JP6751655B2 - プローブ及び電気的接続装置 - Google Patents

プローブ及び電気的接続装置 Download PDF

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Publication number
JP6751655B2
JP6751655B2 JP2016221437A JP2016221437A JP6751655B2 JP 6751655 B2 JP6751655 B2 JP 6751655B2 JP 2016221437 A JP2016221437 A JP 2016221437A JP 2016221437 A JP2016221437 A JP 2016221437A JP 6751655 B2 JP6751655 B2 JP 6751655B2
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Japan
Prior art keywords
plunger
probe
barrel
spring
contact
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JP2016221437A
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English (en)
Japanese (ja)
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JP2018080926A (ja
Inventor
晃寛 首藤
晃寛 首藤
美佳 那須
美佳 那須
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
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Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2016221437A priority Critical patent/JP6751655B2/ja
Priority to PCT/JP2017/040185 priority patent/WO2018088411A1/ja
Priority to TW106139179A priority patent/TWI646333B/zh
Publication of JP2018080926A publication Critical patent/JP2018080926A/ja
Application granted granted Critical
Publication of JP6751655B2 publication Critical patent/JP6751655B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2016221437A 2016-11-14 2016-11-14 プローブ及び電気的接続装置 Active JP6751655B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2016221437A JP6751655B2 (ja) 2016-11-14 2016-11-14 プローブ及び電気的接続装置
PCT/JP2017/040185 WO2018088411A1 (ja) 2016-11-14 2017-11-08 プローブ及び電気的接続装置
TW106139179A TWI646333B (zh) 2016-11-14 2017-11-13 探針及電性連接裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016221437A JP6751655B2 (ja) 2016-11-14 2016-11-14 プローブ及び電気的接続装置

Publications (2)

Publication Number Publication Date
JP2018080926A JP2018080926A (ja) 2018-05-24
JP6751655B2 true JP6751655B2 (ja) 2020-09-09

Family

ID=62109573

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016221437A Active JP6751655B2 (ja) 2016-11-14 2016-11-14 プローブ及び電気的接続装置

Country Status (3)

Country Link
JP (1) JP6751655B2 (zh)
TW (1) TWI646333B (zh)
WO (1) WO2018088411A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210046676A (ko) * 2018-08-23 2021-04-28 니혼덴산리드가부시키가이샤 검사 지그, 검사 장치 및 접촉 단자

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3872192B2 (ja) * 1997-12-11 2007-01-24 株式会社テクノセム研究所 コンタクトユニット
JP4574222B2 (ja) * 2004-05-06 2010-11-04 日本電産リード株式会社 基板検査用接触子、これを用いた基板検査用治具及び基板検査装置
JP2012122905A (ja) * 2010-12-09 2012-06-28 Rika Denshi Co Ltd コンタクトプローブ
JP2014025737A (ja) * 2012-07-25 2014-02-06 Nidec-Read Corp 検査用治具及び接触子
TWI548879B (zh) * 2014-01-28 2016-09-11 Spring sleeve probe

Also Published As

Publication number Publication date
TW201825904A (zh) 2018-07-16
TWI646333B (zh) 2019-01-01
WO2018088411A1 (ja) 2018-05-17
JP2018080926A (ja) 2018-05-24

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