JP6684191B2 - 基板洗浄装置およびそれを備える基板処理装置 - Google Patents
基板洗浄装置およびそれを備える基板処理装置 Download PDFInfo
- Publication number
- JP6684191B2 JP6684191B2 JP2016172672A JP2016172672A JP6684191B2 JP 6684191 B2 JP6684191 B2 JP 6684191B2 JP 2016172672 A JP2016172672 A JP 2016172672A JP 2016172672 A JP2016172672 A JP 2016172672A JP 6684191 B2 JP6684191 B2 JP 6684191B2
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- JP
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- Prior art keywords
- substrate
- cleaning
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- end surface
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70975—Assembly, maintenance, transport or storage of apparatus
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0412—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Cleaning In General (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016172672A JP6684191B2 (ja) | 2016-09-05 | 2016-09-05 | 基板洗浄装置およびそれを備える基板処理装置 |
| TW106128549A TWI674153B (zh) | 2016-09-05 | 2017-08-23 | 基板洗淨裝置及具備其之基板處理裝置 |
| US15/691,929 US10331049B2 (en) | 2016-09-05 | 2017-08-31 | Substrate cleaning device and substrate processing apparatus including the same |
| KR1020170111729A KR101972226B1 (ko) | 2016-09-05 | 2017-09-01 | 기판 세정 장치 및 그것을 구비하는 기판 처리 장치 |
| CN201710779419.5A CN107799442B (zh) | 2016-09-05 | 2017-09-01 | 基板清洗装置及具备该基板清洗装置的基板处理装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016172672A JP6684191B2 (ja) | 2016-09-05 | 2016-09-05 | 基板洗浄装置およびそれを備える基板処理装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018041754A JP2018041754A (ja) | 2018-03-15 |
| JP2018041754A5 JP2018041754A5 (https=) | 2019-09-12 |
| JP6684191B2 true JP6684191B2 (ja) | 2020-04-22 |
Family
ID=61282178
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016172672A Active JP6684191B2 (ja) | 2016-09-05 | 2016-09-05 | 基板洗浄装置およびそれを備える基板処理装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10331049B2 (https=) |
| JP (1) | JP6684191B2 (https=) |
| KR (1) | KR101972226B1 (https=) |
| CN (1) | CN107799442B (https=) |
| TW (1) | TWI674153B (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102081706B1 (ko) * | 2018-07-18 | 2020-02-27 | 세메스 주식회사 | 기판 처리 방법 및 기판 처리 장치 |
| CN111069115A (zh) * | 2018-10-22 | 2020-04-28 | 长鑫存储技术有限公司 | 一种cmp后清洗方法 |
| JP7348021B2 (ja) * | 2019-10-15 | 2023-09-20 | 株式会社荏原製作所 | 基板洗浄装置及び基板洗浄方法 |
| JP2021074825A (ja) * | 2019-11-11 | 2021-05-20 | 株式会社ディスコ | 保持面洗浄装置 |
| CN111341699B (zh) * | 2020-03-09 | 2023-03-31 | 杭州众硅电子科技有限公司 | 一种清洗刷预清洗系统 |
| JP2024106671A (ja) * | 2023-01-27 | 2024-08-08 | 株式会社Screenホールディングス | 基板処理装置 |
Family Cites Families (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW316995B (https=) * | 1995-01-19 | 1997-10-01 | Tokyo Electron Co Ltd | |
| US5927305A (en) * | 1996-02-20 | 1999-07-27 | Pre-Tech Co., Ltd. | Cleaning apparatus |
| JP3756284B2 (ja) | 1997-04-30 | 2006-03-15 | 大日本スクリーン製造株式会社 | 基板洗浄装置 |
| US6115867A (en) * | 1997-08-18 | 2000-09-12 | Tokyo Electron Limited | Apparatus for cleaning both sides of substrate |
| JP3415435B2 (ja) * | 1998-04-03 | 2003-06-09 | 東京エレクトロン株式会社 | 処理装置及び処理方法 |
| JP4334758B2 (ja) * | 1999-12-17 | 2009-09-30 | 東京エレクトロン株式会社 | 膜形成装置 |
| US6418584B1 (en) * | 2000-05-24 | 2002-07-16 | Speedfam-Ipec Corporation | Apparatus and process for cleaning a work piece |
| JP3888608B2 (ja) * | 2001-04-25 | 2007-03-07 | 東京エレクトロン株式会社 | 基板両面処理装置 |
| JP2003007664A (ja) * | 2001-06-22 | 2003-01-10 | Ses Co Ltd | 枚葉式基板洗浄方法および枚葉式基板洗浄装置 |
| JP2003243350A (ja) * | 2002-02-14 | 2003-08-29 | Tokyo Electron Ltd | スクラブ洗浄装置におけるブラシクリーニング方法及び処理システム |
