JP6737316B2 - 放射線検出素子 - Google Patents

放射線検出素子 Download PDF

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Publication number
JP6737316B2
JP6737316B2 JP2018202037A JP2018202037A JP6737316B2 JP 6737316 B2 JP6737316 B2 JP 6737316B2 JP 2018202037 A JP2018202037 A JP 2018202037A JP 2018202037 A JP2018202037 A JP 2018202037A JP 6737316 B2 JP6737316 B2 JP 6737316B2
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Japan
Prior art keywords
electrode
surface side
external terminal
base material
radiation detection
Prior art date
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Application number
JP2018202037A
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English (en)
Japanese (ja)
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JP2020067433A5 (enExample
JP2020067433A (ja
Inventor
島田　修
修 島田
本村　知久
知久 本村
達 谷森
達 谷森
淳史 高田
淳史 高田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2018202037A priority Critical patent/JP6737316B2/ja
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to CN201980069774.0A priority patent/CN112930486B/zh
Priority to EP19876269.2A priority patent/EP3872531A4/en
Priority to CN202411703961.9A priority patent/CN119716960A/zh
Priority to PCT/JP2019/041570 priority patent/WO2020085399A1/ja
Publication of JP2020067433A publication Critical patent/JP2020067433A/ja
Publication of JP2020067433A5 publication Critical patent/JP2020067433A5/ja
Application granted granted Critical
Publication of JP6737316B2 publication Critical patent/JP6737316B2/ja
Priority to US17/235,472 priority patent/US12078765B2/en
Priority to US18/792,816 priority patent/US20240393483A1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02—Dosimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2935—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using ionisation detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/02—Ionisation chambers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/06—Proportional counter tubes

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
  • Light Receiving Elements (AREA)
JP2018202037A 2018-10-26 2018-10-26 放射線検出素子 Active JP6737316B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2018202037A JP6737316B2 (ja) 2018-10-26 2018-10-26 放射線検出素子
EP19876269.2A EP3872531A4 (en) 2018-10-26 2019-10-23 RADIATION DETECTION ELEMENT
CN202411703961.9A CN119716960A (zh) 2018-10-26 2019-10-23 放射线检测元件
PCT/JP2019/041570 WO2020085399A1 (ja) 2018-10-26 2019-10-23 放射線検出素子
CN201980069774.0A CN112930486B (zh) 2018-10-26 2019-10-23 放射线检测元件
US17/235,472 US12078765B2 (en) 2018-10-26 2021-04-20 Radiation detection element
US18/792,816 US20240393483A1 (en) 2018-10-26 2024-08-02 Radiation detection element and radiation detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018202037A JP6737316B2 (ja) 2018-10-26 2018-10-26 放射線検出素子

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2020118456A Division JP7081626B2 (ja) 2020-07-09 2020-07-09 放射線検出素子

Publications (3)

Publication Number Publication Date
JP2020067433A JP2020067433A (ja) 2020-04-30
JP2020067433A5 JP2020067433A5 (enExample) 2020-07-09
JP6737316B2 true JP6737316B2 (ja) 2020-08-05

Family

ID=70330358

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018202037A Active JP6737316B2 (ja) 2018-10-26 2018-10-26 放射線検出素子

Country Status (5)

Country Link
US (2) US12078765B2 (enExample)
EP (1) EP3872531A4 (enExample)
JP (1) JP6737316B2 (enExample)
CN (2) CN112930486B (enExample)
WO (1) WO2020085399A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119224821B (zh) * 2024-11-28 2025-04-08 中国科学技术大学 像素型多阳极半导体探测器阵列的电子学通道复用方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2251830B1 (enExample) * 1973-11-20 1976-10-01 Commissariat Energie Atomique
JPH05121036A (ja) * 1991-10-29 1993-05-18 Shimadzu Corp 微小アレー状放射線カウンタ
US6046454A (en) * 1995-10-13 2000-04-04 Digirad Corporation Semiconductor radiation detector with enhanced charge collection
US6034373A (en) * 1997-12-11 2000-03-07 Imrad Imaging Systems Ltd. Semiconductor radiation detector with reduced surface effects
JP3354551B2 (ja) * 2000-06-27 2002-12-09 科学技術振興事業団 ピクセル型電極によるガス増幅を用いた粒子線画像検出器
US7230247B2 (en) 2002-03-08 2007-06-12 Hamamatsu Photonics K.K. Detector
JP4237966B2 (ja) * 2002-03-08 2009-03-11 浜松ホトニクス株式会社 検出器
US20080031245A1 (en) * 2006-03-06 2008-02-07 Nokia Corporation Uplink signaling for multicast transmission
JP4365844B2 (ja) * 2006-09-08 2009-11-18 三菱電機株式会社 荷電粒子線の線量分布測定装置
JP2009224069A (ja) * 2008-03-13 2009-10-01 Toshiba Corp 放射線検出器及び放射線検出方法
JP5711476B2 (ja) * 2010-07-29 2015-04-30 日立アロカメディカル株式会社 放射線検出器カード
WO2012035466A2 (en) * 2010-09-13 2012-03-22 Koninklijke Philips Electronics N.V. Radiation detector with steering electrodes
JP2012168170A (ja) * 2011-01-25 2012-09-06 Dainippon Printing Co Ltd ガス増幅を用いた放射線検出器
JP5832852B2 (ja) * 2011-10-21 2015-12-16 浜松ホトニクス株式会社 光検出装置
JP2013181800A (ja) * 2012-03-01 2013-09-12 Kyocera Corp 粒子線位置検出器
WO2013184020A1 (en) * 2012-06-08 2013-12-12 Siemens Aktiengesellschaft A detector for radiation, particularly high energy electromagnetic radiation
JP5638664B2 (ja) * 2013-06-10 2014-12-10 セルン − ヨーロピアン オーガナイゼーション フォー ニュークリア リサーチＣＥＲＮ − Ｅｕｒｏｐｅａｎ Ｏｒｇａｎｉｚａｔｉｏｎ ｆｏｒ Ｎｕｃｌｅａｒ Ｒｅｓｅａｒｃｈ 保護された読み出し電極アセンブリ及びアバランシェ粒子検出器
CN108140534B (zh) * 2015-10-08 2020-07-07 大日本印刷株式会社 检测元件
JP6821935B2 (ja) * 2016-03-30 2021-01-27 大日本印刷株式会社 検出素子及び放射線検出装置
CN207816850U (zh) * 2018-01-23 2018-09-04 力嘉包装（东莞）有限公司 单张纸印刷品在线质量检测装置

Also Published As

Publication number Publication date
EP3872531A4 (en) 2022-07-27
EP3872531A1 (en) 2021-09-01
US12078765B2 (en) 2024-09-03
US20240393483A1 (en) 2024-11-28
CN119716960A (zh) 2025-03-28
CN112930486A (zh) 2021-06-08
WO2020085399A1 (ja) 2020-04-30
CN112930486B (zh) 2024-12-13
US20210239857A1 (en) 2021-08-05
JP2020067433A (ja) 2020-04-30

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