JP6638537B2 - 試料解析システム - Google Patents
試料解析システム Download PDFInfo
- Publication number
- JP6638537B2 JP6638537B2 JP2016084964A JP2016084964A JP6638537B2 JP 6638537 B2 JP6638537 B2 JP 6638537B2 JP 2016084964 A JP2016084964 A JP 2016084964A JP 2016084964 A JP2016084964 A JP 2016084964A JP 6638537 B2 JP6638537 B2 JP 6638537B2
- Authority
- JP
- Japan
- Prior art keywords
- coincidence
- measurement data
- edx
- data
- degree
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/3103—Atomic absorption analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/10—Detecting, e.g. by using light barriers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/68—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/304—Accessories, mechanical or electrical features electric circuits, signal processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/618—Specific applications or type of materials food
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/02—Food
-
- G—PHYSICS
- G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
- G16C—COMPUTATIONAL CHEMISTRY; CHEMOINFORMATICS; COMPUTATIONAL MATERIALS SCIENCE
- G16C20/00—Chemoinformatics, i.e. ICT specially adapted for the handling of physicochemical or structural data of chemical particles, elements, compounds or mixtures
- G16C20/20—Identification of molecular entities, parts thereof or of chemical compositions
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016084964A JP6638537B2 (ja) | 2016-04-21 | 2016-04-21 | 試料解析システム |
| EP17165987.3A EP3236245B1 (en) | 2016-04-21 | 2017-04-11 | Sample-analyzing system |
| US15/484,529 US10539520B2 (en) | 2016-04-21 | 2017-04-11 | Sample-analyzing system |
| CN201710259756.1A CN107367621A (zh) | 2016-04-21 | 2017-04-19 | 样品分析系统 |
| CN201910427673.8A CN110244069B (zh) | 2016-04-21 | 2017-04-19 | 样品分析系统 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016084964A JP6638537B2 (ja) | 2016-04-21 | 2016-04-21 | 試料解析システム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017194360A JP2017194360A (ja) | 2017-10-26 |
| JP2017194360A5 JP2017194360A5 (enExample) | 2018-12-13 |
| JP6638537B2 true JP6638537B2 (ja) | 2020-01-29 |
Family
ID=58536871
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016084964A Active JP6638537B2 (ja) | 2016-04-21 | 2016-04-21 | 試料解析システム |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10539520B2 (enExample) |
| EP (1) | EP3236245B1 (enExample) |
| JP (1) | JP6638537B2 (enExample) |
| CN (2) | CN107367621A (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6679049B2 (ja) * | 2018-09-28 | 2020-04-15 | 株式会社リガク | 測定装置、プログラム及び測定装置の制御方法 |
| CN109557071B (zh) * | 2018-11-14 | 2021-12-17 | 公安部第一研究所 | 一种危险液体混合物的拉曼光谱定性定量识别方法 |
| IT201900004671A1 (it) | 2019-03-28 | 2020-09-28 | De Tec Tor S R L | Apparato per controllo qualità in linee di produzione, corrispondente procedimento e prodotto informatico |
| CN110389146B (zh) * | 2019-07-26 | 2021-07-23 | 新余钢铁股份有限公司 | 一种x荧光钴内标-icp钴补偿检测铁料中全铁含量的方法 |
| EP4018934B1 (en) * | 2019-08-19 | 2025-02-26 | FUJIFILM Corporation | Medical assistance device, operation method and operation program for same, and medical assistance system |
| WO2021058853A1 (en) * | 2019-09-27 | 2021-04-01 | Sensmet Oy | Optical measurement apparatus and method |
| CN111487368B (zh) * | 2020-04-08 | 2022-02-11 | 镇江启迪数字天下科技有限公司 | 一种挥发性有机物自动检测与分析系统及方法 |
| CN115461624A (zh) | 2020-04-30 | 2022-12-09 | 株式会社岛津制作所 | 解析用浏览器、显示系统、显示方法和显示程序 |
| WO2021235090A1 (ja) * | 2020-05-22 | 2021-11-25 | 株式会社島津製作所 | 複合計測統合ビューアおよびプログラム |
| JP7653281B2 (ja) * | 2021-03-30 | 2025-03-28 | 株式会社堀場テクノサービス | 定量分析方法、定量分析システム、及び、定量分析システム用プログラム |
