JP6745803B2 - 多孔質フィルムの測定 - Google Patents

多孔質フィルムの測定 Download PDF

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Publication number
JP6745803B2
JP6745803B2 JP2017533605A JP2017533605A JP6745803B2 JP 6745803 B2 JP6745803 B2 JP 6745803B2 JP 2017533605 A JP2017533605 A JP 2017533605A JP 2017533605 A JP2017533605 A JP 2017533605A JP 6745803 B2 JP6745803 B2 JP 6745803B2
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sample
wavelength
parameter
measuring
transmittance
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Japanese (ja)
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JP2018505400A5 (https=
JP2018505400A (ja
Inventor
ポール ハンフリー，ケヴィン
ポール ハンフリー，ケヴィン
ピーター ハモンド，ロバート
ピーター ハモンド，ロバート
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NDC Technologies Ltd
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NDC Infrared Engineering Ltd
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Publication of JP2018505400A publication Critical patent/JP2018505400A/ja
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Priority to JP2020029291A priority Critical patent/JP6976369B2/ja
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Priority to JP2021182491A priority patent/JP7305727B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/24—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
    • G01N15/088—Investigating volume, surface area, size or distribution of pores; Porosimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N21/3151—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using two sources of radiation of different wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content
    • G01N21/3559—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content in sheets, e.g. in paper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
    • G01N2015/0846—Investigating permeability, pore-volume, or surface area of porous materials by use of radiation, e.g. transmitted or reflected light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
    • G01N2015/086—Investigating permeability, pore-volume, or surface area of porous materials of films, membranes or pellicules

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Dispersion Chemistry (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2017533605A 2014-12-22 2015-12-18 多孔質フィルムの測定 Active JP6745803B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2020029291A JP6976369B2 (ja) 2014-12-22 2020-02-25 多孔質フィルムの測定
JP2021182491A JP7305727B2 (ja) 2014-12-22 2021-11-09 多孔質フィルムの測定

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1422964.5A GB2533589A (en) 2014-12-22 2014-12-22 Measurement of porous film
GB1422964.5 2014-12-22
PCT/GB2015/054075 WO2016102938A1 (en) 2014-12-22 2015-12-18 Measurement of porous film

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2020029291A Division JP6976369B2 (ja) 2014-12-22 2020-02-25 多孔質フィルムの測定

Publications (3)

Publication Number Publication Date
JP2018505400A JP2018505400A (ja) 2018-02-22
JP2018505400A5 JP2018505400A5 (https=) 2019-01-10
JP6745803B2 true JP6745803B2 (ja) 2020-08-26

Family

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JP2017533605A Active JP6745803B2 (ja) 2014-12-22 2015-12-18 多孔質フィルムの測定
JP2020029291A Active JP6976369B2 (ja) 2014-12-22 2020-02-25 多孔質フィルムの測定
JP2021182491A Active JP7305727B2 (ja) 2014-12-22 2021-11-09 多孔質フィルムの測定

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JP2021182491A Active JP7305727B2 (ja) 2014-12-22 2021-11-09 多孔質フィルムの測定

Country Status (7)

Country Link
US (1) US10161863B2 (https=)
EP (1) EP3237886B1 (https=)
JP (3) JP6745803B2 (https=)
KR (1) KR102172593B1 (https=)
CN (1) CN107430054B (https=)
GB (1) GB2533589A (https=)
WO (1) WO2016102938A1 (https=)

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CN108332674B (zh) * 2018-02-11 2020-01-21 中国科学院电子学研究所 单光谱求取多孔膜厚度和孔隙率的方法
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US11879765B2 (en) 2018-09-26 2024-01-23 Honeywell International Inc. Apparatus for composite sheet weight determinations
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CN109682735A (zh) * 2018-12-21 2019-04-26 山东精工电子科技有限公司 锂离子电池极片涂层孔隙率的测试方法
FR3101568B1 (fr) * 2019-10-03 2022-08-05 Aleph Sas Procede de fabrication d’un film comportant des cavites avec determination de profils d’etirage, de masse volumique, d’epaisseur et/ou de porosite du film
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CN112797920B (zh) * 2019-11-13 2024-05-03 中国航发南方工业有限公司 一种叶片小微孔角度测量方法
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RU2758777C1 (ru) * 2021-03-22 2021-11-01 Федеральное государственное бюджетное учреждение науки Институт оптики атмосферы им. В.Е. Зуева Сибирского отделения Российской академии наук Способ измерения размера пор гидрофильных материалов
KR102920808B1 (ko) * 2021-06-26 2026-01-30 주식회사 엘지에너지솔루션 분리막 통기도 검사장치 및 이를 이용한 분리막 통기도 검사방법
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CN113866046B (zh) * 2021-09-13 2024-03-19 中国辐射防护研究院 一种测量热中子吸收材料面密度的方法
JP2023150628A (ja) * 2022-03-31 2023-10-16 横河電機株式会社 測定装置及び測定方法
KR20240040475A (ko) * 2022-09-21 2024-03-28 현대자동차주식회사 수소전기분해 확산층 검사 및 타발 장치 및 방법
CN115855767A (zh) * 2022-11-10 2023-03-28 江西昌河航空工业有限公司 一种菱形孔防雷击铜网开孔率的测量方法
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Also Published As

Publication number Publication date
JP2018505400A (ja) 2018-02-22
US20180024053A1 (en) 2018-01-25
JP6976369B2 (ja) 2021-12-08
JP2020106536A (ja) 2020-07-09
JP2022024012A (ja) 2022-02-08
JP7305727B2 (ja) 2023-07-10
KR20170102264A (ko) 2017-09-08
EP3237886B1 (en) 2023-07-05
EP3237886A1 (en) 2017-11-01
KR102172593B1 (ko) 2020-11-02
CN107430054A (zh) 2017-12-01
CN107430054B (zh) 2020-04-17
WO2016102938A1 (en) 2016-06-30
GB2533589A (en) 2016-06-29
US10161863B2 (en) 2018-12-25

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