JP6624482B2 - 超小型加速器および超小型質量分析装置 - Google Patents

超小型加速器および超小型質量分析装置 Download PDF

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JP6624482B2
JP6624482B2 JP2014154005A JP2014154005A JP6624482B2 JP 6624482 B2 JP6624482 B2 JP 6624482B2 JP 2014154005 A JP2014154005 A JP 2014154005A JP 2014154005 A JP2014154005 A JP 2014154005A JP 6624482 B2 JP6624482 B2 JP 6624482B2
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JP2016031849A (ja
JP2016031849A5 (enExample
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俊 保坂
俊 保坂
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Priority to JP2014154005A priority Critical patent/JP6624482B2/ja
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Priority to EP25164289.8A priority patent/EP4554336A2/en
Priority to US15/329,153 priority patent/US10249483B2/en
Priority to PCT/JP2015/071538 priority patent/WO2016017712A1/ja
Priority to EP15827523.0A priority patent/EP3176809B1/en
Priority to CN201580052565.7A priority patent/CN107078020B/zh
Publication of JP2016031849A publication Critical patent/JP2016031849A/ja
Publication of JP2016031849A5 publication Critical patent/JP2016031849A5/ja
Priority to US16/274,773 priority patent/US10804087B2/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
    • H01J49/0018—Microminiaturised spectrometers, e.g. chip-integrated devices, Micro-Electro-Mechanical Systems [MEMS]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/20—Magnetic deflection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/22—Electrostatic deflection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/326—Static spectrometers using double focusing with magnetic and electrostatic sectors of 90 degrees
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/36—Radio frequency spectrometers, e.g. Bennett-type spectrometers, Redhead-type spectrometers
    • H01J49/38—Omegatrons ; using ion cyclotron resonance
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H13/00—Magnetic resonance accelerators; Cyclotrons
    • H05H13/04—Synchrotrons
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H15/00—Methods or devices for acceleration of charged particles not otherwise provided for, e.g. wakefield accelerators
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H5/00—Direct voltage accelerators; Accelerators using single pulses
    • H05H5/02—Details
    • H05H5/03—Accelerating tubes
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H7/00—Details of devices of the types covered by groups H05H9/00, H05H11/00, H05H13/00
    • H05H7/04—Magnet systems, e.g. undulators, wigglers; Energisation thereof
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H7/00—Details of devices of the types covered by groups H05H9/00, H05H11/00, H05H13/00
    • H05H7/22—Details of linear accelerators, e.g. drift tubes
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H9/00—Linear accelerators
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H9/00—Linear accelerators
    • H05H9/02—Travelling-wave linear accelerators

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Particle Accelerators (AREA)
JP2014154005A 2014-07-29 2014-07-29 超小型加速器および超小型質量分析装置 Active JP6624482B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2014154005A JP6624482B2 (ja) 2014-07-29 2014-07-29 超小型加速器および超小型質量分析装置
US15/329,153 US10249483B2 (en) 2014-07-29 2015-07-29 Ultra-compact mass analysis device and ultra-compact particle acceleration device
PCT/JP2015/071538 WO2016017712A1 (ja) 2014-07-29 2015-07-29 超小型質量分析装置および超小型粒子加速装置
EP15827523.0A EP3176809B1 (en) 2014-07-29 2015-07-29 Ultra-compact mass analysis device
EP25164289.8A EP4554336A2 (en) 2014-07-29 2015-07-29 Ultra-compact mass analysis device and ultra-compact particle acceleration device
CN201580052565.7A CN107078020B (zh) 2014-07-29 2015-07-29 超小型质谱分析装置和超小型粒子加速装置
US16/274,773 US10804087B2 (en) 2014-07-29 2019-02-13 Ultra-compact mass analysis device and ultra-compact particle acceleration device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014154005A JP6624482B2 (ja) 2014-07-29 2014-07-29 超小型加速器および超小型質量分析装置

Related Child Applications (1)

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JP2019182184A Division JP7101652B2 (ja) 2019-10-02 2019-10-02 超小型加速器および超小型質量分析装置

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JP2016031849A JP2016031849A (ja) 2016-03-07
JP2016031849A5 JP2016031849A5 (enExample) 2018-07-05
JP6624482B2 true JP6624482B2 (ja) 2019-12-25

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US (2) US10249483B2 (enExample)
EP (2) EP4554336A2 (enExample)
JP (1) JP6624482B2 (enExample)
CN (1) CN107078020B (enExample)
WO (1) WO2016017712A1 (enExample)

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Also Published As

Publication number Publication date
WO2016017712A1 (ja) 2016-02-04
EP3176809A1 (en) 2017-06-07
CN107078020B (zh) 2020-03-10
JP2016031849A (ja) 2016-03-07
EP4554336A2 (en) 2025-05-14
EP3176809B1 (en) 2025-03-19
US20190198306A1 (en) 2019-06-27
US10804087B2 (en) 2020-10-13
US20170330739A1 (en) 2017-11-16
CN107078020A (zh) 2017-08-18
EP3176809A4 (en) 2018-07-04
US10249483B2 (en) 2019-04-02

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