CN108139578B - 分辨至少两个光谱范围的高分辨率扫描显微术 - Google Patents
分辨至少两个光谱范围的高分辨率扫描显微术 Download PDFInfo
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- CN108139578B CN108139578B CN201680057202.7A CN201680057202A CN108139578B CN 108139578 B CN108139578 B CN 108139578B CN 201680057202 A CN201680057202 A CN 201680057202A CN 108139578 B CN108139578 B CN 108139578B
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/04—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres
- G02B6/06—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres the relative position of the fibres being the same at both ends, e.g. for transporting images
- G02B6/08—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres the relative position of the fibres being the same at both ends, e.g. for transporting images with fibre bundle in form of plate
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/04—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Engineering & Computer Science (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102015116435.3A DE102015116435A1 (de) | 2015-09-29 | 2015-09-29 | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Spektralbereiche |
| DE102015116435.3 | 2015-09-29 | ||
| PCT/EP2016/073194 WO2017055405A1 (de) | 2015-09-29 | 2016-09-29 | Hochauflösende scanning-mikroskopie mit der unterscheidung mindestens zweier spektralbereiche |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108139578A CN108139578A (zh) | 2018-06-08 |
| CN108139578B true CN108139578B (zh) | 2020-12-01 |
Family
ID=57103991
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201680057202.7A Active CN108139578B (zh) | 2015-09-29 | 2016-09-29 | 分辨至少两个光谱范围的高分辨率扫描显微术 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10401607B2 (enExample) |
| JP (1) | JP6753935B2 (enExample) |
| CN (1) | CN108139578B (enExample) |
| DE (1) | DE102015116435A1 (enExample) |
| WO (1) | WO2017055405A1 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102017113683A1 (de) | 2017-06-21 | 2018-12-27 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche |
| IT201800001891A1 (it) * | 2018-01-25 | 2019-07-25 | Fondazione St Italiano Tecnologia | Metodo di imaging risolto nel tempo ad alta risoluzione spaziale. |
| CN108897126B (zh) * | 2018-08-09 | 2020-11-03 | 中国科学院半导体研究所 | 一种荧光成像系统 |
| US10638061B2 (en) | 2018-09-18 | 2020-04-28 | Analog Devices Global Unlimited Company | Active-pixel image sensor |
| DE102018124044B3 (de) | 2018-09-28 | 2020-02-06 | Carl Zeiss Microscopy Gmbh | Verfahren zum Betreiben eines Vielstrahl-Teilchenstrahlmikroskops und Vielstrahl-Teilchenstrahlsystem |
| DE102018127281A1 (de) * | 2018-10-31 | 2020-04-30 | Carl Zeiss Microscopy Gmbh | Mikroskop und Verfahren zur Mikroskopie |
| DE102018128590A1 (de) * | 2018-11-14 | 2020-05-14 | Carl Zeiss Microscopy Gmbh | Fluktuationsbasierte Fluoreszenzmikroskopie |
| DE102019100184A1 (de) * | 2019-01-07 | 2020-07-09 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| JP2022524857A (ja) * | 2019-03-15 | 2022-05-10 | イルミソニックス インコーポレイテッド | 単一光源光音響リモートセンシング(ss-pars) |
| DE102019107267A1 (de) * | 2019-03-21 | 2020-09-24 | Carl Zeiss Microscopy Gmbh | Verfahren zur hochauflösenden Scanning-Mikroskopie |
| CN112444506B (zh) * | 2019-09-04 | 2022-03-18 | 复旦大学 | 显微成像的方法及装置 |
| DE102020202804A1 (de) | 2020-03-05 | 2021-09-09 | Carl Zeiss Microscopy Gmbh | Verfahren und Vorrichtung zur Bilderfassung |
| CN113313778B (zh) * | 2021-05-13 | 2023-02-17 | 中国科学院深圳先进技术研究院 | 磁共振图像的重建方法、计算机设备及存储介质 |
| CN114040069B (zh) * | 2021-11-05 | 2023-03-24 | 东方晶源微电子科技(北京)有限公司 | 基于探测器通道的自动对焦方法和装置、设备及存储介质 |
Citations (9)
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| US3517980A (en) * | 1966-12-05 | 1970-06-30 | Ceskoslovenska Akademie Ved | Method and arrangement for improving the resolving power and contrast |
| CN1595227A (zh) * | 2004-06-30 | 2005-03-16 | 中国科学院上海光学精密机械研究所 | 透射率连续变化的振幅型超分辨光瞳滤波器 |
| EP2317362A1 (de) * | 2009-10-28 | 2011-05-04 | Carl Zeiss MicroImaging GmbH | Mikroskopisches Verfahren und Mikroskop mit gesteigerter Auflösung |
| DE102012204128A1 (de) * | 2012-03-15 | 2013-09-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102013019348A1 (de) * | 2013-08-15 | 2015-02-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| US20150077842A1 (en) * | 2013-09-19 | 2015-03-19 | Carl Zeiss Microscopy Gmbh | High-resolution scanning microscopy |
| CN104597590A (zh) * | 2014-12-30 | 2015-05-06 | 深圳先进技术研究院 | 一种超分辨荧光光谱成像显微镜 |
| CN104677884A (zh) * | 2015-03-17 | 2015-06-03 | 北京理工大学 | 高空间分辨激光分光瞳差动共焦质谱显微成像方法与装置 |
