JP6638537B2 - 試料解析システム - Google Patents

試料解析システム Download PDF

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Publication number
JP6638537B2
JP6638537B2 JP2016084964A JP2016084964A JP6638537B2 JP 6638537 B2 JP6638537 B2 JP 6638537B2 JP 2016084964 A JP2016084964 A JP 2016084964A JP 2016084964 A JP2016084964 A JP 2016084964A JP 6638537 B2 JP6638537 B2 JP 6638537B2
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JP2017194360A (ja
JP2017194360A5 (enExample
Inventor
幸雄 村上
幸雄 村上
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2016084964A priority Critical patent/JP6638537B2/ja
Priority to EP17165987.3A priority patent/EP3236245B1/en
Priority to US15/484,529 priority patent/US10539520B2/en
Priority to CN201710259756.1A priority patent/CN107367621A/zh
Priority to CN201910427673.8A priority patent/CN110244069B/zh
Publication of JP2017194360A publication Critical patent/JP2017194360A/ja
Publication of JP2017194360A5 publication Critical patent/JP2017194360A5/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103Atomic absorption analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00Prospecting or detecting by optical means
    • G01V8/10Detecting, e.g. by using light barriers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/68Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/304Accessories, mechanical or electrical features electric circuits, signal processing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/618Specific applications or type of materials food
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/652Specific applications or type of materials impurities, foreign matter, trace amounts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02Food
    • GPHYSICS
    • G16INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16CCOMPUTATIONAL CHEMISTRY; CHEMOINFORMATICS; COMPUTATIONAL MATERIALS SCIENCE
    • G16C20/00Chemoinformatics, i.e. ICT specially adapted for the handling of physicochemical or structural data of chemical particles, elements, compounds or mixtures
    • G16C20/20Identification of molecular entities, parts thereof or of chemical compositions

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2016084964A 2016-04-21 2016-04-21 試料解析システム Active JP6638537B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2016084964A JP6638537B2 (ja) 2016-04-21 2016-04-21 試料解析システム
EP17165987.3A EP3236245B1 (en) 2016-04-21 2017-04-11 Sample-analyzing system
US15/484,529 US10539520B2 (en) 2016-04-21 2017-04-11 Sample-analyzing system
CN201710259756.1A CN107367621A (zh) 2016-04-21 2017-04-19 样品分析系统
CN201910427673.8A CN110244069B (zh) 2016-04-21 2017-04-19 样品分析系统

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016084964A JP6638537B2 (ja) 2016-04-21 2016-04-21 試料解析システム

Publications (3)

Publication Number Publication Date
JP2017194360A JP2017194360A (ja) 2017-10-26
JP2017194360A5 JP2017194360A5 (enExample) 2018-12-13
JP6638537B2 true JP6638537B2 (ja) 2020-01-29

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JP2016084964A Active JP6638537B2 (ja) 2016-04-21 2016-04-21 試料解析システム

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US (1) US10539520B2 (enExample)
EP (1) EP3236245B1 (enExample)
JP (1) JP6638537B2 (enExample)
CN (2) CN107367621A (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6679049B2 (ja) * 2018-09-28 2020-04-15 株式会社リガク 測定装置、プログラム及び測定装置の制御方法
CN109557071B (zh) * 2018-11-14 2021-12-17 公安部第一研究所 一种危险液体混合物的拉曼光谱定性定量识别方法
IT201900004671A1 (it) 2019-03-28 2020-09-28 De Tec Tor S R L Apparato per controllo qualità in linee di produzione, corrispondente procedimento e prodotto informatico
CN110389146B (zh) * 2019-07-26 2021-07-23 新余钢铁股份有限公司 一种x荧光钴内标-icp钴补偿检测铁料中全铁含量的方法
EP4018934B1 (en) * 2019-08-19 2025-02-26 FUJIFILM Corporation Medical assistance device, operation method and operation program for same, and medical assistance system
WO2021058853A1 (en) * 2019-09-27 2021-04-01 Sensmet Oy Optical measurement apparatus and method
CN111487368B (zh) * 2020-04-08 2022-02-11 镇江启迪数字天下科技有限公司 一种挥发性有机物自动检测与分析系统及方法
CN115461624A (zh) 2020-04-30 2022-12-09 株式会社岛津制作所 解析用浏览器、显示系统、显示方法和显示程序
WO2021235090A1 (ja) * 2020-05-22 2021-11-25 株式会社島津製作所 複合計測統合ビューアおよびプログラム
JP7653281B2 (ja) * 2021-03-30 2025-03-28 株式会社堀場テクノサービス 定量分析方法、定量分析システム、及び、定量分析システム用プログラム
JP7724076B2 (ja) * 2021-04-30 2025-08-15 株式会社キーエンス 分析装置
JP7751962B2 (ja) * 2021-04-30 2025-10-09 株式会社キーエンス レーザ誘起ブレークダウン分光装置
DE102021112584B4 (de) * 2021-05-14 2024-11-14 Thomas Fritsch Inspektionsverfahren zur Erfassung von Fremdkörpern und/oder Materialinhomogenitäten
CN117333683A (zh) * 2022-06-22 2024-01-02 At&S奥地利科技及系统技术股份公司 用于识别异物的设备和方法

