JP7148598B2 - インプリント方法および装置 - Google Patents
インプリント方法および装置 Download PDFInfo
- Publication number
- JP7148598B2 JP7148598B2 JP2020506151A JP2020506151A JP7148598B2 JP 7148598 B2 JP7148598 B2 JP 7148598B2 JP 2020506151 A JP2020506151 A JP 2020506151A JP 2020506151 A JP2020506151 A JP 2020506151A JP 7148598 B2 JP7148598 B2 JP 7148598B2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- template
- moldable material
- imprint
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/161—Coating processes; Apparatus therefor using a previously coated surface, e.g. by stamping or by transfer lamination
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2012—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image using liquid photohardening compositions, e.g. for the production of reliefs such as flexographic plates or stamps
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C59/00—Surface shaping of articles, e.g. embossing; Apparatus therefor
- B29C59/02—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing
- B29C59/022—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing characterised by the disposition or the configuration, e.g. dimensions, of the embossments or the shaping tools therefor
- B29C2059/023—Microembossing
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/167—Coating processes; Apparatus therefor from the gas phase, by plasma deposition
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/168—Finishing the coated layer, e.g. drying, baking, soaking
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Toxicology (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762565363P | 2017-09-29 | 2017-09-29 | |
| US62/565,363 | 2017-09-29 | ||
| PCT/US2018/047723 WO2019067118A1 (en) | 2017-09-29 | 2018-08-23 | METHOD AND APPARATUS FOR PRINTING |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020535628A JP2020535628A (ja) | 2020-12-03 |
| JP2020535628A5 JP2020535628A5 (enExample) | 2021-07-29 |
| JP7148598B2 true JP7148598B2 (ja) | 2022-10-05 |
Family
ID=65896558
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020506151A Active JP7148598B2 (ja) | 2017-09-29 | 2018-08-23 | インプリント方法および装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10895806B2 (enExample) |
| JP (1) | JP7148598B2 (enExample) |
| KR (1) | KR102317458B1 (enExample) |
| CN (1) | CN111148615A (enExample) |
| TW (1) | TW201916222A (enExample) |
| WO (1) | WO2019067118A1 (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10895806B2 (en) * | 2017-09-29 | 2021-01-19 | Canon Kabushiki Kaisha | Imprinting method and apparatus |
| US10921706B2 (en) * | 2018-06-07 | 2021-02-16 | Canon Kabushiki Kaisha | Systems and methods for modifying mesa sidewalls |
| US11373861B2 (en) | 2019-07-05 | 2022-06-28 | Canon Kabushiki Kaisha | System and method of cleaning mesa sidewalls of a template |
| US11429022B2 (en) | 2019-10-23 | 2022-08-30 | Canon Kabushiki Kaisha | Systems and methods for curing a shaped film |
| US11550216B2 (en) | 2019-11-25 | 2023-01-10 | Canon Kabushiki Kaisha | Systems and methods for curing a shaped film |
| US11366384B2 (en) | 2019-12-18 | 2022-06-21 | Canon Kabushiki Kaisha | Nanoimprint lithography system and method for adjusting a radiation pattern that compensates for slippage of a template |
| US10935885B1 (en) | 2020-02-11 | 2021-03-02 | Canon Kabushiki Kaisha | System and method for cleaning mesa sidewalls |
| US12415357B2 (en) | 2020-10-27 | 2025-09-16 | Canon Kabushiki Kaisha | Method of cleaning fluid dispenser by applying suction force and vibrating meniscus |
| US11994797B2 (en) | 2020-10-28 | 2024-05-28 | Canon Kabushiki Kaisha | System and method for shaping a film with a scaled calibration measurement parameter |
| US11747731B2 (en) | 2020-11-20 | 2023-09-05 | Canon Kabishiki Kaisha | Curing a shaped film using multiple images of a spatial light modulator |
