JP6717071B2 - キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体 - Google Patents

キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体 Download PDF

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Publication number
JP6717071B2
JP6717071B2 JP2016118443A JP2016118443A JP6717071B2 JP 6717071 B2 JP6717071 B2 JP 6717071B2 JP 2016118443 A JP2016118443 A JP 2016118443A JP 2016118443 A JP2016118443 A JP 2016118443A JP 6717071 B2 JP6717071 B2 JP 6717071B2
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Japan
Prior art keywords
switch
circuit
capacitor
array
control signal
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JP2016118443A
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English (en)
Japanese (ja)
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JP2017224692A5 (https=
JP2017224692A (ja
Inventor
敦嗣 田中
敦嗣 田中
秀生 羽田
秀生 羽田
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Seiko Epson Corp
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Seiko Epson Corp
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Publication date
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Priority to JP2016118443A priority Critical patent/JP6717071B2/ja
Priority to US15/617,292 priority patent/US9892857B2/en
Priority to CN201710433512.0A priority patent/CN107528593B/zh
Publication of JP2017224692A publication Critical patent/JP2017224692A/ja
Priority to US15/862,992 priority patent/US10008333B2/en
Publication of JP2017224692A5 publication Critical patent/JP2017224692A5/ja
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/40Structural combinations of fixed capacitors with other electric elements, the structure mainly consisting of a capacitor, e.g. RC combinations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00Measuring or testing not otherwise provided for
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/54Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using means specified in two or more of groups G01D5/02, G01D5/12, G01D5/26, G01D5/42, and G01D5/48
    • G01D5/56Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using means specified in two or more of groups G01D5/02, G01D5/12, G01D5/26, G01D5/42, and G01D5/48 using electric or magnetic means
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/001Analogue/digital/analogue conversion
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10Calibration or testing
    • H03M1/1009Calibration
    • H03M1/1033Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1057Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
    • H03M1/1061Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values using digitally programmable trimming circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/124Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245Details of sampling arrangements or methods
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/34Analogue value compared with reference values
    • H03M1/38Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/34Analogue value compared with reference values
    • H03M1/38Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66Digital/analogue converters
    • H03M1/68Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66Digital/analogue converters
    • H03M1/74Simultaneous conversion
    • H03M1/80Simultaneous conversion using weighted impedances
    • H03M1/802Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Nonlinear Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Gyroscopes (AREA)
  • Analogue/Digital Conversion (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2016118443A 2016-06-15 2016-06-15 キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体 Active JP6717071B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2016118443A JP6717071B2 (ja) 2016-06-15 2016-06-15 キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体
US15/617,292 US9892857B2 (en) 2016-06-15 2017-06-08 Capacitor circuit, circuit device, physical quantity detecting device, electronic apparatus, and moving object
CN201710433512.0A CN107528593B (zh) 2016-06-15 2017-06-09 电容器电路、电路装置、物理量检测装置、电子设备和移动体
US15/862,992 US10008333B2 (en) 2016-06-15 2018-01-05 Capacitor circuit, circuit device, physical quantity detecting device, electronic apparatus, and moving object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016118443A JP6717071B2 (ja) 2016-06-15 2016-06-15 キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体

Publications (3)

Publication Number Publication Date
JP2017224692A JP2017224692A (ja) 2017-12-21
JP2017224692A5 JP2017224692A5 (https=) 2019-06-06
JP6717071B2 true JP6717071B2 (ja) 2020-07-01

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JP2016118443A Active JP6717071B2 (ja) 2016-06-15 2016-06-15 キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体

Country Status (3)

Country Link
US (2) US9892857B2 (https=)
JP (1) JP6717071B2 (https=)
CN (1) CN107528593B (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6500522B2 (ja) * 2015-03-16 2019-04-17 セイコーエプソン株式会社 回路装置、物理量検出装置、電子機器及び移動体
TWI656744B (zh) * 2017-05-19 2019-04-11 瑞昱半導體股份有限公司 積體電路電容布局
US10410934B2 (en) * 2017-12-07 2019-09-10 Micron Technology, Inc. Apparatuses having an interconnect extending from an upper conductive structure, through a hole in another conductive structure, and to an underlying structure
JP7077617B2 (ja) * 2017-12-28 2022-05-31 セイコーエプソン株式会社 回路装置、振動デバイス、電子機器及び移動体
US10840232B2 (en) 2018-06-27 2020-11-17 Silicon Laboratories Inc. Shielding in a unit capacitor array
JP7314553B2 (ja) * 2019-03-22 2023-07-26 セイコーエプソン株式会社 回路装置、発振器、電子機器及び移動体
US11012079B1 (en) * 2019-12-19 2021-05-18 Bae Systems Information And Electronic Systems Integration Inc. Continuous tuning of digitally switched voltage-controlled oscillator frequency bands
JP7226470B2 (ja) * 2021-04-26 2023-02-21 セイコーエプソン株式会社 電気光学装置および電子機器

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6016019A (en) * 1998-05-28 2000-01-18 Microchip Technology Incorporated Capacitor array arrangement for improving capacitor array matching
US6452778B1 (en) * 2000-06-19 2002-09-17 Cygnal Integrated Products, Inc. Parasitic insensitive capacitor in d/a converter
JP4463528B2 (ja) 2003-10-29 2010-05-19 パナソニック株式会社 半導体集積回路装置およびデルタ・シグマad変換装置
JP2004214692A (ja) * 2004-02-16 2004-07-29 Matsushita Electric Ind Co Ltd 半導体集積回路装置ならびにd/a変換装置およびa/d変換装置
JP4927494B2 (ja) * 2005-10-21 2012-05-09 パナソニック株式会社 アナログディジタル変換器、およびアナログディジタル変換器の設計方法
FR2965942B1 (fr) * 2010-10-08 2013-02-22 Commissariat Energie Atomique Afficheur a cristal liquide de type transmissif en technologie cmos avec capacite de stockage auxiliaire
JP6091833B2 (ja) * 2012-10-04 2017-03-08 株式会社ワコム 信号処理回路、信号処理方法、位置検出装置、及び電子機器
JP2014120615A (ja) * 2012-12-17 2014-06-30 Fujitsu Semiconductor Ltd 容量素子、容量アレイおよびa/d変換器
JP6287433B2 (ja) * 2014-03-25 2018-03-07 セイコーエプソン株式会社 逐次比較型アナログ−デジタル変換器、物理量検出センサー、電子機器及び移動体並びに逐次比較型アナログ−デジタル変換方法
JP6615565B2 (ja) * 2014-10-24 2019-12-04 株式会社半導体エネルギー研究所 半導体装置

Also Published As

Publication number Publication date
US9892857B2 (en) 2018-02-13
US20180130606A1 (en) 2018-05-10
US10008333B2 (en) 2018-06-26
JP2017224692A (ja) 2017-12-21
CN107528593A (zh) 2017-12-29
US20170365414A1 (en) 2017-12-21
CN107528593B (zh) 2023-06-02

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