JP7130247B2 - プローブ及び太陽電池セル用測定装置 - Google Patents

プローブ及び太陽電池セル用測定装置 Download PDF

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JP7130247B2
JP7130247B2 JP2019102660A JP2019102660A JP7130247B2 JP 7130247 B2 JP7130247 B2 JP 7130247B2 JP 2019102660 A JP2019102660 A JP 2019102660A JP 2019102660 A JP2019102660 A JP 2019102660A JP 7130247 B2 JP7130247 B2 JP 7130247B2
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thin plate
pair
probe
solar cell
main body
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Japanese (ja)
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JP2020197413A (ja
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久嗣 小島
裕二 中道
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共進電機株式会社
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Priority to JP2019102660A priority Critical patent/JP7130247B2/ja
Priority to KR1020200043873A priority patent/KR102343192B1/ko
Priority to CN202010304414.9A priority patent/CN112017982B/zh
Publication of JP2020197413A publication Critical patent/JP2020197413A/ja
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    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Photovoltaic Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP2019102660A 2019-05-31 2019-05-31 プローブ及び太陽電池セル用測定装置 Active JP7130247B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2019102660A JP7130247B2 (ja) 2019-05-31 2019-05-31 プローブ及び太陽電池セル用測定装置
KR1020200043873A KR102343192B1 (ko) 2019-05-31 2020-04-10 프로브 및 태양전지 셀용 측정 장치
CN202010304414.9A CN112017982B (zh) 2019-05-31 2020-04-17 探针和太阳能电池单元用测量装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019102660A JP7130247B2 (ja) 2019-05-31 2019-05-31 プローブ及び太陽電池セル用測定装置

Publications (2)

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JP2020197413A JP2020197413A (ja) 2020-12-10
JP7130247B2 true JP7130247B2 (ja) 2022-09-05

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JP2019102660A Active JP7130247B2 (ja) 2019-05-31 2019-05-31 プローブ及び太陽電池セル用測定装置

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JP (1) JP7130247B2 (ko)
KR (1) KR102343192B1 (ko)
CN (1) CN112017982B (ko)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003317888A (ja) 2002-04-24 2003-11-07 Enplas Corp 電気部品用ソケット
JP2008122356A (ja) 2006-10-18 2008-05-29 Isao Kimoto プローブ
JP2010181293A (ja) 2009-02-05 2010-08-19 Japan Electronic Materials Corp プローブカード
JP2012021804A (ja) 2010-07-12 2012-02-02 Taiyo Kogyo Co Ltd フライング検査用接触子の保持構造及び回路基板のフライング検査装置
JP2012093127A (ja) 2010-10-25 2012-05-17 Advanced Systems Japan Inc バーチカルプローブヘッド
JP2012242178A (ja) 2011-05-17 2012-12-10 Advanced Systems Japan Inc バーチカルプローブおよびそれを用いたプローブヘッド
JP2013101091A (ja) 2011-11-07 2013-05-23 Takeshi Kaneko コンタクトプローブ装置
JP2013213795A (ja) 2012-04-04 2013-10-17 Sharp Corp 測定治具
JP2017215342A (ja) 2012-04-03 2017-12-07 大日本印刷株式会社 複数の突出した針を備える針体治具および針状物部材

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2819452B2 (ja) * 1994-07-21 1998-10-30 有限会社清田製作所 超微小ピッチ検査用積層プローブコンタクト
JP2001324515A (ja) * 2000-05-17 2001-11-22 Suncall Corp 電子部品検査用コンタクトプローブ装置
JP2001337109A (ja) * 2000-05-26 2001-12-07 Hioki Ee Corp コンタクトプローブ
US6906540B2 (en) * 2001-09-20 2005-06-14 Wentworth Laboratories, Inc. Method for chemically etching photo-defined micro electrical contacts
DE102008038184A1 (de) * 2008-08-19 2010-02-25 Suss Microtec Test Systems Gmbh Verfahren und Vorrichtung zur temporären elektrischen Kontaktierung einer Solarzelle
KR200455080Y1 (ko) * 2010-04-29 2011-08-16 미르테크(주) 태양전지 검사용 프로브 유닛
JP5911127B2 (ja) * 2010-12-07 2016-04-27 デクセリアルズ株式会社 太陽電池セル用出力測定装置及び測定方法
DE102011008261A1 (de) * 2011-01-11 2012-07-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Schiene für die elektrische Kontaktierung eines elektrisch leitfähigen Substrates
JP6442668B2 (ja) * 2014-04-21 2018-12-26 株式会社ネバーグ プローブピンおよびｉｃソケット
WO2015163160A1 (ja) * 2014-04-21 2015-10-29 オーキンス エレクトロニクス カンパニー，リミテッド プローブピンおよびｉｃソケット
EP3361149B1 (en) 2017-02-10 2020-07-08 Harman Professional Denmark ApS Method of reducing sound from light fixture with stepper motors

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003317888A (ja) 2002-04-24 2003-11-07 Enplas Corp 電気部品用ソケット
JP2008122356A (ja) 2006-10-18 2008-05-29 Isao Kimoto プローブ
JP2010181293A (ja) 2009-02-05 2010-08-19 Japan Electronic Materials Corp プローブカード
JP2012021804A (ja) 2010-07-12 2012-02-02 Taiyo Kogyo Co Ltd フライング検査用接触子の保持構造及び回路基板のフライング検査装置
JP2012093127A (ja) 2010-10-25 2012-05-17 Advanced Systems Japan Inc バーチカルプローブヘッド
JP2012242178A (ja) 2011-05-17 2012-12-10 Advanced Systems Japan Inc バーチカルプローブおよびそれを用いたプローブヘッド
JP2013101091A (ja) 2011-11-07 2013-05-23 Takeshi Kaneko コンタクトプローブ装置
JP2017215342A (ja) 2012-04-03 2017-12-07 大日本印刷株式会社 複数の突出した針を備える針体治具および針状物部材
JP2013213795A (ja) 2012-04-04 2013-10-17 Sharp Corp 測定治具

Also Published As

Publication number Publication date
KR102343192B1 (ko) 2021-12-23
CN112017982B (zh) 2024-09-06
CN112017982A (zh) 2020-12-01
JP2020197413A (ja) 2020-12-10
KR20200137968A (ko) 2020-12-09

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