| JP7724076B2 (ja) * | 2021-04-30 | 2025-08-15 | 株式会社キーエンス | 分析装置 |
| JP7751962B2 (ja) * | 2021-04-30 | 2025-10-09 | 株式会社キーエンス | レーザ誘起ブレークダウン分光装置 |
| DE102021112584B4 (de) * | 2021-05-14 | 2024-11-14 | Thomas Fritsch | Inspektionsverfahren zur Erfassung von Fremdkörpern und/oder Materialinhomogenitäten |
| CN117333683A (zh) * | 2022-06-22 | 2024-01-02 | At&S奥地利科技及系统技术股份公司 | 用于识别异物的设备和方法 |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5130559A (en) | 1989-08-26 | 1992-07-14 | Trutzschler Gmbh & Co. Kg | Method and apparatus for recognizing particle impurities in textile fiber |
| JP2732460B2 (ja) | 1993-05-28 | 1998-03-30 | 株式会社島津製作所 | 蛍光x線分析方法 |
| US5428657A (en) * | 1994-03-22 | 1995-06-27 | Georgia Tech Research Corporation | X-ray monitoring system |
| JPH08334481A (ja) | 1996-07-25 | 1996-12-17 | Shimadzu Corp | 蛍光x線分析方法 |
| JP4092037B2 (ja) * | 1999-03-05 | 2008-05-28 | 株式会社堀場製作所 | 物質同定装置 |
| JP2001074650A (ja) | 1999-09-08 | 2001-03-23 | Shimadzu Corp | プラスチック判別法 |
| US20120062873A1 (en) | 2001-06-28 | 2012-03-15 | Chemimage Corporation | System and method for diagnosing the disease state of breast tissue using swir |
| WO2006013728A1 (ja) | 2004-08-06 | 2006-02-09 | Matsushita Electric Industrial Co., Ltd. | 蛍光x線分析方法および蛍光x線分析装置 |
| JP5447279B2 (ja) | 2004-09-24 | 2014-03-19 | 富士通株式会社 | 検査方法 |
| JP4794848B2 (ja) | 2004-09-24 | 2011-10-19 | 富士通株式会社 | 分析装置 |
| WO2006135806A2 (en) * | 2005-06-09 | 2006-12-21 | Chemimage Corporation | Forensic integrated search technology |
| GB0512945D0 (en) | 2005-06-24 | 2005-08-03 | Oxford Instr Analytical Ltd | Method and apparatus for material identification |
| JP2007278746A (ja) | 2006-04-04 | 2007-10-25 | Epson Imaging Devices Corp | 検査装置を用いた検査方法、検査装置が有する制御プログラム、検査装置 |
| JP2010223908A (ja) | 2009-03-25 | 2010-10-07 | Shimadzu Corp | 蛍光x線分析方法 |
| CN101949824A (zh) * | 2009-06-30 | 2011-01-19 | 武汉矽感科技有限公司 | 根据物质的光谱信息对商品进行检测的方法和系统装置 |
| US9518808B2 (en) | 2010-02-16 | 2016-12-13 | Research Foundation Of State University Of New York | Ammunition and weapon type identification based on spectroscopic gunshot residue analysis |
| US9086366B2 (en) * | 2012-02-15 | 2015-07-21 | L-3 Communications Security And Detection Systems, Inc. | Determining a material property based on scattered radiation |
| US8982338B2 (en) * | 2012-05-31 | 2015-03-17 | Thermo Scientific Portable Analytical Instruments Inc. | Sample analysis |
| US9110001B2 (en) * | 2012-07-02 | 2015-08-18 | Thermo Scientific Portable Analytical Instruments Inc. | Method for tagging reference materials of interest in spectroscopic searching applications |
| DE112013004743T5 (de) * | 2012-09-26 | 2015-09-24 | Panalytical Inc. | Multi-Sensoranalyse eines komplexen geologischen Materials |
| WO2015056305A1 (ja) * | 2013-10-15 | 2015-04-23 | 株式会社島津製作所 | 蛍光x線分析方法及び蛍光x線分析装置 |
| WO2015079535A1 (ja) | 2013-11-28 | 2015-06-04 | 株式会社島津製作所 | X線分析装置およびx線分析方法 |
| JP2015153296A (ja) | 2014-02-18 | 2015-08-24 | 株式会社ブルーム | 商品の二次流通市場における商品の買い取り可否判定システム及び同システムに用いる真正度の判定システム |
| JP6507757B2 (ja) | 2015-03-20 | 2019-05-08 | 株式会社島津製作所 | 異物解析装置 |
| WO2016157467A1 (ja) | 2015-03-31 | 2016-10-06 | 株式会社Ubic | データ分析システム、データ分析方法、データ分析プログラム、および、記録媒体 |
| JP6052448B2 (ja) | 2016-02-18 | 2016-12-27 | 日本電気株式会社 | 検品処理装置、検品システム、検品処理方法及びプログラム |
-
2016
- 2016-04-21 JP JP2016084964A patent/JP6638537B2/ja active Active
-
2017
- 2017-04-11 US US15/484,529 patent/US10539520B2/en active Active
- 2017-04-11 EP EP17165987.3A patent/EP3236245B1/en active Active
- 2017-04-19 CN CN201710259756.1A patent/CN107367621A/zh active Pending