| US20150185454A1 (en) * | 2013-09-19 | 2015-07-02 | Carl Zeiss Microscopy Gmbh | High-resolution scanning microscopy |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2946466B2 (ja) | 1989-07-13 | 1999-09-06 | アンリツ株式会社 | 顕微方法及び装置 |
| DE4416558C2 (de) | 1994-02-01 | 1997-09-04 | Hell Stefan | Verfahren zum optischen Messen eines Probenpunkts einer Probe und Vorrichtung zur Durchführung des Verfahrens |
| EP0801759B1 (de) | 1994-02-01 | 2001-08-08 | Stefan Dr. Hell | Vorrichtung und verfahren zum optischen messen eines probenpunktes einer probe mit hoher ortsauflösung |
| US5866911A (en) | 1994-07-15 | 1999-02-02 | Baer; Stephen C. | Method and apparatus for improving resolution in scanned optical system |
| US5867604A (en) | 1995-08-03 | 1999-02-02 | Ben-Levy; Meir | Imaging measurement system |
| DE19908883A1 (de) | 1999-03-02 | 2000-09-07 | Rainer Heintzmann | Verfahren zur Erhöhung der Auflösung optischer Abbildung |
| JP2002062261A (ja) | 2000-08-21 | 2002-02-28 | Olympus Optical Co Ltd | 光学装置および顕微鏡 |
| DE10325459A1 (de) | 2003-04-13 | 2004-11-18 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Räumlich hochaufgelöstes Erzeugen einer dauerhaften Struktur |
| US7064824B2 (en) | 2003-04-13 | 2006-06-20 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. | High spatial resoulution imaging and modification of structures |
| EP2453238B1 (en) | 2005-05-23 | 2016-12-21 | Harald F. Hess | Optical microscopy with phototransformable optical labels |
| DE102006021317B3 (de) | 2006-05-06 | 2007-10-11 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe |
| JP4899648B2 (ja) | 2006-06-05 | 2012-03-21 | 株式会社ニコン | スペクトル観察方法及びスペクトル観察システム |
| US7439565B2 (en) | 2006-06-08 | 2008-10-21 | Chunghwa Picture Tubes, Ltd. | Active devices array substrate and repairing method thereof |
| DE102013019347A1 (de) | 2013-08-15 | 2015-02-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102013022538B3 (de) | 2013-09-03 | 2018-12-13 | Georg-August-Universität Göttingen Stiftung Öffentlichen Rechts | Verfahren zum Erstellen eines Mikroskopbildes und Mikroskopievorrichtung |
| DE102013015932A1 (de) | 2013-09-19 | 2015-03-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102013019378A1 (de) | 2013-11-19 | 2014-07-24 | Daimler Ag | Verriegelungseinrichtung für ein Flügelelement, insbesondere einen Verdeckkastendeckel, eines Kraftwagens |
| DE102014111167A1 (de) | 2014-08-06 | 2016-02-11 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche |
-
2015
- 2015-09-29 DE DE102015116435.3A patent/DE102015116435A1/de active Pending
-
2016
- 2016-09-29 US US15/764,238 patent/US10401607B2/en active Active
- 2016-09-29 CN CN201680057202.7A patent/CN108139578B/zh active Active
- 2016-09-29 JP JP2018535251A patent/JP6753935B2/ja active Active
- 2016-09-29 WO PCT/EP2016/073194 patent/WO2017055405A1/de not_active Ceased
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US3517980A (en) * | 1966-12-05 | 1970-06-30 | Ceskoslovenska Akademie Ved | Method and arrangement for improving the resolving power and contrast |
| CN1595227A (zh) * | 2004-06-30 | 2005-03-16 | 中国科学院上海光学精密机械研究所 | 透射率连续变化的振幅型超分辨光瞳滤波器 |
| EP2317362A1 (de) * | 2009-10-28 | 2011-05-04 | Carl Zeiss MicroImaging GmbH | Mikroskopisches Verfahren und Mikroskop mit gesteigerter Auflösung |
| DE102012204128A1 (de) * | 2012-03-15 | 2013-09-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102013019348A1 (de) * | 2013-08-15 | 2015-02-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| US20150077842A1 (en) * | 2013-09-19 | 2015-03-19 | Carl Zeiss Microscopy Gmbh | High-resolution scanning microscopy |
| US20150185454A1 (en) * | 2013-09-19 | 2015-07-02 | Carl Zeiss Microscopy Gmbh | High-resolution scanning microscopy |
| CN104597590A (zh) * | 2014-12-30 | 2015-05-06 | 深圳先进技术研究院 | 一种超分辨荧光光谱成像显微镜 |
| CN104677884A (zh) * | 2015-03-17 | 2015-06-03 | 北京理工大学 | 高空间分辨激光分光瞳差动共焦质谱显微成像方法与装置 |
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| Superresolution by image scanning microscopy using pixel reassignment;COLIN J R 等;《OPTICS LETTERS》;20130801;第38卷(第15期);全文 * |
| Time-resolved methods in laser scanning microscopy;Zeiss 等;《Laser und Optoelektronik》;19920228;第24卷(第1期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| DE102015116435A1 (de) | 2017-03-30 |
| CN108139578A (zh) | 2018-06-08 |
| JP6753935B2 (ja) | 2020-09-09 |
| US10401607B2 (en) | 2019-09-03 |
| JP2018531433A (ja) | 2018-10-25 |
| WO2017055405A1 (de) | 2017-04-06 |
| US20190056580A1 (en) | 2019-02-21 |
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