| JP2006278392A (ja) * | 2005-03-28 | 2006-10-12 | Dainippon Screen Mfg Co Ltd | 基板洗浄装置および基板洗浄方法 |
| KR100795622B1 (ko) * | 2005-03-30 | 2008-01-17 | 다이닛뽕스크린 세이조오 가부시키가이샤 | 기판처리장치 및 기판처리방법 |
| JP4726752B2 (ja) * | 2005-10-25 | 2011-07-20 | 義治 山本 | 基板洗浄装置 |
| KR100892809B1 (ko) * | 2006-03-30 | 2009-04-10 | 다이닛뽕스크린 세이조오 가부시키가이샤 | 기판처리장치 및 기판처리방법 |
| US20070251035A1 (en) * | 2006-05-01 | 2007-11-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Cleaning device |
| JP4796542B2 (ja) * | 2007-05-30 | 2011-10-19 | 株式会社プレテック | 洗浄装置 |
| JP4939376B2 (ja) * | 2007-11-13 | 2012-05-23 | 株式会社Sokudo | 基板処理装置 |
| JP5091687B2 (ja) * | 2008-01-08 | 2012-12-05 | 株式会社Sokudo | 基板処理装置 |
| KR101423611B1 (ko) * | 2008-01-16 | 2014-07-30 | 삼성전자주식회사 | 기판 처리 장치, 노광 장치 및 클리닝 툴의 세정 방법 |
| JP2010287686A (ja) * | 2009-06-10 | 2010-12-24 | Tokyo Electron Ltd | 塗布、現像装置及び基板の裏面洗浄方法。 |
| JP5437168B2 (ja) * | 2009-08-07 | 2014-03-12 | 東京エレクトロン株式会社 | 基板の液処理装置および液処理方法 |
| US20120285484A1 (en) * | 2011-05-13 | 2012-11-15 | Li-Chung Liu | Method for cleaning a semiconductor wafer |
| TWI524456B (zh) * | 2011-11-04 | 2016-03-01 | 東京威力科創股份有限公司 | 基板處理系統、基板運送方法、程式及電腦記憶媒體 |
| TWI550686B (zh) * | 2011-11-04 | 2016-09-21 | 東京威力科創股份有限公司 | 基板處理系統、基板運送方法及電腦記憶媒體 |
| JP5637974B2 (ja) * | 2011-11-28 | 2014-12-10 | 東京エレクトロン株式会社 | 基板洗浄装置及び基板洗浄方法 |
| US9119464B2 (en) * | 2012-01-31 | 2015-09-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Brush cleaning system |
| JP6061484B2 (ja) * | 2012-03-27 | 2017-01-18 | 株式会社Screenセミコンダクターソリューションズ | 基板洗浄装置およびそれを備えた基板処理装置 |
| JP6001896B2 (ja) * | 2012-03-27 | 2016-10-05 | 株式会社Screenセミコンダクターソリューションズ | 基板洗浄装置およびそれを備えた基板処理装置 |
| JP5887227B2 (ja) * | 2012-08-07 | 2016-03-16 | 株式会社荏原製作所 | ドレッサーディスク洗浄用ブラシ、洗浄装置及び洗浄方法 |
| US9211568B2 (en) | 2013-03-12 | 2015-12-15 | Taiwan Semiconductor Manufacturing Company Limited | Clean function for semiconductor wafer scrubber |
| JP6143589B2 (ja) | 2013-07-12 | 2017-06-07 | 株式会社Screenホールディングス | 基板処理装置 |
| JP6066861B2 (ja) * | 2013-08-05 | 2017-01-25 | 東京エレクトロン株式会社 | 基板洗浄装置、基板の裏面洗浄方法及び洗浄機構 |
| KR20150075357A (ko) * | 2013-12-25 | 2015-07-03 | 가부시키가이샤 에바라 세이사꾸쇼 | 기판 세정 장치 및 기판 처리 장치 |
| SG10201906815XA (en) * | 2014-08-26 | 2019-08-27 | Ebara Corp | Substrate processing apparatus |
| US10141205B2 (en) * | 2014-09-26 | 2018-11-27 | Acm Research (Shanghai) Inc. | Apparatus and method for cleaning semiconductor wafer |
| JP6503194B2 (ja) | 2015-02-16 | 2019-04-17 | 株式会社Screenホールディングス | 基板処理装置 |
| JP6751634B2 (ja) * | 2016-09-21 | 2020-09-09 | 株式会社Screenホールディングス | 基板処理装置 |
| TWI821887B (zh) * | 2016-11-29 | 2023-11-11 | 日商東京威力科創股份有限公司 | 基板處理裝置、基板處理方法及記錄媒體 |
| JP6885754B2 (ja) * | 2017-03-09 | 2021-06-16 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
-
2016
- 2016-09-05 JP JP2016172672A patent/JP6684191B2/ja active Active
-
2017
- 2017-08-23 TW TW106128549A patent/TWI674153B/zh active
- 2017-08-31 US US15/691,929 patent/US10331049B2/en active Active
- 2017-09-01 CN CN201710779419.5A patent/CN107799442B/zh active Active
- 2017-09-01 KR KR1020170111729A patent/KR101972226B1/ko active Active
Also Published As
| Publication number | Publication date |
|---|---|
| KR101972226B1 (ko) | 2019-04-24 |
| JP2018041754A (ja) | 2018-03-15 |
| CN107799442B (zh) | 2021-09-14 |
| CN107799442A (zh) | 2018-03-13 |
| KR20180027357A (ko) | 2018-03-14 |
| US10331049B2 (en) | 2019-06-25 |
| TWI674153B (zh) | 2019-10-11 |
| US20180067407A1 (en) | 2018-03-08 |
| TW201811453A (zh) | 2018-04-01 |
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