JP6753935B2 - 少なくとも２つのスペクトル幅を区別する高解像度走査顕微鏡法 - Google Patents

少なくとも２つのスペクトル幅を区別する高解像度走査顕微鏡法 Download PDF

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JP6753935B2
JP6753935B2 JP2018535251A JP2018535251A JP6753935B2 JP 6753935 B2 JP6753935 B2 JP 6753935B2 JP 2018535251 A JP2018535251 A JP 2018535251A JP 2018535251 A JP2018535251 A JP 2018535251A JP 6753935 B2 JP6753935 B2 JP 6753935B2
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spectral
detection
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JP2018531433A6 (ja
JP2018531433A5 (enExample
JP2018531433A (ja
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クレッペ，インゴ
ヴォレスチェンスキー，ラルフ
ノウィカウ，ヤウヘン
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Carl Zeiss Microscopy GmbH
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Carl Zeiss Microscopy GmbH
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/04—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres
    • G02B6/06—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres the relative position of the fibres being the same at both ends, e.g. for transporting images
    • G02B6/08—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres the relative position of the fibres being the same at both ends, e.g. for transporting images with fibre bundle in form of plate
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/04—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
JP2018535251A 2015-09-29 2016-09-29 少なくとも２つのスペクトル幅を区別する高解像度走査顕微鏡法 Active JP6753935B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102015116435.3 2015-09-29
DE102015116435.3A DE102015116435A1 (de) 2015-09-29 2015-09-29 Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Spektralbereiche
PCT/EP2016/073194 WO2017055405A1 (de) 2015-09-29 2016-09-29 Hochauflösende scanning-mikroskopie mit der unterscheidung mindestens zweier spektralbereiche

Publications (4)

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JP2018531433A JP2018531433A (ja) 2018-10-25
JP2018531433A6 JP2018531433A6 (ja) 2018-12-13
JP2018531433A5 JP2018531433A5 (enExample) 2019-10-17
JP6753935B2 true JP6753935B2 (ja) 2020-09-09

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US (1) US10401607B2 (enExample)
JP (1) JP6753935B2 (enExample)
CN (1) CN108139578B (enExample)
DE (1) DE102015116435A1 (enExample)
WO (1) WO2017055405A1 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102017113683A1 (de) 2017-06-21 2018-12-27 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche
IT201800001891A1 (it) * 2018-01-25 2019-07-25 Fondazione St Italiano Tecnologia Metodo di imaging risolto nel tempo ad alta risoluzione spaziale.
CN108897126B (zh) * 2018-08-09 2020-11-03 中国科学院半导体研究所 一种荧光成像系统
US10638061B2 (en) * 2018-09-18 2020-04-28 Analog Devices Global Unlimited Company Active-pixel image sensor
DE102018124044B3 (de) 2018-09-28 2020-02-06 Carl Zeiss Microscopy Gmbh Verfahren zum Betreiben eines Vielstrahl-Teilchenstrahlmikroskops und Vielstrahl-Teilchenstrahlsystem
DE102018127281A1 (de) * 2018-10-31 2020-04-30 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren zur Mikroskopie
DE102018128590A1 (de) * 2018-11-14 2020-05-14 Carl Zeiss Microscopy Gmbh Fluktuationsbasierte Fluoreszenzmikroskopie
DE102019100184A1 (de) * 2019-01-07 2020-07-09 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
EP3938772B1 (en) * 2019-03-15 2025-07-16 Illumisonics Inc. Single source photoacoustic remote sensing (ss-pars)
DE102019107267A1 (de) * 2019-03-21 2020-09-24 Carl Zeiss Microscopy Gmbh Verfahren zur hochauflösenden Scanning-Mikroskopie
CN112444506B (zh) * 2019-09-04 2022-03-18 复旦大学 显微成像的方法及装置
DE102020202804A1 (de) 2020-03-05 2021-09-09 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zur Bilderfassung
CN113313778B (zh) * 2021-05-13 2023-02-17 中国科学院深圳先进技术研究院 磁共振图像的重建方法、计算机设备及存储介质
CN114040069B (zh) * 2021-11-05 2023-03-24 东方晶源微电子科技（北京）有限公司 基于探测器通道的自动对焦方法和装置、设备及存储介质

