JP7250896B2 - 重畳した画素駆動部を含む表示装置 - Google Patents
重畳した画素駆動部を含む表示装置 Download PDFInfo
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- JP7250896B2 JP7250896B2 JP2021213647A JP2021213647A JP7250896B2 JP 7250896 B2 JP7250896 B2 JP 7250896B2 JP 2021213647 A JP2021213647 A JP 2021213647A JP 2021213647 A JP2021213647 A JP 2021213647A JP 7250896 B2 JP7250896 B2 JP 7250896B2
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- 239000010409 thin film Substances 0.000 claims description 249
- 230000000903 blocking effect Effects 0.000 claims description 103
- 230000005684 electric field Effects 0.000 claims description 102
- -1 siloxane compound Chemical class 0.000 claims description 13
- 239000011810 insulating material Substances 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 238000000926 separation method Methods 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 262
- 239000003990 capacitor Substances 0.000 description 39
- 239000010408 film Substances 0.000 description 26
- 238000010586 diagram Methods 0.000 description 19
- 239000011229 interlayer Substances 0.000 description 15
- 239000000758 substrate Substances 0.000 description 12
- 239000000463 material Substances 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- 239000011241 protective layer Substances 0.000 description 5
- 239000008186 active pharmaceutical agent Substances 0.000 description 3
- 239000003086 colorant Substances 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
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- 238000012986 modification Methods 0.000 description 2
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- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 101100351264 Candida albicans (strain SC5314 / ATCC MYA-2876) PDC11 gene Proteins 0.000 description 1
- 229910005555 GaZnO Inorganic materials 0.000 description 1
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- 239000011521 glass Substances 0.000 description 1
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Description
t≧(VGH/VTH)x(κ/3.9)x(tGI)
式中、tは前記電界遮断層の厚さであり、κは前記電界遮断層の誘電常数であり、VGHは前記第1画素駆動部の前記薄膜トランジスタに印加されるターンオン電圧であり、VTHは前記第2画素駆動部の前記薄膜トランジスタのしきい値電圧であり、tGIは前記第2画素駆動部の前記薄膜トランジスタの前記ゲート電極と前記アクティブ層の間の距離である。
t≧(VGH/VTH)x(κ/3.9)x(tGI)
tακ
t1=t≧(VGH/VTH)x(κ/3.9)x(tGI)
120:遮光層
125、225:バッファ層
145、245:ゲート絶縁膜
170、270:層間絶縁膜
210:電界遮断層
Claims (14)
- 第1画素駆動部、
前記第1画素駆動部上の電界遮断層、
前記電界遮断層上の第2画素駆動部、および
前記第2画素駆動部上の第1表示素子および第2表示素子を含み、
前記第1画素駆動部および前記第2画素駆動部は、それぞれ少なくとも一つの薄膜トランジスタを含み、
前記第1画素駆動部は、前記第2画素駆動部と重畳し、
前記第1表示素子は、前記第1画素駆動部および前記第2画素駆動部と重畳し、
前記第2表示素子は、前記第1画素駆動部および前記第2画素駆動部と重畳し、
前記第1表示素子は、前記第1画素駆動部と連結し、
前記第2表示素子は、前記第2画素駆動部と連結した、表示装置。 - 前記第1画素駆動部と前記第2画素駆動部との間で、前記電界遮断層が1μm以上の厚さを有し、
前記電界遮断層の厚さは、前記第1画素駆動部の上部面と前記第2画素駆動部の下部面との間の距離として定義される、請求項1に記載の表示装置。 - 前記電界遮断層が、3.9以下の誘電定数を有する、請求項1または2に記載の表示装置。
- 前記電界遮断層が、シロキサン化合物を含む、請求項1から3のいずれか一項に記載の表示装置。
- 前記第1画素駆動部および前記第2画素駆動部が、それぞれ2つ以上の薄膜トランジスタを含む、請求項1から4のいずれか一項に記載の表示装置。
- 前記第1画素駆動部および前記第2画素駆動部が、それぞれ4つ以上の薄膜トランジスタを含む、請求項1から4のいずれか一項に記載の表示装置。
- 前記第1画素駆動部のいずれか一つの薄膜トランジスタと前記第2画素駆動部のいずれか一つの薄膜トランジスタが互いに重畳し、
互いに重畳する前記第1画素駆動部の前記薄膜トランジスタと前記第2画素駆動部の前記薄膜トランジスタは、それぞれ
アクティブ層、および
前記アクティブ層と離隔して前記アクティブ層と少なくとも一部が重畳するゲート電極、とを含み、
前記第1画素駆動部の前記薄膜トランジスタの前記ゲート電極と前記第2画素駆動部の前記薄膜トランジスタの前記アクティブ層との間の離隔距離は、1μm以上である、請求項1から6のいずれか一項に記載の表示装置。 - 前記第1表示素子が、第1電極、第1有機発光層および第2電極を含み、
前記第2表示素子が、第1電極、第2有機発光層および第2電極を含む、請求項1から7のいずれか一項に記載の表示装置。 - 前記第1表示素子の前記第1電極および前記第2表示素子の前記第1電極が、それぞれ反射層を有し、
前記第1表示素子と前記第2表示素子は、それぞれ前記第2電極を介して光を放出する上部発光型である、請求項8に記載の表示装置。 - 前記第1表示素子と前記第2表示素子の発光領域を定義するバンク層、
前記第1表示素子と前記第1画素駆動部を連結する第1連結部、および
前記第2表示素子と前記第2画素駆動部を連結する第2連結部、をさらに含み、
前記第1連結部と前記第2連結部のうちの少なくとも一つが、前記バンク層と重畳する、請求項1から9のいずれか一項に記載の表示装置。 - 前記第1連結部の少なくとも一部が、前記バンク層と重畳する、請求項10に記載の表示装置。
- 前記第1連結部が、前記電界遮断層を貫通する第1部分を含み、
前記第1部分は、前記バンク層と重畳する、請求項10に記載の表示装置。 - 前記第1画素駆動部の前記薄膜トランジスタおよび前記第2画素駆動部の前記薄膜トランジスタのそれぞれは、アクティブ層および前記アクティブ層から離隔したゲート電極を含み、
前記電界遮断層の厚さ(t)は、次の式1を満足する請求項1から12のいずれか一項に記載の表示装置:
[式1]
t≧(VGH/VTH)x(κ/3.9)x(tGI)
式中、tは前記電界遮断層の厚さであり、κは前記電界遮断層の誘電定数であり、VGHは前記第1画素駆動部の前記薄膜トランジスタに印加されるターンオン電圧であり、VTHは前記第2画素駆動部の前記薄膜トランジスタのしきい値電圧であり、tGIは前記第2画素駆動部の前記薄膜トランジスタの前記ゲート電極と前記アクティブ層の間の距離である。 - 前記第2画素駆動部は、前記電界遮断層上のバッファ層を含み、前記バッファ層は、絶縁物質からなる、請求項1から13のいずれか一項に記載の表示装置。
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