DE102015116435A1 - Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Spektralbereiche - Google Patents
Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Spektralbereiche Download PDFInfo
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- DE102015116435A1 DE102015116435A1 DE102015116435.3A DE102015116435A DE102015116435A1 DE 102015116435 A1 DE102015116435 A1 DE 102015116435A1 DE 102015116435 A DE102015116435 A DE 102015116435A DE 102015116435 A1 DE102015116435 A1 DE 102015116435A1
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Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102015116435.3A DE102015116435A1 (de) | 2015-09-29 | 2015-09-29 | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Spektralbereiche |
| US15/764,238 US10401607B2 (en) | 2015-09-29 | 2016-09-29 | High-resolution scanning microscopy resolving at least two spectral ranges |
| PCT/EP2016/073194 WO2017055405A1 (de) | 2015-09-29 | 2016-09-29 | Hochauflösende scanning-mikroskopie mit der unterscheidung mindestens zweier spektralbereiche |
| JP2018535251A JP6753935B2 (ja) | 2015-09-29 | 2016-09-29 | 少なくとも２つのスペクトル幅を区別する高解像度走査顕微鏡法 |
| CN201680057202.7A CN108139578B (zh) | 2015-09-29 | 2016-09-29 | 分辨至少两个光谱范围的高分辨率扫描显微术 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102015116435.3A DE102015116435A1 (de) | 2015-09-29 | 2015-09-29 | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Spektralbereiche |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102015116435A1 true DE102015116435A1 (de) | 2017-03-30 |
Family
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102015116435.3A Pending DE102015116435A1 (de) | 2015-09-29 | 2015-09-29 | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Spektralbereiche |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10401607B2 (enExample) |
| JP (1) | JP6753935B2 (enExample) |
| CN (1) | CN108139578B (enExample) |
| DE (1) | DE102015116435A1 (enExample) |
| WO (1) | WO2017055405A1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108897126A (zh) * | 2018-08-09 | 2018-11-27 | 中国科学院半导体研究所 | 一种荧光成像系统 |
| CN113597555A (zh) * | 2019-03-15 | 2021-11-02 | 易路美索尼克股份有限公司 | 单源光声遥感器（ss-pars） |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102017113683A1 (de) | 2017-06-21 | 2018-12-27 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche |
| IT201800001891A1 (it) * | 2018-01-25 | 2019-07-25 | Fondazione St Italiano Tecnologia | Metodo di imaging risolto nel tempo ad alta risoluzione spaziale. |
| US10638061B2 (en) | 2018-09-18 | 2020-04-28 | Analog Devices Global Unlimited Company | Active-pixel image sensor |
| DE102018124044B3 (de) | 2018-09-28 | 2020-02-06 | Carl Zeiss Microscopy Gmbh | Verfahren zum Betreiben eines Vielstrahl-Teilchenstrahlmikroskops und Vielstrahl-Teilchenstrahlsystem |
| DE102018127281A1 (de) * | 2018-10-31 | 2020-04-30 | Carl Zeiss Microscopy Gmbh | Mikroskop und Verfahren zur Mikroskopie |
| DE102018128590A1 (de) * | 2018-11-14 | 2020-05-14 | Carl Zeiss Microscopy Gmbh | Fluktuationsbasierte Fluoreszenzmikroskopie |
| DE102019100184A1 (de) * | 2019-01-07 | 2020-07-09 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102019107267A1 (de) * | 2019-03-21 | 2020-09-24 | Carl Zeiss Microscopy Gmbh | Verfahren zur hochauflösenden Scanning-Mikroskopie |
| CN112444506B (zh) * | 2019-09-04 | 2022-03-18 | 复旦大学 | 显微成像的方法及装置 |
| DE102020202804A1 (de) | 2020-03-05 | 2021-09-09 | Carl Zeiss Microscopy Gmbh | Verfahren und Vorrichtung zur Bilderfassung |
| CN113313778B (zh) * | 2021-05-13 | 2023-02-17 | 中国科学院深圳先进技术研究院 | 磁共振图像的重建方法、计算机设备及存储介质 |
| CN114040069B (zh) * | 2021-11-05 | 2023-03-24 | 东方晶源微电子科技（北京）有限公司 | 基于探测器通道的自动对焦方法和装置、设备及存储介质 |
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| US5043570A (en) | 1989-07-13 | 1991-08-27 | Anritsu Corporation | High resolution microscoping system using convolution integration process |
| DE4416558C2 (de) | 1994-02-01 | 1997-09-04 | Hell Stefan | Verfahren zum optischen Messen eines Probenpunkts einer Probe und Vorrichtung zur Durchführung des Verfahrens |
| US5866911A (en) | 1994-07-15 | 1999-02-02 | Baer; Stephen C. | Method and apparatus for improving resolution in scanned optical system |
| US5867604A (en) | 1995-08-03 | 1999-02-02 | Ben-Levy; Meir | Imaging measurement system |
| EP1157297B1 (de) | 1999-03-02 | 2002-11-06 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und vorrichtung zur objektabbildung |
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| WO2006127692A2 (en) | 2005-05-23 | 2006-11-30 | Hess Harald F | Optical microscopy with phototransformable optical labels |
| DE102006021317B3 (de) | 2006-05-06 | 2007-10-11 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe |
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| EP2317362A1 (de) | 2009-10-28 | 2011-05-04 | Carl Zeiss MicroImaging GmbH | Mikroskopisches Verfahren und Mikroskop mit gesteigerter Auflösung |
| WO2013135487A1 (de) | 2012-03-15 | 2013-09-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende scanning-mikroskopie |
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| CN104677884B (zh) * | 2015-03-17 | 2017-07-11 | 北京理工大学 | 高空间分辨激光分光瞳差动共焦质谱显微成像方法与装置 |
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2015
- 2015-09-29 DE DE102015116435.3A patent/DE102015116435A1/de active Pending
-
2016
- 2016-09-29 US US15/764,238 patent/US10401607B2/en active Active
- 2016-09-29 CN CN201680057202.7A patent/CN108139578B/zh active Active
- 2016-09-29 JP JP2018535251A patent/JP6753935B2/ja active Active
- 2016-09-29 WO PCT/EP2016/073194 patent/WO2017055405A1/de not_active Ceased
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| DE4416558C2 (de) | 1994-02-01 | 1997-09-04 | Hell Stefan | Verfahren zum optischen Messen eines Probenpunkts einer Probe und Vorrichtung zur Durchführung des Verfahrens |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108897126A (zh) * | 2018-08-09 | 2018-11-27 | 中国科学院半导体研究所 | 一种荧光成像系统 |
| CN108897126B (zh) * | 2018-08-09 | 2020-11-03 | 中国科学院半导体研究所 | 一种荧光成像系统 |
| CN113597555A (zh) * | 2019-03-15 | 2021-11-02 | 易路美索尼克股份有限公司 | 单源光声遥感器（ss-pars） |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108139578A (zh) | 2018-06-08 |
| JP6753935B2 (ja) | 2020-09-09 |
| US10401607B2 (en) | 2019-09-03 |
| JP2018531433A (ja) | 2018-10-25 |
| WO2017055405A1 (de) | 2017-04-06 |
| US20190056580A1 (en) | 2019-02-21 |
| CN108139578B (zh) | 2020-12-01 |
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