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3517980A (en) * 1966-12-05 1970-06-30 Ceskoslovenska Akademie Ved Method and arrangement for improving the resolving power and contrast
JP2946466B2 (ja) 1989-07-13 1999-09-06 アンリツ株式会社 顕微方法及び装置
DE4416558C2 (de) 1994-02-01 1997-09-04 Hell Stefan Verfahren zum optischen Messen eines Probenpunkts einer Probe und Vorrichtung zur Durchführung des Verfahrens
EP0801759B1 (de) 1994-02-01 2001-08-08 Stefan Dr. Hell Vorrichtung und verfahren zum optischen messen eines probenpunktes einer probe mit hoher ortsauflösung
US5866911A (en) 1994-07-15 1999-02-02 Baer; Stephen C. Method and apparatus for improving resolution in scanned optical system
US5867604A (en) 1995-08-03 1999-02-02 Ben-Levy; Meir Imaging measurement system
DE19908883A1 (de) 1999-03-02 2000-09-07 Rainer Heintzmann Verfahren zur Erhöhung der Auflösung optischer Abbildung
JP2002062261A (ja) 2000-08-21 2002-02-28 Olympus Optical Co Ltd 光学装置および顕微鏡
US7064824B2 (en) 2003-04-13 2006-06-20 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. High spatial resoulution imaging and modification of structures
DE10325459A1 (de) 2003-04-13 2004-11-18 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Räumlich hochaufgelöstes Erzeugen einer dauerhaften Struktur
CN1595227A (zh) * 2004-06-30 2005-03-16 中国科学院上海光学精密机械研究所 透射率连续变化的振幅型超分辨光瞳滤波器
EP2453239B1 (en) 2005-05-23 2017-04-26 Harald F. Hess Optical microscopy with transformable optical labels
DE102006021317B3 (de) 2006-05-06 2007-10-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
JP4899648B2 (ja) 2006-06-05 2012-03-21 株式会社ニコン スペクトル観察方法及びスペクトル観察システム
US7439565B2 (en) 2006-06-08 2008-10-21 Chunghwa Picture Tubes, Ltd. Active devices array substrate and repairing method thereof
JP5852305B2 (ja) 2009-10-28 2016-02-03 カール ツァイス マイクロスコピー ゲーエムベーハーＣａｒｌ Ｚｅｉｓｓ Ｍｉｃｒｏｓｃｏｐｙ Ｇｍｂｈ 分解能の向上した顕微鏡法および顕微鏡
DE102012204128B4 (de) * 2012-03-15 2023-11-16 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
DE102013019348A1 (de) 2013-08-15 2015-02-19 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
DE102013019347A1 (de) 2013-08-15 2015-02-19 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
DE102013017468B4 (de) 2013-09-03 2018-07-19 Georg-August-Universität Göttingen Stiftung Öffentlichen Rechts Verfahren zum Erstellen eines Mikroskopbildes und Mikroskopievorrichtung
DE102013015931B4 (de) 2013-09-19 2024-05-08 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren zur hochauflösenden Scanning-Mikroskope
DE102013015933A1 (de) 2013-09-19 2015-03-19 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
DE102013015932A1 (de) 2013-09-19 2015-03-19 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
DE102013019378A1 (de) 2013-11-19 2014-07-24 Daimler Ag Verriegelungseinrichtung für ein Flügelelement, insbesondere einen Verdeckkastendeckel, eines Kraftwagens
DE102014111167A1 (de) 2014-08-06 2016-02-11 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche
CN104597590B (zh) * 2014-12-30 2018-02-02 深圳先进技术研究院 一种超分辨荧光光谱成像显微镜
CN104677884B (zh) * 2015-03-17 2017-07-11 北京理工大学 高空间分辨激光分光瞳差动共焦质谱显微成像方法与装置

Also Published As

Publication number Publication date
CN108139578A (zh) 2018-06-08
US10401607B2 (en) 2019-09-03
US20190056580A1 (en) 2019-02-21
WO2017055405A1 (de) 2017-04-06
DE102015116435A1 (de) 2017-03-30
CN108139578B (zh) 2020-12-01
JP2018531433A (ja) 2018-10-25

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