- 2017-04-19 CN CN201910427673.8A patent/CN110244069B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN110244069A (zh) | 2019-09-17 |
| US20170307551A1 (en) | 2017-10-26 |
| EP3236245B1 (en) | 2019-07-10 |
| JP2017194360A (ja) | 2017-10-26 |
| EP3236245A1 (en) | 2017-10-25 |
| CN107367621A (zh) | 2017-11-21 |
| CN110244069B (zh) | 2023-08-11 |
| US10539520B2 (en) | 2020-01-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6638537B2 (ja) | 試料解析システム | |
| JP6683111B2 (ja) | 試料解析システム | |
| JP2017194360A5 (enExample) | ||
| CN105008898B (zh) | 用于组合的libs和ir吸收光谱法研究的系统和方法 | |
| Connors et al. | Application of handheld laser-induced breakdown spectroscopy (LIBS) to geochemical analysis | |
| US20140085630A1 (en) | Spectroscopic apparatus and methods for determining components present in a sample | |
| Motto-Ros et al. | Critical aspects of data analysis for quantification in laser-induced breakdown spectroscopy | |
| Andrews et al. | Analytical method development using transmission Raman spectroscopy for pharmaceutical assays and compliance with regulatory guidelines—part I: transmission Raman spectroscopy and method development | |
| JP6676743B2 (ja) | 分光画像データ処理装置および2次元分光装置 | |
| JP2018087700A5 (enExample) | ||
| Pagnin et al. | Multivariate analysis and laser-induced breakdown spectroscopy (LIBS): a new approach for the spatially resolved classification of modern art materials | |
| Eliaerts et al. | Comparison of spectroscopic techniques combined with chemometrics for cocaine powder analysis | |
| Farkas et al. | Comparison of multivariate linear regression methods in micro‐Raman spectrometric quantitative characterization | |
| Sulub et al. | Determination of polymer blends composed of polycarbonate and rubber entities using near-infrared (NIR) spectroscopy and multivariate calibration | |
| JP2008536144A (ja) | 混合物をスペクトル分析する方法および装置 | |
| Lellinger et al. | An Interlaboratory Study to Minimize Wavelength Calibration Uncertainty Due to Peak Fitting of Reference Material Spectra in Raman Spectroscopy | |
| Dziki et al. | Toward more efficient and effective color quality control for the large‐scale offset printing process | |
| JPH07128260A (ja) | 蛍光x線分析装置 | |
| Purohit et al. | Lowest-mass X-ray selected AGNs in the Boötes field | |
| JP4626572B2 (ja) | 発光分光分析装置 | |
| Kumar | Non-negative factor (NNF) assisted partial Least Square (PLS) analysis of excitation-emission matrix fluorescence spectroscopic data sets: automating the identification and quantification of Multifluorophoric mixtures | |
| Mignani et al. | Dispersive Raman spectroscopy excited at 1064nm to classify the botanic origin of honeys from Calabria and quantify the sugar profile | |
| Alsberg et al. | PryJector: a device for in situ visualization of chemical and physical property distributions on surfaces using projection and hyperspectral imaging | |
| JP2008039680A (ja) | 特定物質の含有判定方法およびその装置 | |
| Bec et al. | Chemical Interpretation of Meaningful Variables in Chemometric Models by Theoretical Simulation: The Case of NIR Analysis of Pharmaceuticals |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20181031 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20181031 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20190910 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20190917 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20191112 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20191126 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20191209 |
|
| R151 | Written notification of patent or utility model registration |
Ref document number: 6638537 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R151 |