JP2019500728A5 - - Google Patents

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JP2019500728A5
JP2019500728A5 JP2018531502A JP2018531502A JP2019500728A5 JP 2019500728 A5 JP2019500728 A5 JP 2019500728A5 JP 2018531502 A JP2018531502 A JP 2018531502A JP 2018531502 A JP2018531502 A JP 2018531502A JP 2019500728 A5 JP2019500728 A5 JP 2019500728A5
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Japan
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ionizer
electrode
dielectric
flow
discharge gas
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JP2018531502A
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Japanese (ja)
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JP2019500728A (ja
JP7014436B2 (ja
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JP2018531502A 2015-12-17 2016-12-14 ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法 Active JP7014436B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2021183159A JP2022020776A (ja) 2015-12-17 2021-11-10 ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102015122155.1A DE102015122155B4 (de) 2015-12-17 2015-12-17 Verwendung einer Ionisierungsvorrichtung
DE102015122155.1 2015-12-17
PCT/IB2016/057626 WO2017103819A1 (de) 2015-12-17 2016-12-14 Verwendung einer ionisierungsvorrichtung, vorrichtung und verfahren zur ionisation eines gasförmigen stoffes sowie vorrichtung und verfahren zur analyse eines gasförmigen ionisierten stoffes

Related Child Applications (1)

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JP2021183159A Division JP2022020776A (ja) 2015-12-17 2021-11-10 ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法

Publications (3)

Publication Number Publication Date
JP2019500728A JP2019500728A (ja) 2019-01-10
JP2019500728A5 true JP2019500728A5 (enExample) 2019-12-19
JP7014436B2 JP7014436B2 (ja) 2022-02-01

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JP2018531502A Active JP7014436B2 (ja) 2015-12-17 2016-12-14 ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法
JP2021183159A Pending JP2022020776A (ja) 2015-12-17 2021-11-10 ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法

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JP2021183159A Pending JP2022020776A (ja) 2015-12-17 2021-11-10 ガス状物質のイオン化のためのイオン化装置の使用、装置及び方法、並びにガス状イオン化物質を分析するための装置及び方法

Country Status (7)

Country Link
US (1) US10777401B2 (enExample)
EP (1) EP3391404B8 (enExample)
JP (2) JP7014436B2 (enExample)
CN (1) CN108701578B (enExample)
CA (1) CA3007449C (enExample)
DE (1) DE102015122155B4 (enExample)
WO (1) WO2017103819A1 (enExample)

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CA2972600A1 (en) * 2017-07-07 2019-01-07 Teknoscan Systems Inc. Polarization dielectric discharge source for ims instrument
KR101931324B1 (ko) * 2017-09-14 2018-12-20 (주)나노텍 셀프 플라즈마 챔버의 오염 억제 장치
TWI838493B (zh) * 2019-03-25 2024-04-11 日商亞多納富有限公司 氣體分析裝置
CN111263503B (zh) * 2019-12-11 2021-04-27 厦门大学 一种等离子体气动探针及其测量系统
US11621155B2 (en) * 2021-07-29 2023-04-04 Bayspec, Inc. Multi-modal ionization for mass spectrometry
CN114286486A (zh) * 2021-12-31 2022-04-05 中国人民解放军战略支援部队航天工程大学 大气压介质阻挡放电等离子体活性产物测量装置和方法
CN114664636B (zh) * 2022-03-04 2023-03-24 苏州大学 基于介质阻挡放电的空气逆流式离子源
CN116864370A (zh) 2022-03-28 2023-10-10 株式会社岛津制作所 离子源及质谱仪

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