JP6821436B2 - 電源モニタを用いた電源の較正 - Google Patents

電源モニタを用いた電源の較正 Download PDF

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Publication number
JP6821436B2
JP6821436B2 JP2016558774A JP2016558774A JP6821436B2 JP 6821436 B2 JP6821436 B2 JP 6821436B2 JP 2016558774 A JP2016558774 A JP 2016558774A JP 2016558774 A JP2016558774 A JP 2016558774A JP 6821436 B2 JP6821436 B2 JP 6821436B2
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JP
Japan
Prior art keywords
voltage
processing system
psm
calibration logic
comparison
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JP2016558774A
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Japanese (ja)
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JP2017523383A (ja
JP2017523383A5 (enExample
Inventor
ジェイ． ガーネット アーロン
ジェイ． ガーネット アーロン
エイ． ハーシュバーガー ロバート
エイ． ハーシュバーガー ロバート
サンバムルティ スリラム
サンバムルティ スリラム
ディー． ナフチガー サミュエル
ディー． ナフチガー サミュエル
イー． トレスラー クリストファー
イー． トレスラー クリストファー
カン ショウチェン
カン ショウチェン
ピー． シャノン ジョセフ
ピー． シャノン ジョセフ
サイ バーナチョ クリシュナ
サイ バーナチョ クリシュナ
チンコリ アシュウィン
チンコリ アシュウィン
ジェイ． オースティン マイケル
ジェイ． オースティン マイケル
エフ． リーペ スティーブン
エフ． リーペ スティーブン
ビー． チーマ ウマイール
ビー． チーマ ウマイール
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATI Technologies ULC
Advanced Micro Devices Inc
Original Assignee
ATI Technologies ULC
Advanced Micro Devices Inc
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Publication date
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Publication of JP2017523383A publication Critical patent/JP2017523383A/ja
Publication of JP2017523383A5 publication Critical patent/JP2017523383A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/021—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in voltage or current generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56012—Timing aspects, clock generation, synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3409—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment for performance assessment
    • G06F11/3428—Benchmarking

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Sources (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Power Engineering (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP2016558774A 2014-06-25 2015-06-23 電源モニタを用いた電源の較正 Active JP6821436B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/314,790 2014-06-25
US14/314,790 US10060955B2 (en) 2014-06-25 2014-06-25 Calibrating power supply voltages using reference measurements from code loop executions
PCT/US2015/037158 WO2015200310A1 (en) 2014-06-25 2015-06-23 Calibrating a power supply using power supply monitors

Publications (3)

Publication Number Publication Date
JP2017523383A JP2017523383A (ja) 2017-08-17
JP2017523383A5 JP2017523383A5 (enExample) 2018-08-02
JP6821436B2 true JP6821436B2 (ja) 2021-01-27

Family

ID=54930401

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016558774A Active JP6821436B2 (ja) 2014-06-25 2015-06-23 電源モニタを用いた電源の較正

Country Status (6)

Country Link
US (1) US10060955B2 (enExample)
EP (1) EP3105651B1 (enExample)
JP (1) JP6821436B2 (enExample)
KR (1) KR102170198B1 (enExample)
CN (1) CN106133640B (enExample)
WO (1) WO2015200310A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9825620B2 (en) * 2016-01-21 2017-11-21 Apple Inc. Method and apparatus for digital undervoltage detection and control
KR102576707B1 (ko) * 2016-12-26 2023-09-08 삼성전자주식회사 전자 시스템 및 그 동작 방법
US10296063B2 (en) * 2017-03-30 2019-05-21 Oracle International Corporation Integrated circuit current metering using voltage variation detection circuit
US10585411B2 (en) * 2018-02-06 2020-03-10 Ford Global Technologies, Llc Vehicle power supply control using serial communication
US10627883B2 (en) * 2018-02-28 2020-04-21 Advanced Micro Devices, Inc. Onboard monitoring of voltage levels and droop events
CN109188310A (zh) * 2018-11-07 2019-01-11 内蒙古电力(集团)有限责任公司乌海电业局 开关设备的二次系统的电源模块故障监测装置及系统及监测方法
CN110488195B (zh) * 2019-07-18 2022-01-04 力高(山东)新能源技术有限公司 一种修正动力电池soc的方法
US11264998B1 (en) 2020-09-24 2022-03-01 Advanced Micro Devices, Inc. Reference free and temperature independent voltage-to-digital converter
US11829222B2 (en) 2020-09-25 2023-11-28 Advanced Micro Devices, Inc. Operating voltage adjustment for aging circuits
KR20230017052A (ko) * 2021-07-27 2023-02-03 삼성전자주식회사 다른 전자 장치를 충전하는 전자 장치 및 다른 전자 장치를 충전하는 전자 장치의 제어 방법

