JP7014436B2 - ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法 - Google Patents

ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法 Download PDF

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JP7014436B2
JP7014436B2 JP2018531502A JP2018531502A JP7014436B2 JP 7014436 B2 JP7014436 B2 JP 7014436B2 JP 2018531502 A JP2018531502 A JP 2018531502A JP 2018531502 A JP2018531502 A JP 2018531502A JP 7014436 B2 JP7014436 B2 JP 7014436B2
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dielectric
electrode
ionizer
flow
ionizing
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JP2019500728A5 (enExample
JP2019500728A (ja
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クリストフ ヴォルフ、ヤン
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Plasmion GmbH
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Plasmion GmbH
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • H05H1/2431—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes using cylindrical electrodes, e.g. rotary drums
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • H05H1/2443—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes the plasma fluid flowing through a dielectric tube
    • H05H1/245—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes the plasma fluid flowing through a dielectric tube the plasma being activated using internal electrodes

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Fluid Mechanics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Plasma Technology (AREA)
JP2018531502A 2015-12-17 2016-12-14 ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法 Active JP7014436B2 (ja)

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DE102015122155.1A DE102015122155B4 (de) 2015-12-17 2015-12-17 Verwendung einer Ionisierungsvorrichtung
DE102015122155.1 2015-12-17
PCT/IB2016/057626 WO2017103819A1 (de) 2015-12-17 2016-12-14 Verwendung einer ionisierungsvorrichtung, vorrichtung und verfahren zur ionisation eines gasförmigen stoffes sowie vorrichtung und verfahren zur analyse eines gasförmigen ionisierten stoffes

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JP2019500728A5 JP2019500728A5 (enExample) 2019-12-19
JP7014436B2 true JP7014436B2 (ja) 2022-02-01

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JP2021183159A Pending JP2022020776A (ja) 2015-12-17 2021-11-10 ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法

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US (1) US10777401B2 (enExample)
EP (1) EP3391404B8 (enExample)
JP (2) JP7014436B2 (enExample)
CN (1) CN108701578B (enExample)
CA (1) CA3007449C (enExample)
DE (1) DE102015122155B4 (enExample)
WO (1) WO2017103819A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3639289A2 (de) 2017-06-16 2020-04-22 Plasmion Gmbh Vorrichtung und verfahren zur ionisation eines analyten sowie vorrichtung und verfahren zur analyse eines ionisierten analyten
CA2972600A1 (en) * 2017-07-07 2019-01-07 Teknoscan Systems Inc. Polarization dielectric discharge source for ims instrument
KR101931324B1 (ko) * 2017-09-14 2018-12-20 (주)나노텍 셀프 플라즈마 챔버의 오염 억제 장치
TWI838493B (zh) * 2019-03-25 2024-04-11 日商亞多納富有限公司 氣體分析裝置
CN111263503B (zh) * 2019-12-11 2021-04-27 厦门大学 一种等离子体气动探针及其测量系统
US11621155B2 (en) * 2021-07-29 2023-04-04 Bayspec, Inc. Multi-modal ionization for mass spectrometry
CN114286486A (zh) * 2021-12-31 2022-04-05 中国人民解放军战略支援部队航天工程大学 大气压介质阻挡放电等离子体活性产物测量装置和方法
CN114664636B (zh) * 2022-03-04 2023-03-24 苏州大学 基于介质阻挡放电的空气逆流式离子源
CN116864370A (zh) 2022-03-28 2023-10-10 株式会社岛津制作所 离子源及质谱仪

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110042560A1 (en) 2008-02-12 2011-02-24 Purdue Research Foundation Low temperature plasma probe and methods of use thereof
WO2011089912A1 (ja) 2010-01-25 2011-07-28 株式会社日立ハイテクノロジーズ 質量分析装置
JP2013134817A (ja) 2011-12-26 2013-07-08 Hitachi High-Technologies Corp 質量分析装置及び質量分析方法

