JP6717071B2 - キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体 - Google Patents
キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体 Download PDFInfo
- Publication number
- JP6717071B2 JP6717071B2 JP2016118443A JP2016118443A JP6717071B2 JP 6717071 B2 JP6717071 B2 JP 6717071B2 JP 2016118443 A JP2016118443 A JP 2016118443A JP 2016118443 A JP2016118443 A JP 2016118443A JP 6717071 B2 JP6717071 B2 JP 6717071B2
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- JP
- Japan
- Prior art keywords
- switch
- circuit
- capacitor
- array
- control signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/40—Structural combinations of fixed capacitors with other electric elements, the structure mainly consisting of a capacitor, e.g. RC combinations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/54—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using means specified in two or more of groups G01D5/02, G01D5/12, G01D5/26, G01D5/42, and G01D5/48
- G01D5/56—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using means specified in two or more of groups G01D5/02, G01D5/12, G01D5/26, G01D5/42, and G01D5/48 using electric or magnetic means
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/001—Analogue/digital/analogue conversion
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
- H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
- H03M1/1061—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values using digitally programmable trimming circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
- H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/74—Simultaneous conversion
- H03M1/80—Simultaneous conversion using weighted impedances
- H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
- H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Nonlinear Science (AREA)
- Semiconductor Integrated Circuits (AREA)
- Gyroscopes (AREA)
- Analogue/Digital Conversion (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016118443A JP6717071B2 (ja) | 2016-06-15 | 2016-06-15 | キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体 |
| US15/617,292 US9892857B2 (en) | 2016-06-15 | 2017-06-08 | Capacitor circuit, circuit device, physical quantity detecting device, electronic apparatus, and moving object |
| CN201710433512.0A CN107528593B (zh) | 2016-06-15 | 2017-06-09 | 电容器电路、电路装置、物理量检测装置、电子设备和移动体 |
| US15/862,992 US10008333B2 (en) | 2016-06-15 | 2018-01-05 | Capacitor circuit, circuit device, physical quantity detecting device, electronic apparatus, and moving object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016118443A JP6717071B2 (ja) | 2016-06-15 | 2016-06-15 | キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017224692A JP2017224692A (ja) | 2017-12-21 |
| JP2017224692A5 JP2017224692A5 (https=) | 2019-06-06 |
| JP6717071B2 true JP6717071B2 (ja) | 2020-07-01 |
Family
ID=60659710
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016118443A Active JP6717071B2 (ja) | 2016-06-15 | 2016-06-15 | キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体 |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US9892857B2 (https=) |
| JP (1) | JP6717071B2 (https=) |
| CN (1) | CN107528593B (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6500522B2 (ja) * | 2015-03-16 | 2019-04-17 | セイコーエプソン株式会社 | 回路装置、物理量検出装置、電子機器及び移動体 |
| TWI656744B (zh) * | 2017-05-19 | 2019-04-11 | 瑞昱半導體股份有限公司 | 積體電路電容布局 |
| US10410934B2 (en) * | 2017-12-07 | 2019-09-10 | Micron Technology, Inc. | Apparatuses having an interconnect extending from an upper conductive structure, through a hole in another conductive structure, and to an underlying structure |
| JP7077617B2 (ja) * | 2017-12-28 | 2022-05-31 | セイコーエプソン株式会社 | 回路装置、振動デバイス、電子機器及び移動体 |
| US10840232B2 (en) | 2018-06-27 | 2020-11-17 | Silicon Laboratories Inc. | Shielding in a unit capacitor array |
| JP7314553B2 (ja) * | 2019-03-22 | 2023-07-26 | セイコーエプソン株式会社 | 回路装置、発振器、電子機器及び移動体 |
| US11012079B1 (en) * | 2019-12-19 | 2021-05-18 | Bae Systems Information And Electronic Systems Integration Inc. | Continuous tuning of digitally switched voltage-controlled oscillator frequency bands |
| JP7226470B2 (ja) * | 2021-04-26 | 2023-02-21 | セイコーエプソン株式会社 | 電気光学装置および電子機器 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6016019A (en) * | 1998-05-28 | 2000-01-18 | Microchip Technology Incorporated | Capacitor array arrangement for improving capacitor array matching |
| US6452778B1 (en) * | 2000-06-19 | 2002-09-17 | Cygnal Integrated Products, Inc. | Parasitic insensitive capacitor in d/a converter |
| JP4463528B2 (ja) | 2003-10-29 | 2010-05-19 | パナソニック株式会社 | 半導体集積回路装置およびデルタ・シグマad変換装置 |
| JP2004214692A (ja) * | 2004-02-16 | 2004-07-29 | Matsushita Electric Ind Co Ltd | 半導体集積回路装置ならびにd/a変換装置およびa/d変換装置 |
| JP4927494B2 (ja) * | 2005-10-21 | 2012-05-09 | パナソニック株式会社 | アナログディジタル変換器、およびアナログディジタル変換器の設計方法 |
| FR2965942B1 (fr) * | 2010-10-08 | 2013-02-22 | Commissariat Energie Atomique | Afficheur a cristal liquide de type transmissif en technologie cmos avec capacite de stockage auxiliaire |
| JP6091833B2 (ja) * | 2012-10-04 | 2017-03-08 | 株式会社ワコム | 信号処理回路、信号処理方法、位置検出装置、及び電子機器 |
| JP2014120615A (ja) * | 2012-12-17 | 2014-06-30 | Fujitsu Semiconductor Ltd | 容量素子、容量アレイおよびa/d変換器 |
| JP6287433B2 (ja) * | 2014-03-25 | 2018-03-07 | セイコーエプソン株式会社 | 逐次比較型アナログ−デジタル変換器、物理量検出センサー、電子機器及び移動体並びに逐次比較型アナログ−デジタル変換方法 |
| JP6615565B2 (ja) * | 2014-10-24 | 2019-12-04 | 株式会社半導体エネルギー研究所 | 半導体装置 |
-
2016
- 2016-06-15 JP JP2016118443A patent/JP6717071B2/ja active Active
-
2017
- 2017-06-08 US US15/617,292 patent/US9892857B2/en active Active
- 2017-06-09 CN CN201710433512.0A patent/CN107528593B/zh active Active
-
2018
- 2018-01-05 US US15/862,992 patent/US10008333B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US9892857B2 (en) | 2018-02-13 |
| US20180130606A1 (en) | 2018-05-10 |
| US10008333B2 (en) | 2018-06-26 |
| JP2017224692A (ja) | 2017-12-21 |
| CN107528593A (zh) | 2017-12-29 |
| US20170365414A1 (en) | 2017-12-21 |
| CN107528593B (zh) | 2023-06-02 |
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