| US12111570B2 (en) | 2021-03-29 | 2024-10-08 | Canon Kabushiki Kaisha | Shaping system with cutouts in an optical diaphragm and method of use |
| JP7612510B2 (ja) * | 2021-05-10 | 2025-01-14 | キヤノン株式会社 | インプリント装置、インプリント方法、及び、物品製造方法 |
| US11614693B2 (en) | 2021-06-30 | 2023-03-28 | Canon Kabushiki Kaisha | Method of determining the initial contact point for partial fields and method of shaping a surface |
| US12269282B2 (en) * | 2021-10-15 | 2025-04-08 | Canon Kabushiki Kaisha | Nanoimprint lithography template with peripheral pockets, system of using the template, and method of using the template |
| US12321103B2 (en) | 2021-12-20 | 2025-06-03 | Canon Kabushiki Kaisha | System and method of generating a set of illumination patterns for use in a photomechanical shaping system |
| US12235587B2 (en) | 2023-03-28 | 2025-02-25 | Canon Kabushiki Kaisha | Method and system for determining initial contact control values for shaping partial fields and method and system for shaping partial fields |
| JP2024171142A (ja) * | 2023-05-29 | 2024-12-11 | キヤノン株式会社 | インプリント装置、インプリント方法、および物品の製造方法。 |
| JP2025065992A (ja) * | 2023-10-10 | 2025-04-22 | キヤノン株式会社 | 成形方法、成形装置、および物品製造方法 |
| CN120176900B (zh) * | 2025-03-12 | 2025-11-14 | 江门市新会区先锋五金制品有限公司 | 用于检测锅底压花设备运行状态的方法和设备 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011108805A (ja) | 2009-11-17 | 2011-06-02 | Dainippon Printing Co Ltd | ナノインプリントによるパターン形成方法 |
| JP2013513950A (ja) | 2009-12-10 | 2013-04-22 | モレキュラー・インプリンツ・インコーポレーテッド | インプリント・リソグラフィ用テンプレート |
| JP2013251560A (ja) | 2013-07-18 | 2013-12-12 | Dainippon Printing Co Ltd | ナノインプリント方法 |
| JP2015046605A (ja) | 2012-10-04 | 2015-03-12 | 大日本印刷株式会社 | インプリント方法およびインプリント装置 |
| JP2016031952A (ja) | 2014-07-25 | 2016-03-07 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
| JP2016111201A (ja) | 2014-12-05 | 2016-06-20 | キヤノン株式会社 | インプリント装置、および物品の製造方法 |
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| US6482742B1 (en) * | 2000-07-18 | 2002-11-19 | Stephen Y. Chou | Fluid pressure imprint lithography |
| US5997963A (en) * | 1998-05-05 | 1999-12-07 | Ultratech Stepper, Inc. | Microchamber |
| JP2002208563A (ja) * | 2001-01-09 | 2002-07-26 | Ebara Corp | 被加工物の加工装置及び加工方法 |
| US6764386B2 (en) * | 2002-01-11 | 2004-07-20 | Applied Materials, Inc. | Air bearing-sealed micro-processing chamber |
| US7019819B2 (en) * | 2002-11-13 | 2006-03-28 | Molecular Imprints, Inc. | Chucking system for modulating shapes of substrates |
| US6936194B2 (en) | 2002-09-05 | 2005-08-30 | Molecular Imprints, Inc. | Functional patterning material for imprint lithography processes |
| US20040065252A1 (en) | 2002-10-04 | 2004-04-08 | Sreenivasan Sidlgata V. | Method of forming a layer on a substrate to facilitate fabrication of metrology standards |
| US8349241B2 (en) | 2002-10-04 | 2013-01-08 | Molecular Imprints, Inc. | Method to arrange features on a substrate to replicate features having minimal dimensional variability |
| US7157036B2 (en) | 2003-06-17 | 2007-01-02 | Molecular Imprints, Inc | Method to reduce adhesion between a conformable region and a pattern of a mold |
| US8211214B2 (en) * | 2003-10-02 | 2012-07-03 | Molecular Imprints, Inc. | Single phase fluid imprint lithography method |
| US7090716B2 (en) * | 2003-10-02 | 2006-08-15 | Molecular Imprints, Inc. | Single phase fluid imprint lithography method |
| CN100517584C (zh) * | 2003-12-19 | 2009-07-22 | 北卡罗来纳大学查珀尔希尔分校 | 使用软或压印光刻法制备隔离的微米-和纳米-结构的方法 |
| US8076386B2 (en) | 2004-02-23 | 2011-12-13 | Molecular Imprints, Inc. | Materials for imprint lithography |
| US7490547B2 (en) | 2004-12-30 | 2009-02-17 | Asml Netherlands B.V. | Imprint lithography |
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| AU2006282042B2 (en) | 2005-06-17 | 2011-12-22 | The University Of North Carolina At Chapel Hill | Nanoparticle fabrication methods, systems, and materials |
