JP6725268B2 - インサート成形品、電気信号コネクタ、内視鏡及びインサート成形法 - Google Patents
インサート成形品、電気信号コネクタ、内視鏡及びインサート成形法 Download PDFInfo
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- JP6725268B2 JP6725268B2 JP2016044827A JP2016044827A JP6725268B2 JP 6725268 B2 JP6725268 B2 JP 6725268B2 JP 2016044827 A JP2016044827 A JP 2016044827A JP 2016044827 A JP2016044827 A JP 2016044827A JP 6725268 B2 JP6725268 B2 JP 6725268B2
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Images
Classifications
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Description
合物は、NiとOとを含む化合物であってもよい。
第1実施形態にかかるインサート成形品は、金属基材と樹脂とが接合されて構成されている。インサート成形品は、金属基材と樹脂部との間に、金属基材側から順に、Ni層と、貴金属層と、Si及びOを含む化合物からなる化合物層(以下、「化合物層」と記載する場合がある。)と、Si及びOを含む化合物と樹脂部の樹脂が混在する混合層と、を有し、化合物層及び混合層においてニッケル(Ni)が存在する。代表的なインサート成形品の例は、金属樹脂複合材料である。
二酸化ケイ素:1.1〜2.2g/cm3
酸化チタン:1.9〜4.3g/cm3
酸化アルミニウム:1.9〜4.1g/cm3
酸化ジルコニウム:2.4g/cm3
酸化亜鉛:2.8〜5.6g/cm3
酸化クロム(III):2.6〜5.2g/cm3
酸化ニッケル:3.3〜6.7g/cm3
本実施形態に係るインサート成形品1の製造方法(インサート成形法)について説明する。インサート成形法は、金属基材2と樹脂とをインサート成形する方法であり、金属基材2の表面にNi層(下地層)3、次いで貴金属層4を形成する工程と、貴金属層4の表面に10μm以下のSiとOを含む化合物の層(化合物層)5を形成する工程と、化合物層5に接して樹脂をインサート成形する工程とを含む。
図3は、レバー20の模式図である。レバー20は、ステンレスやチタンなど難錆性の金属部品を金属基材22として用い、図示は省略するが、金属基材22の表面には下地層3、貴金属層4、化合物層5及び混合物層6が形成され、レバー20の内側の面を除いた周囲が樹脂24で覆われている。これにより、金属基材22の金属と樹脂24と間の密着性を高めることができる。よって、レバー20のように金属基材22の一部が露出した成形品においても、金属と樹脂との境界面から水や菌などが浸入することを防ぐことができる。このような水密性は、内視鏡の洗浄消毒滅菌のプロセスによっても容易に破壊されず、密着性を保つことができる。
図4にスイッチ30の模式図を示す。スイッチ30は、例えば、金属基材として金属製のスイッチ作動用部品32を備え、スイッチ作動用部品32の外表面にエラストマー製の操作部品34が装着されている。スイッチ作動用部品32と操作部品34とは、固定部材35に装着される。
図5に、内視鏡先端部50の模式的な断面図を示す。内視鏡先端部50では、光伝送管56と、送気・送水管58とが内視鏡挿入部57内に配置され、内視鏡用の先端構造部品54に接続されている。
図7に、水密パッキン70の模式図を示す。水密パッキン70は、ステンレスやチタンなど難錆性の金属から成る本体72を金属基材として用い、本体72の一部にエラストマー材料からなるパッキン74が取付けられている。図示は省略するが、本体72とパッキン74との間には下地層3、貴金属層4、化合物層5及び混合物層6が形成されている。これにより、本体72とパッキン74との間における金属と樹脂の境界面の密着性を得ることができる。よって、水密パッキン70は、水密性を確保することができる。また、水密パッキン70は難錆材料の上に樹脂を直接インサート成形できるため、部品の構造や形状に合わせた自由な構造及び形状を有するパッキンを成形することが可能である。
図8に硬性鏡本体80の模式図を示す。硬性鏡本体80は、ステンレスやチタンなど難錆性の金属から成る部品を金属基材82として用い、金属基材82の一端の周囲を覆う接眼レンズカバー84が設けられている。金属基材82の外装に配置された接眼レンズカバー84は、電気メスなどを使用した際に医療従事者へ電気が流れるのを防ぐ絶縁体の役割を果たす。図示は省略するが、金属基材82と接眼レンズカバー84との間には下地層3、貴金属層4、化合物層5及び混合物層6が形成されている。これにより、金属基材82と接眼レンズカバー84との境界面における水密性が維持されるため、境界面から水や菌などが浸入することを防ぐことができる。このような水密性は、内視鏡の洗浄消毒滅菌のプロセスによっても容易に破壊されず、密着性を保つことができる。
