07-29 2019-06-19 日置電機株式会社 プローブユニット、プローブユニット製造方法および検査方法
JP2018028494A (ja) * 2016-08-19 2018-02-22 株式会社日本マイクロニクス 電気的接続装置及びプローブ支持体
JP2018179721A (ja) * 2017-04-12 2018-11-15 株式会社日本マイクロニクス 電気的接続装置
CN107243543A (zh) * 2017-06-30 2017-10-13 昆山杰顺通精密组件有限公司 弹性探针的制造方法
CN109330038B (zh) * 2018-12-24 2021-05-11 常州市派腾电子技术服务有限公司 雾化器及电子烟

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011117761A (ja) 2009-12-01 2011-06-16 Japan Electronic Materials Corp プローブカードおよびプローブカードの製造方法
JP2016148566A (ja) 2015-02-12 2016-08-18 日本電子材料株式会社 プローブカード

Also Published As

Publication number Publication date
JP2020165773A (ja) 2020-10-08
CN111751584B (zh) 2024-02-09
CN111751584A (zh) 2020-10-09
TW202104906A (zh) 2021-02-01
KR102265641B1 (ko) 2021-06-16
KR20200115103A (ko) 2020-10-07
TWI743670B (zh) 2021-10-21

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