JP6713909B2 - 装置、有形のマシン読取可能な記録可能な記憶媒体、および方法 - Google Patents
装置、有形のマシン読取可能な記録可能な記憶媒体、および方法 Download PDFInfo
- Publication number
- JP6713909B2 JP6713909B2 JP2016213142A JP2016213142A JP6713909B2 JP 6713909 B2 JP6713909 B2 JP 6713909B2 JP 2016213142 A JP2016213142 A JP 2016213142A JP 2016213142 A JP2016213142 A JP 2016213142A JP 6713909 B2 JP6713909 B2 JP 6713909B2
- Authority
- JP
- Japan
- Prior art keywords
- read threshold
- threshold voltage
- bit error
- error rate
- read
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
- G06F11/0727—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a storage system, e.g. in a DASD or network based storage system
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
- G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
- G06F11/076—Error or fault detection not based on redundancy by exceeding limits by exceeding a count or rate limit, e.g. word- or bit count limit
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/079—Root cause analysis, i.e. error or fault diagnosis
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0793—Remedial or corrective actions
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5642—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/12—Programming voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3404—Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Health & Medical Sciences (AREA)
- Biomedical Technology (AREA)
- Read Only Memory (AREA)
- Retry When Errors Occur (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/928,284 US9818488B2 (en) | 2015-10-30 | 2015-10-30 | Read threshold voltage adaptation using bit error rates based on decoded data |
| US14/928,284 | 2015-10-30 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017084436A JP2017084436A (ja) | 2017-05-18 |
| JP2017084436A5 JP2017084436A5 (enExample) | 2019-07-04 |
| JP6713909B2 true JP6713909B2 (ja) | 2020-06-24 |
Family
ID=58635551
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016213142A Expired - Fee Related JP6713909B2 (ja) | 2015-10-30 | 2016-10-31 | 装置、有形のマシン読取可能な記録可能な記憶媒体、および方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9818488B2 (enExample) |
| JP (1) | JP6713909B2 (enExample) |
| KR (1) | KR20170054276A (enExample) |
| CN (1) | CN107039080B (enExample) |
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| US10381090B2 (en) | 2017-03-31 | 2019-08-13 | Samsung Electronics Co., Ltd. | Operation method of nonvolatile memory device and storage device |
| US10452480B2 (en) * | 2017-05-25 | 2019-10-22 | Micron Technology, Inc. | Memory device with dynamic processing level calibration |
| TWI643196B (zh) * | 2017-06-22 | 2018-12-01 | 點序科技股份有限公司 | 快閃記憶體裝置及其資料讀取方法 |
| US10236067B2 (en) * | 2017-08-02 | 2019-03-19 | International Business Machines Corporation | State-dependent read voltage threshold adaptation for nonvolatile memory |
| US10403372B2 (en) * | 2017-08-29 | 2019-09-03 | SK Hynix Inc. | Memory system with adaptive read-threshold scheme and method of operating such memory system |
| US10276233B1 (en) | 2017-10-31 | 2019-04-30 | Seagate Technology Llc | Adaptive read threshold voltage tracking with charge leakage mitigation using threshold voltage offsets |
| US10388368B2 (en) | 2017-10-31 | 2019-08-20 | Seagate Technology Llc | Adaptive read threshold voltage tracking with charge leakage mitigation using charge leakage settling time |
| US10418097B2 (en) * | 2017-11-27 | 2019-09-17 | Western Digital Technologies, Inc. | Non-volatile storage system with read calibration |
| US10446243B2 (en) * | 2017-12-18 | 2019-10-15 | Macronix International Co., Ltd. | Storage device and associated control method to determine target memory blocks for probe operation |
| US11068186B2 (en) * | 2018-02-09 | 2021-07-20 | Micron Technology, Inc. | Providing recovered data to a new memory cell at a memory sub-system based on an unsuccessful error correction operation |
| CN110265083B (zh) * | 2018-03-12 | 2021-07-27 | 旺宏电子股份有限公司 | 存储器装置的数据探测方法 |
| US10552259B2 (en) * | 2018-03-15 | 2020-02-04 | Western Digital Technologies, Inc. | Recovery combining hard decoding, soft decoding and artificial codeword generation |
| CN110473581B (zh) * | 2018-05-09 | 2020-12-29 | 建兴储存科技(广州)有限公司 | 固态储存装置及其相关控制方法 |
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| CN109062509B (zh) * | 2018-07-20 | 2021-07-16 | 浪潮电子信息产业股份有限公司 | 固态硬盘的数据处理方法以及相关装置 |
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| CN109935261B (zh) * | 2019-02-19 | 2021-08-31 | 西南交通大学 | 一种用于存储器差错控制的多级译码方法和装置 |
| CN110209517B (zh) * | 2019-04-25 | 2024-01-23 | 深圳市金泰克半导体有限公司 | 一种固态硬盘工作方法、系统、电子设备及存储介质 |
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| CN112242171B (zh) * | 2019-07-17 | 2024-11-08 | 英韧科技股份有限公司 | 参考电压确定方法及装置 |
| US11023172B2 (en) * | 2019-07-26 | 2021-06-01 | Micron Technology, Inc. | Selecting read voltage using write transaction data |
| US10783978B1 (en) * | 2019-08-27 | 2020-09-22 | Micron Technology, Inc. | Read voltage-assisted manufacturing tests of memory sub-system |
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| CN112988448B (zh) * | 2019-12-16 | 2025-05-09 | 中国科学院微电子研究所 | 误码率平衡方法及装置,读取方法及装置 |
| US11494254B2 (en) * | 2019-12-20 | 2022-11-08 | Cnex Labs, Inc. | Storage system with predictive adjustment mechanism and method of operation thereof |
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| CN113595562B (zh) * | 2021-07-23 | 2023-05-09 | 深圳宏芯宇电子股份有限公司 | 软数据处理方法、装置、存储介质及解码器 |
| KR20230049881A (ko) | 2021-10-07 | 2023-04-14 | 삼성전자주식회사 | 스토리지 장치 및 스토리지 장치의 동작 방법 |
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| CN119597204A (zh) * | 2023-09-08 | 2025-03-11 | 慧荣科技股份有限公司 | 数据存取控制的方法、存储器装置的存储器控制器、存储器装置以及电子装置 |
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| TWI521529B (zh) | 2014-04-15 | 2016-02-11 | 群聯電子股份有限公司 | 解碼方法、記憶體儲存裝置及記憶體控制電路單元 |
| US9263138B1 (en) * | 2014-09-30 | 2016-02-16 | Seagate Technology | Systems and methods for dynamically programming a flash memory device |
-
2015
- 2015-10-30 US US14/928,284 patent/US9818488B2/en active Active
-
2016
- 2016-10-31 JP JP2016213142A patent/JP6713909B2/ja not_active Expired - Fee Related
- 2016-10-31 KR KR1020160143663A patent/KR20170054276A/ko not_active Ceased
- 2016-10-31 CN CN201610967649.XA patent/CN107039080B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN107039080A (zh) | 2017-08-11 |
| KR20170054276A (ko) | 2017-05-17 |
| US9818488B2 (en) | 2017-11-14 |
| US20170125111A1 (en) | 2017-05-04 |
| JP2017084436A (ja) | 2017-05-18 |
| CN107039080B (zh) | 2021-11-12 |
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| A521 | Request for written amendment filed |
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