CN108701578B - 电离装置、方法和用途及分析样品物质的分析仪和方法 - Google Patents

电离装置、方法和用途及分析样品物质的分析仪和方法 Download PDF

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Publication number
CN108701578B
CN108701578B CN201680082108.7A CN201680082108A CN108701578B CN 108701578 B CN108701578 B CN 108701578B CN 201680082108 A CN201680082108 A CN 201680082108A CN 108701578 B CN108701578 B CN 108701578B
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electrode
ionization device
ionization
dielectric element
flow
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Chinese (zh)
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CN108701578A (zh
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J-C·沃尔夫
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Plas­mi­on GmbH
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Plas­mi­on GmbH
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/0027Methods for using particle spectrometers
    • H01J49/0031Step by step routines describing the use of the apparatus
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/2406Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/2406Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • H05H1/2431Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes using cylindrical electrodes, e.g. rotary drums
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/2406Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • H05H1/2443Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes the plasma fluid flowing through a dielectric tube
    • H05H1/245Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes the plasma fluid flowing through a dielectric tube the plasma being activated using internal electrodes

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Fluid Mechanics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Plasma Technology (AREA)
CN201680082108.7A 2015-12-17 2016-12-14 电离装置、方法和用途及分析样品物质的分析仪和方法 Active CN108701578B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102015122155.1A DE102015122155B4 (de) 2015-12-17 2015-12-17 Verwendung einer Ionisierungsvorrichtung
DE102015122155.1 2015-12-17
PCT/IB2016/057626 WO2017103819A1 (de) 2015-12-17 2016-12-14 Verwendung einer ionisierungsvorrichtung, vorrichtung und verfahren zur ionisation eines gasförmigen stoffes sowie vorrichtung und verfahren zur analyse eines gasförmigen ionisierten stoffes

Publications (2)

Publication Number Publication Date
CN108701578A CN108701578A (zh) 2018-10-23
CN108701578B true CN108701578B (zh) 2020-11-03

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US (1) US10777401B2 (enExample)
EP (1) EP3391404B8 (enExample)
JP (2) JP7014436B2 (enExample)
CN (1) CN108701578B (enExample)
CA (1) CA3007449C (enExample)
DE (1) DE102015122155B4 (enExample)
WO (1) WO2017103819A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3639289A2 (de) 2017-06-16 2020-04-22 Plasmion Gmbh Vorrichtung und verfahren zur ionisation eines analyten sowie vorrichtung und verfahren zur analyse eines ionisierten analyten
CA2972600A1 (en) * 2017-07-07 2019-01-07 Teknoscan Systems Inc. Polarization dielectric discharge source for ims instrument
KR101931324B1 (ko) * 2017-09-14 2018-12-20 (주)나노텍 셀프 플라즈마 챔버의 오염 억제 장치
TWI838493B (zh) * 2019-03-25 2024-04-11 日商亞多納富有限公司 氣體分析裝置
CN111263503B (zh) * 2019-12-11 2021-04-27 厦门大学 一种等离子体气动探针及其测量系统
US11621155B2 (en) * 2021-07-29 2023-04-04 Bayspec, Inc. Multi-modal ionization for mass spectrometry
CN114286486A (zh) * 2021-12-31 2022-04-05 中国人民解放军战略支援部队航天工程大学 大气压介质阻挡放电等离子体活性产物测量装置和方法
CN114664636B (zh) * 2022-03-04 2023-03-24 苏州大学 基于介质阻挡放电的空气逆流式离子源
CN116864370A (zh) 2022-03-28 2023-10-10 株式会社岛津制作所 离子源及质谱仪

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102468111A (zh) * 2010-11-08 2012-05-23 株式会社日立高新技术 质量分析装置
CN102725818A (zh) * 2010-01-25 2012-10-10 株式会社日立高新技术 质量分析装置
CN103177928A (zh) * 2011-12-26 2013-06-26 株式会社日立高新技术 质量分析装置及质量分析方法
CN104064429A (zh) * 2014-07-16 2014-09-24 昆山禾信质谱技术有限公司 一种质谱电离源