| US7670534B2 (en) * | 2005-09-21 | 2010-03-02 | Molecular Imprints, Inc. | Method to control an atmosphere between a body and a substrate |
| US20070138699A1 (en) | 2005-12-21 | 2007-06-21 | Asml Netherlands B.V. | Imprint lithography |
| CN101405087A (zh) | 2006-04-03 | 2009-04-08 | 分子制模股份有限公司 | 光刻印刷系统 |
| US8707890B2 (en) | 2006-07-18 | 2014-04-29 | Asml Netherlands B.V. | Imprint lithography |
| WO2008082650A1 (en) | 2006-12-29 | 2008-07-10 | Molecular Imprints, Inc. | Imprint fluid control |
| US9573319B2 (en) * | 2007-02-06 | 2017-02-21 | Canon Kabushiki Kaisha | Imprinting method and process for producing a member in which a mold contacts a pattern forming layer |
| JP5137635B2 (ja) * | 2007-03-16 | 2013-02-06 | キヤノン株式会社 | インプリント方法、チップの製造方法及びインプリント装置 |
| US8144309B2 (en) * | 2007-09-05 | 2012-03-27 | Asml Netherlands B.V. | Imprint lithography |
| JP5121549B2 (ja) * | 2008-04-21 | 2013-01-16 | 株式会社東芝 | ナノインプリント方法 |
| US8394282B2 (en) * | 2008-06-09 | 2013-03-12 | Board Of Regents, The University Of Texas System | Adaptive nanotopography sculpting |
| US20100096764A1 (en) | 2008-10-20 | 2010-04-22 | Molecular Imprints, Inc. | Gas Environment for Imprint Lithography |
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| US20100109205A1 (en) * | 2008-11-04 | 2010-05-06 | Molecular Imprints, Inc. | Photocatalytic reactions in nano-imprint lithography processes |
| JP4892026B2 (ja) | 2009-03-19 | 2012-03-07 | 株式会社東芝 | パターン形成方法 |
| NL2004685A (en) | 2009-07-27 | 2011-01-31 | Asml Netherlands Bv | Imprint lithography apparatus and method. |
| JP5679850B2 (ja) * | 2011-02-07 | 2015-03-04 | キヤノン株式会社 | インプリント装置、および、物品の製造方法 |
| JP5787691B2 (ja) * | 2011-09-21 | 2015-09-30 | キヤノン株式会社 | インプリント装置、それを用いた物品の製造方法 |
| GB2501681A (en) | 2012-04-30 | 2013-11-06 | Ibm | Nanoimprint lithographic methods |
| JP2013251462A (ja) * | 2012-06-01 | 2013-12-12 | Canon Inc | インプリント装置、および、物品の製造方法 |
| JP5865332B2 (ja) * | 2013-11-01 | 2016-02-17 | キヤノン株式会社 | インプリント装置、物品の製造方法、及びインプリント方法 |
| JP6294679B2 (ja) * | 2014-01-21 | 2018-03-14 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
| JP6525567B2 (ja) * | 2014-12-02 | 2019-06-05 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
| JP2019040957A (ja) * | 2017-08-23 | 2019-03-14 | 東芝メモリ株式会社 | 基板処理装置および遮蔽板 |
| US10895806B2 (en) * | 2017-09-29 | 2021-01-19 | Canon Kabushiki Kaisha | Imprinting method and apparatus |
| US11194247B2 (en) * | 2018-01-31 | 2021-12-07 | Canon Kabushiki Kaisha | Extrusion control by capillary force reduction |
-
2018
- 2018-08-21 US US16/106,147 patent/US10895806B2/en active Active
- 2018-08-23 KR KR1020207008169A patent/KR102317458B1/ko active Active
- 2018-08-23 JP JP2020506151A patent/JP7148598B2/ja active Active
- 2018-08-23 WO PCT/US2018/047723 patent/WO2019067118A1/en not_active Ceased
- 2018-08-23 CN CN201880061840.5A patent/CN111148615A/zh active Pending
- 2018-08-29 TW TW107130129A patent/TW201916222A/zh unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011108805A (ja) | 2009-11-17 | 2011-06-02 | Dainippon Printing Co Ltd | ナノインプリントによるパターン形成方法 |
| JP2013513950A (ja) | 2009-12-10 | 2013-04-22 | モレキュラー・インプリンツ・インコーポレーテッド | インプリント・リソグラフィ用テンプレート |
| JP2015046605A (ja) | 2012-10-04 | 2015-03-12 | 大日本印刷株式会社 | インプリント方法およびインプリント装置 |
| JP2013251560A (ja) | 2013-07-18 | 2013-12-12 | Dainippon Printing Co Ltd | ナノインプリント方法 |
| JP2016031952A (ja) | 2014-07-25 | 2016-03-07 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
| JP2016111201A (ja) | 2014-12-05 | 2016-06-20 | キヤノン株式会社 | インプリント装置、および物品の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2020535628A (ja) | 2020-12-03 |
| CN111148615A (zh) | 2020-05-12 |
| KR20200038306A (ko) | 2020-04-10 |
| TW201916222A (zh) | 2019-04-16 |
| US10895806B2 (en) | 2021-01-19 |
| KR102317458B1 (ko) | 2021-10-27 |
| WO2019067118A1 (en) | 2019-04-04 |
| US20190101823A1 (en) | 2019-04-04 |
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