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5130559A (en) 1989-08-26 1992-07-14 Trutzschler Gmbh & Co. Kg Method and apparatus for recognizing particle impurities in textile fiber
JP2732460B2 (ja) 1993-05-28 1998-03-30 株式会社島津製作所 蛍光x線分析方法
US5428657A (en) * 1994-03-22 1995-06-27 Georgia Tech Research Corporation X-ray monitoring system
JPH08334481A (ja) 1996-07-25 1996-12-17 Shimadzu Corp 蛍光x線分析方法
JP4092037B2 (ja) * 1999-03-05 2008-05-28 株式会社堀場製作所 物質同定装置
JP2001074650A (ja) 1999-09-08 2001-03-23 Shimadzu Corp プラスチック判別法
US20120062873A1 (en) 2001-06-28 2012-03-15 Chemimage Corporation System and method for diagnosing the disease state of breast tissue using swir
WO2006013728A1 (ja) 2004-08-06 2006-02-09 Matsushita Electric Industrial Co., Ltd. 蛍光x線分析方法および蛍光x線分析装置
JP5447279B2 (ja) 2004-09-24 2014-03-19 富士通株式会社 検査方法
JP4794848B2 (ja) 2004-09-24 2011-10-19 富士通株式会社 分析装置
WO2006135806A2 (en) * 2005-06-09 2006-12-21 Chemimage Corporation Forensic integrated search technology
GB0512945D0 (en) 2005-06-24 2005-08-03 Oxford Instr Analytical Ltd Method and apparatus for material identification
JP2007278746A (ja) 2006-04-04 2007-10-25 Epson Imaging Devices Corp 検査装置を用いた検査方法、検査装置が有する制御プログラム、検査装置
JP2010223908A (ja) 2009-03-25 2010-10-07 Shimadzu Corp 蛍光x線分析方法
CN101949824A (zh) * 2009-06-30 2011-01-19 武汉矽感科技有限公司 根据物质的光谱信息对商品进行检测的方法和系统装置
US9518808B2 (en) 2010-02-16 2016-12-13 Research Foundation Of State University Of New York Ammunition and weapon type identification based on spectroscopic gunshot residue analysis
US9086366B2 (en) * 2012-02-15 2015-07-21 L-3 Communications Security And Detection Systems, Inc. Determining a material property based on scattered radiation
US8982338B2 (en) * 2012-05-31 2015-03-17 Thermo Scientific Portable Analytical Instruments Inc. Sample analysis
US9110001B2 (en) * 2012-07-02 2015-08-18 Thermo Scientific Portable Analytical Instruments Inc. Method for tagging reference materials of interest in spectroscopic searching applications
DE112013004743T5 (de) * 2012-09-26 2015-09-24 Panalytical Inc. Multi-Sensoranalyse eines komplexen geologischen Materials
WO2015056305A1 (ja) * 2013-10-15 2015-04-23 株式会社島津製作所 蛍光x線分析方法及び蛍光x線分析装置
WO2015079535A1 (ja) 2013-11-28 2015-06-04 株式会社島津製作所 X線分析装置およびx線分析方法
JP2015153296A (ja) 2014-02-18 2015-08-24 株式会社ブルーム 商品の二次流通市場における商品の買い取り可否判定システム及び同システムに用いる真正度の判定システム
JP6507757B2 (ja) 2015-03-20 2019-05-08 株式会社島津製作所 異物解析装置
WO2016157467A1 (ja) 2015-03-31 2016-10-06 株式会社Ubic データ分析システム、データ分析方法、データ分析プログラム、および、記録媒体
JP6052448B2 (ja) 2016-02-18 2016-12-27 日本電気株式会社 検品処理装置、検品システム、検品処理方法及びプログラム

Also Published As

Publication number Publication date
CN110244069A (zh) 2019-09-17
US20170307551A1 (en) 2017-10-26
EP3236245B1 (en) 2019-07-10
JP2017194360A (ja) 2017-10-26
EP3236245A1 (en) 2017-10-25
CN107367621A (zh) 2017-11-21
CN110244069B (zh) 2023-08-11
US10539520B2 (en) 2020-01-21

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