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4501965A (en) 1983-01-14 1985-02-26 Mds Health Group Limited Method and apparatus for sampling a plasma into a vacuum chamber
JP2753265B2 (ja) 1988-06-10 1998-05-18 株式会社日立製作所 プラズマイオン化質量分析計
JPH04110653A (ja) 1990-08-31 1992-04-13 Hitachi Ltd プラズマを用いた気体試料の分析方法
US5961772A (en) 1997-01-23 1999-10-05 The Regents Of The University Of California Atmospheric-pressure plasma jet
US6410914B1 (en) 1999-03-05 2002-06-25 Bruker Daltonics Inc. Ionization chamber for atmospheric pressure ionization mass spectrometry
US6407382B1 (en) 1999-06-04 2002-06-18 Technispan Llc Discharge ionization source
US6320388B1 (en) * 1999-06-11 2001-11-20 Rae Systems, Inc. Multiple channel photo-ionization detector for simultaneous and selective measurement of volatile organic compound
US7274015B2 (en) 2001-08-08 2007-09-25 Sionex Corporation Capacitive discharge plasma ion source
US6646256B2 (en) 2001-12-18 2003-11-11 Agilent Technologies, Inc. Atmospheric pressure photoionization source in mass spectrometry
WO2003077280A1 (en) 2002-03-08 2003-09-18 Varian Australia Pty Ltd A plasma mass spectrometer
US7095019B1 (en) 2003-05-30 2006-08-22 Chem-Space Associates, Inc. Remote reagent chemical ionization source
US7005635B2 (en) 2004-02-05 2006-02-28 Metara, Inc. Nebulizer with plasma source
US7256396B2 (en) 2005-06-30 2007-08-14 Ut-Battelle, Llc Sensitive glow discharge ion source for aerosol and gas analysis
US7326926B2 (en) 2005-07-06 2008-02-05 Yang Wang Corona discharge ionization sources for mass spectrometric and ion mobility spectrometric analysis of gas-phase chemical species
US7576322B2 (en) 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
US7642510B2 (en) 2006-08-22 2010-01-05 E.I. Du Pont De Nemours And Company Ion source for a mass spectrometer
TWI337748B (en) * 2007-05-08 2011-02-21 Univ Nat Sun Yat Sen Mass analyzing apparatus
CN101470100B (zh) * 2007-12-27 2012-06-20 同方威视技术股份有限公司 离子迁移谱仪及其方法
US8519354B2 (en) * 2008-02-12 2013-08-27 Purdue Research Foundation Low temperature plasma probe and methods of use thereof
US8253098B2 (en) 2008-06-27 2012-08-28 University Of Yamanashi Ionization analysis method and apparatus
US7910896B2 (en) 2008-07-25 2011-03-22 Honeywell International Inc. Micro discharge device ionizer and method of fabricating the same
US20100032559A1 (en) 2008-08-11 2010-02-11 Agilent Technologies, Inc. Variable energy photoionization device and method for mass spectrometry
WO2010037238A1 (en) 2008-10-03 2010-04-08 National Research Council Of Canada Plasma-based direct sampling of molecules for mass spectrometric analysis
US8153964B2 (en) 2009-05-29 2012-04-10 Academia Sinica Ultrasound ionization mass spectrometer
US8247784B2 (en) 2009-07-29 2012-08-21 California Institute Of Technology Switched ferroelectric plasma ionizer
CN102792416B (zh) 2010-02-12 2015-12-16 国立大学法人山梨大学 离子化装置及离子化分析装置
JP5596402B2 (ja) * 2010-04-19 2014-09-24 株式会社日立ハイテクノロジーズ 分析装置、イオン化装置及び分析方法
DE102010044252B4 (de) * 2010-09-02 2014-03-27 Reinhausen Plasma Gmbh Vorrichtung und Verfahren zur Erzeugung einer Barriereentladung in einem Gasstrom
GB2498174B (en) 2011-12-12 2016-06-29 Thermo Fisher Scient (Bremen) Gmbh Mass spectrometer vacuum interface method and apparatus
WO2013173813A1 (en) 2012-05-17 2013-11-21 Georgia Tech Research Corporation Sample analyzing system
MX359728B (es) 2013-11-26 2018-10-08 Smiths Detection Montreal Inc Fuentes de ionizacion de descarga de barrera dielectrica para espectrometria.

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102725818A (zh) * 2010-01-25 2012-10-10 株式会社日立高新技术 质量分析装置
CN102468111A (zh) * 2010-11-08 2012-05-23 株式会社日立高新技术 质量分析装置
CN103177928A (zh) * 2011-12-26 2013-06-26 株式会社日立高新技术 质量分析装置及质量分析方法
CN104064429A (zh) * 2014-07-16 2014-09-24 昆山禾信质谱技术有限公司 一种质谱电离源

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Publication number Publication date
JP2022020776A (ja) 2022-02-01
WO2017103819A1 (de) 2017-06-22
CA3007449C (en) 2024-01-23
CA3007449A1 (en) 2017-06-22
DE102015122155B4 (de) 2018-03-08
US10777401B2 (en) 2020-09-15
US20180366310A1 (en) 2018-12-20
EP3391404A1 (de) 2018-10-24
EP3391404B1 (de) 2025-08-13
CN108701578A (zh) 2018-10-23
DE102015122155A1 (de) 2017-06-22
JP2019500728A (ja) 2019-01-10
EP3391404C0 (de) 2025-08-13
JP7014436B2 (ja) 2022-02-01
EP3391404B8 (de) 2025-10-08

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