リン青銅にNiの下地層3を形成し、下地層3上にAuめっきした試験片を作製した。試験片に、アルキルシラン化合物を含む燃料ガスを0.5秒間噴きつけることにより、試験片の表面に多孔質シリカ被膜を形成した。この表面処理試験片とビクトレックス社製PEEKとを用いてインサート成形を行った。
形成された化合物層の膜厚は、STEM観察(走査透過電子顕微鏡法)により100nmであった。
リン青銅にNiの下地層3を形成し、下地層3上にAuめっきした試験片を作製した。試験片に、アルキルシラン化合物を含む燃料ガスを30秒間噴きつけることにより、試験片の表面に多孔質シリカ被膜を形成した。この表面処理試験片とビクトレックス社製PEEKとを用いてインサート成形を行った。
形成された化合物層の膜厚はSTEM観察により15μmであった。
リン青銅にNiの下地層3を形成し、下地層3上にAgめっきした試験片を作製した。試験片に、アルキルシラン化合物を含む燃料ガスを0.5秒間噴きつけることにより、試験片の表面に多孔質シリカ被膜を形成した。この表面処理試験片とビクトレックス社製PEEKとを用いてインサート成形を行った。
形成された化合物層の膜厚はSTEM観察により100nmであった。
リン青銅にNiの下地層3を形成し、下地層3上にAuめっきした試験片を作製した。試験片に、アルキルシラン化合物を含む燃料ガスを0.5秒間噴きつけることにより、試験片の表面に多孔質シリカ被膜を形成した。この表面処理試験片とソルベイ社製ポリフェニルサルホン(PPSU)とを用いてインサート成形を行った。
形成された化合物層の膜厚はSTEM観察により100nmであった。
リン青銅にNiの下地層3を形成し、下地層3上にAuめっきした試験片を作製した。試験片を、ケイ酸アルカリ金属水溶液に浸漬し、その後、密閉容器の中にこの試験片と炭酸ガスおよび水を入れ、一定の温度と湿度を保ちながら炭酸化処理を行った。この処理により、試験片の表面に多孔質シリカ被膜を形成した。この表面処理試験片とビクトレックス社製PEEKとを用いてインサート成形を行った。
形成された化合物層の膜厚はSTEM観察により10μmであった。
リン青銅にNiの下地層3を形成し、下地層3上にAuめっきした試験片を作製した。この表面処理試験片とビクトレックス社製PEEKとを用いてインサート成形を行った。
リン青銅にCuの下地層3を形成し、下地層3上にAuめっきした試験片を作製した。試験片に、アルキルシラン化合物を含む燃料ガスを0.5秒間噴きつけることにより、試験片の表面に多孔質シリカ被膜を形成した。この表面処理試験片とビクトレックス社製PEEKとを用いてインサート成形を行った。
形成された化合物層の膜厚はSTEM観察により100nmであった。
リン青銅にNiの下地層3を形成し、下地層3上にCuめっきした試験片を作製した。試験片に、アルキルシラン化合物を含む燃料ガスを0.5間秒噴きつけることにより、試験片の表面に多孔質シリカ被膜を形成した。この表面処理試験片とビクトレックス社製PEEKとを用いてインサート成形を行った。SiとOを含む化合物層5の膜厚はSTEM観察により100nmであった。
各実施例及び比較例のインサート成形品を用いて、密着性、水密性、滅菌耐性を評価する試験を行った。密着性評価のために、株式会社島津製作所製オートグラフを用いた引張り試験を行い、インサート試験片の金属基材と樹脂との密着力を測定した。各実施例及び比較例の強度は、実施例1の結果を10としたときの相対評価として示した。
水密性を評価するため、水中に各実施例及び比較例のインサート成形品を入れ、空気を注入してエアリークテストを実施し、試験片と樹脂との界面から気泡が発生するかどうかを観察した。気泡が発生しなかった場合を○と表記し、気泡が発生した場合を×と表記した。
滅菌耐性を評価するため、各実施例及び比較例のインサート成形品を、過酸化水素ガスを用いて滅菌し、50回滅菌を行った後に密着性と水密性について同様の試験を行った。
以上の結果を表1に示す。
一方、比較例1及び比較例2は滅菌処理前後の水密性が不十分であり、比較例3は滅菌後に気泡が発生し水密性が保たれなかった。
また、上述の各実施形態及び各変形例において示した構成要素は適宜に組み合わせて構成することが可能である。
2,22 金属基材
3 ニッケル層(下地層)
4 貴金属層
5 化合物層
6 混合層
10 電気信号コネクタ
12 電気信号端子
7,14 樹脂部
Claims (13)
- 金属基材と樹脂とが接合されたインサート成形品であり、
前記金属基材と前記樹脂の間に、前記金属基材側から順に、
ニッケルを含むNi層である下地層と、
貴金属層と、
多孔質のシリカ被膜である化合物層と、
