KR102170198B1 - 전력 공급 모니터를 사용하여 전력 공급 교정 - Google Patents

전력 공급 모니터를 사용하여 전력 공급 교정 Download PDF

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KR102170198B1
KR102170198B1 KR1020167026236A KR20167026236A KR102170198B1 KR 102170198 B1 KR102170198 B1 KR 102170198B1 KR 1020167026236 A KR1020167026236 A KR 1020167026236A KR 20167026236 A KR20167026236 A KR 20167026236A KR 102170198 B1 KR102170198 B1 KR 102170198B1
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South Korea
Prior art keywords
voltage
processing system
power supply
voltages
psm
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Korean (ko)
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KR20170039073A (ko
Inventor
아론 제이. 그레낫
로버트 에이. 허쉬버거
스리람 삼바머피
사무엘 디. 나프지거
크리스토퍼 이. 트레슬러
소-치엔 강
조셉 피. 섀논
크리쉬나 사이 베르누초
아쉰 친촐리
마이클 제이. 오스틴
스티븐 에프. 리페
우마이르 비. 체마
Original Assignee
어드밴스드 마이크로 디바이시즈, 인코포레이티드
에이티아이 테크놀로지스 유엘씨
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Publication of KR20170039073A publication Critical patent/KR20170039073A/ko
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/263—Arrangements for using multiple switchable power supplies, e.g. battery and AC
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/021—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in voltage or current generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56012—Timing aspects, clock generation, synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3409—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment for performance assessment
    • G06F11/3428—Benchmarking

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Sources (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Power Engineering (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1020167026236A 2014-06-25 2015-06-23 전력 공급 모니터를 사용하여 전력 공급 교정 Active KR102170198B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/314,790 2014-06-25
US14/314,790 US10060955B2 (en) 2014-06-25 2014-06-25 Calibrating power supply voltages using reference measurements from code loop executions
PCT/US2015/037158 WO2015200310A1 (en) 2014-06-25 2015-06-23 Calibrating a power supply using power supply monitors

Publications (2)

Publication Number Publication Date
KR20170039073A KR20170039073A (ko) 2017-04-10
KR102170198B1 true KR102170198B1 (ko) 2020-10-26

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Country Status (6)

Country Link
US (1) US10060955B2 (enExample)
EP (1) EP3105651B1 (enExample)
JP (1) JP6821436B2 (enExample)
KR (1) KR102170198B1 (enExample)
CN (1) CN106133640B (enExample)
WO (1) WO2015200310A1 (enExample)

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US10296063B2 (en) * 2017-03-30 2019-05-21 Oracle International Corporation Integrated circuit current metering using voltage variation detection circuit
US10585411B2 (en) * 2018-02-06 2020-03-10 Ford Global Technologies, Llc Vehicle power supply control using serial communication
US10627883B2 (en) * 2018-02-28 2020-04-21 Advanced Micro Devices, Inc. Onboard monitoring of voltage levels and droop events
CN109188310A (zh) * 2018-11-07 2019-01-11 内蒙古电力(集团)有限责任公司乌海电业局 开关设备的二次系统的电源模块故障监测装置及系统及监测方法
CN110488195B (zh) * 2019-07-18 2022-01-04 力高(山东)新能源技术有限公司 一种修正动力电池soc的方法
US11264998B1 (en) 2020-09-24 2022-03-01 Advanced Micro Devices, Inc. Reference free and temperature independent voltage-to-digital converter
US11829222B2 (en) * 2020-09-25 2023-11-28 Advanced Micro Devices, Inc. Operating voltage adjustment for aging circuits
KR20230017052A (ko) * 2021-07-27 2023-02-03 삼성전자주식회사 다른 전자 장치를 충전하는 전자 장치 및 다른 전자 장치를 충전하는 전자 장치의 제어 방법

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JPH06230078A (ja) * 1993-02-04 1994-08-19 Advantest Corp 電子機器ボードの異常個所検出方法、その装置及びこれに用いる電子機器ボード
JPH06230079A (ja) * 1993-02-08 1994-08-19 Sony Corp 電源電圧可変による基板の不具合検出方法及びその装置
JP2000321329A (ja) * 1999-05-12 2000-11-24 Nec Corp 実装基板の不良探索システム及びその不良探索方法並びにその制御プログラムを記録した記録媒体
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US7583555B2 (en) 2003-04-11 2009-09-01 Qualcomm Incorporated Robust and Efficient dynamic voltage scaling for portable devices
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Also Published As

Publication number Publication date
CN106133640A (zh) 2016-11-16
KR20170039073A (ko) 2017-04-10
EP3105651A4 (en) 2017-11-01
EP3105651B1 (en) 2020-01-29
WO2015200310A1 (en) 2015-12-30
JP6821436B2 (ja) 2021-01-27
US20150378411A1 (en) 2015-12-31
US10060955B2 (en) 2018-08-28
JP2017523383A (ja) 2017-08-17
EP3105651A1 (en) 2016-12-21
CN106133640B (zh) 2020-06-16

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