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06230078A (ja) * 1993-02-04 1994-08-19 Advantest Corp 電子機器ボードの異常個所検出方法、その装置及びこれに用いる電子機器ボード
JPH06230079A (ja) * 1993-02-08 1994-08-19 Sony Corp 電源電圧可変による基板の不具合検出方法及びその装置
JP2000321329A (ja) * 1999-05-12 2000-11-24 Nec Corp 実装基板の不良探索システム及びその不良探索方法並びにその制御プログラムを記録した記録媒体
JP4378046B2 (ja) * 2000-09-20 2009-12-02 株式会社アドバンテスト 半導体試験装置
JP2002181892A (ja) * 2000-12-11 2002-06-26 Nec Corp 実装基板の不良探索方法、不良探索装置およびその制御プログラムを記録した記録媒体
US7583555B2 (en) 2003-04-11 2009-09-01 Qualcomm Incorporated Robust and Efficient dynamic voltage scaling for portable devices
US20070257642A1 (en) * 2003-06-19 2007-11-08 Sean Xiao Battery cell monitoring and balancing circuit
SE527670C2 (sv) * 2003-12-19 2006-05-09 Ericsson Telefon Ab L M Naturtrogenhetsoptimerad kodning med variabel ramlängd
US20070271473A1 (en) * 2006-05-18 2007-11-22 Eiichi Hosomi Method and system for a semiconductor device with multiple voltage sensors and power control of semiconductor device with multiple voltage sensors
KR100914118B1 (ko) * 2007-04-24 2009-08-27 삼성모바일디스플레이주식회사 유기 전계 발광 표시 장치 및 그 구동 방법
US7919958B2 (en) 2007-05-18 2011-04-05 Texas Instruments Incorporated Methods and apparatus for controlling a digital power supply
US7772811B1 (en) 2007-07-13 2010-08-10 Chil Semiconductor Corporation Power supply configurations and adaptive voltage
JP5259877B2 (ja) * 2009-03-30 2013-08-07 クアルコム，インコーポレイテッド 適応電圧スケーラ（ａｖｓ）、電圧レベルをスケーリングする方法、回路、及び、コンピュータ可読媒体
CN101990071B (zh) * 2009-07-29 2014-09-10 晨星软件研发(深圳)有限公司 可自动校准输出的解调器、方法及其电视接收器
US8368385B2 (en) * 2009-09-25 2013-02-05 Intel Corporation Methods and systems to detect voltage changes within integrated circuits
KR101053531B1 (ko) * 2009-09-30 2011-08-03 주식회사 하이닉스반도체 반도체 장치 및 이의 캘리브레이션 방법
US8378738B1 (en) 2009-10-16 2013-02-19 Marvell International Ltd. Adaptive voltage scaling using a delay line
US8549363B2 (en) * 2010-01-08 2013-10-01 International Business Machines Corporation Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components
US8593171B2 (en) 2010-11-19 2013-11-26 Advanced Micro Devices, Inc. Power supply monitor
US20120218034A1 (en) 2011-02-28 2012-08-30 Sebastian Turullols Voltage calibration method and apparatus
JP5961374B2 (ja) 2011-12-09 2016-08-02 ラピスセミコンダクタ株式会社 電源装置、電源装置の制御方法及び電子機器
US9122472B2 (en) * 2013-03-06 2015-09-01 Dell Products L.P. System and method of measuring real-time current
US9342123B2 (en) * 2013-03-18 2016-05-17 Hewlett Packard Enterprise Development Lp Determine voltage supplied to a core
US9430346B2 (en) * 2013-03-26 2016-08-30 Texas Instruments Incorporated Processor power measurement
US9673651B2 (en) * 2013-11-21 2017-06-06 Qualcomm Incorporated Dynamic voltage adjust circuits and methods
US20160370846A9 (en) * 2014-02-28 2016-12-22 Rightware Oy Power Consumption Measurement Arrangement and Method

Also Published As

Publication number Publication date
US20150378411A1 (en) 2015-12-31
KR20170039073A (ko) 2017-04-10
EP3105651B1 (en) 2020-01-29
WO2015200310A1 (en) 2015-12-30
US10060955B2 (en) 2018-08-28
EP3105651A1 (en) 2016-12-21
CN106133640B (zh) 2020-06-16
JP2017523383A (ja) 2017-08-17
KR102170198B1 (ko) 2020-10-26
CN106133640A (zh) 2016-11-16
EP3105651A4 (en) 2017-11-01

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