多孔質のシリカと前記樹脂が混在する混合層と、
を有し、
前記化合物層及び前記混合層において前記Ni層から前記貴金属層を通って拡散したNiが存在することを特徴とする、インサート成形品。 - 前記化合物層及び前記混合層に存在するNiは、ニッケル化合物として存在する
請求項1に記載のインサート成形品。 - 前記ニッケル化合物は、NiとOとを含む化合物である
請求項2に記載のインサート成形品。 - 前記ニッケル化合物は、Niを含むケイ酸塩である
請求項2に記載のインサート成形品。 - 前記樹脂はポリエーテルエーテルケトン樹脂(PEEK)である
請求項1から請求項4のいずれか一項に記載のインサート成形品。 - 前記貴金属層は金である
請求項1から請求項5のいずれか一項に記載のインサート成形品。 - 前記化合物層の膜厚が1nm以上10μm以下である
請求項1から請求項6の何れか一項に記載のインサート成形品。 - 前記金属基材は、円柱状の電気信号端子である
請求項1から請求項7の何れか一項に記載のインサート成形品。 - 請求項1から請求項7の何れか一項に記載のインサート成形品を備えた電気信号コネクタ。
- 請求項1から請求項8の何れか一項に記載のインサート成形品を備えた内視鏡。
- 金属基材と樹脂とをインサート成形する方法であり、
前記金属基材の表面にニッケルを含む下地層を形成する工程と、
前記下地層の表面に厚さ0.5μm以下の貴金属層を形成する工程と、
前記貴金属層の表面に多孔質のシリカ被膜である化合物層を厚さ10μm以下で形成する工程と、
前記化合物層に接して200℃以上の樹脂温度で樹脂をインサート成形により導入することで、前記樹脂と前記化合物層の境界で、前記樹脂と、前記化合物層の多孔質のシリカとが混合して、前記多孔質のシリカと前記樹脂とが混在する混合層を形成するとともに、ニッケルを前記下地層から前記貴金属層を通って、前記化合物層と前記混合層とに拡散させる工程と、
を有することを特徴とするインサート成形法。 - 前記化合物層はCVD法により形成する
請求項11に記載のインサート成形法。 - 金属基材と樹脂とをインサート成形する方法であり、
前記金属基材の表面に下地層を形成する工程と、
前記下地層の表面に厚さ0.5μm以下の貴金属層を形成する工程と、
前記貴金属層の表面に多孔質のシリカ被膜である化合物層を厚さ10μm以下で形成する工程と、
前記化合物層に接して200℃以上の樹脂温度で樹脂をインサート成形により導入する工程と、
を有し、
前記化合物層はCVD法により形成することを特徴とする、インサート成形法。
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DE112017001239.2T DE112017001239T5 (de) | 2016-03-08 | 2017-03-02 | Inserttechnikerzeugnis, elektrischer Signalverbinder, Endoskop und Inserttechnikverfahren |
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JP2016044827A (ja) | 2014-08-20 | 2016-04-04 | 日立アプライアンス株式会社 | 空気調和機 |
JP5945650B1 (ja) * | 2014-09-11 | 2016-07-05 | オリンパス株式会社 | インサート成形品、該インサート成形品を用いた機器及びインサート成形品の製造方法 |
CN104608317B (zh) * | 2015-02-03 | 2017-09-26 | 东莞市慧泽凌化工科技有限公司 | 一种金属和树脂的结合体的制备方法及制品 |
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2016
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- 2017-03-02 CN CN201780011718.2A patent/CN108698274B/zh active Active
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CN108698274A (zh) | 2018-10-23 |
JP2017159516A (ja) | 2017-09-14 |
US10918262B2 (en) | 2021-02-16 |
CN108698274B (zh) | 2020-09-22 |
DE112017001239T5 (de) | 2018-12-13 |
US20180338671A1 (en) | 2018-11-29 |
WO2017154737A1 (ja) | 2017-09-14 |
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