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4501965A (en) 1983-01-14 1985-02-26 Mds Health Group Limited Method and apparatus for sampling a plasma into a vacuum chamber
JP2753265B2 (ja) 1988-06-10 1998-05-18 株式会社日立製作所 プラズマイオン化質量分析計
JPH04110653A (ja) 1990-08-31 1992-04-13 Hitachi Ltd プラズマを用いた気体試料の分析方法
US5961772A (en) 1997-01-23 1999-10-05 The Regents Of The University Of California Atmospheric-pressure plasma jet
US6410914B1 (en) 1999-03-05 2002-06-25 Bruker Daltonics Inc. Ionization chamber for atmospheric pressure ionization mass spectrometry
US6407382B1 (en) 1999-06-04 2002-06-18 Technispan Llc Discharge ionization source
US6320388B1 (en) * 1999-06-11 2001-11-20 Rae Systems, Inc. Multiple channel photo-ionization detector for simultaneous and selective measurement of volatile organic compound
US7274015B2 (en) 2001-08-08 2007-09-25 Sionex Corporation Capacitive discharge plasma ion source
US6646256B2 (en) 2001-12-18 2003-11-11 Agilent Technologies, Inc. Atmospheric pressure photoionization source in mass spectrometry
WO2003077280A1 (en) 2002-03-08 2003-09-18 Varian Australia Pty Ltd A plasma mass spectrometer
US7095019B1 (en) 2003-05-30 2006-08-22 Chem-Space Associates, Inc. Remote reagent chemical ionization source
US7005635B2 (en) 2004-02-05 2006-02-28 Metara, Inc. Nebulizer with plasma source
US7256396B2 (en) 2005-06-30 2007-08-14 Ut-Battelle, Llc Sensitive glow discharge ion source for aerosol and gas analysis
US7326926B2 (en) 2005-07-06 2008-02-05 Yang Wang Corona discharge ionization sources for mass spectrometric and ion mobility spectrometric analysis of gas-phase chemical species
US7576322B2 (en) 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
US7642510B2 (en) 2006-08-22 2010-01-05 E.I. Du Pont De Nemours And Company Ion source for a mass spectrometer
TWI337748B (en) * 2007-05-08 2011-02-21 Univ Nat Sun Yat Sen Mass analyzing apparatus
CN101470100B (zh) * 2007-12-27 2012-06-20 同方威视技术股份有限公司 离子迁移谱仪及其方法
US8253098B2 (en) 2008-06-27 2012-08-28 University Of Yamanashi Ionization analysis method and apparatus
US7910896B2 (en) 2008-07-25 2011-03-22 Honeywell International Inc. Micro discharge device ionizer and method of fabricating the same
US20100032559A1 (en) 2008-08-11 2010-02-11 Agilent Technologies, Inc. Variable energy photoionization device and method for mass spectrometry
WO2010037238A1 (en) 2008-10-03 2010-04-08 National Research Council Of Canada Plasma-based direct sampling of molecules for mass spectrometric analysis
US8153964B2 (en) 2009-05-29 2012-04-10 Academia Sinica Ultrasound ionization mass spectrometer
US8247784B2 (en) 2009-07-29 2012-08-21 California Institute Of Technology Switched ferroelectric plasma ionizer
CN102792416B (zh) 2010-02-12 2015-12-16 国立大学法人山梨大学 离子化装置及离子化分析装置
JP5596402B2 (ja) * 2010-04-19 2014-09-24 株式会社日立ハイテクノロジーズ 分析装置、イオン化装置及び分析方法
DE102010044252B4 (de) * 2010-09-02 2014-03-27 Reinhausen Plasma Gmbh Vorrichtung und Verfahren zur Erzeugung einer Barriereentladung in einem Gasstrom
JP5497615B2 (ja) * 2010-11-08 2014-05-21 株式会社日立ハイテクノロジーズ 質量分析装置
GB2498174B (en) 2011-12-12 2016-06-29 Thermo Fisher Scient (Bremen) Gmbh Mass spectrometer vacuum interface method and apparatus
WO2013173813A1 (en) 2012-05-17 2013-11-21 Georgia Tech Research Corporation Sample analyzing system
MX359728B (es) 2013-11-26 2018-10-08 Smiths Detection Montreal Inc Fuentes de ionizacion de descarga de barrera dielectrica para espectrometria.
CN104064429B (zh) * 2014-07-16 2017-02-22 昆山禾信质谱技术有限公司 一种质谱电离源

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110042560A1 (en) 2008-02-12 2011-02-24 Purdue Research Foundation Low temperature plasma probe and methods of use thereof
WO2011089912A1 (ja) 2010-01-25 2011-07-28 株式会社日立ハイテクノロジーズ 質量分析装置
JP2013134817A (ja) 2011-12-26 2013-07-08 Hitachi High-Technologies Corp 質量分析装置及び質量分析方法

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Publication number Publication date
JP2022020776A (ja) 2022-02-01
CN108701578B (zh) 2020-11-03
WO2017103819A1 (de) 2017-06-22
CA3007449C (en) 2024-01-23
CA3007449A1 (en) 2017-06-22
DE102015122155B4 (de) 2018-03-08
US10777401B2 (en) 2020-09-15
US20180366310A1 (en) 2018-12-20
EP3391404A1 (de) 2018-10-24
EP3391404B1 (de) 2025-08-13
CN108701578A (zh) 2018-10-23
DE102015122155A1 (de) 2017-06-22
JP2019500728A (ja) 2019-01-10
EP3391404C0 (de) 2025-08-13
EP3391404B8 (de) 2025-10-08

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