JP6475231B2 - 粒子特性を光学測定するための装置および方法 - Google Patents

粒子特性を光学測定するための装置および方法 Download PDF

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JP6475231B2
JP6475231B2 JP2016516953A JP2016516953A JP6475231B2 JP 6475231 B2 JP6475231 B2 JP 6475231B2 JP 2016516953 A JP2016516953 A JP 2016516953A JP 2016516953 A JP2016516953 A JP 2016516953A JP 6475231 B2 JP6475231 B2 JP 6475231B2
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light
color
polarization
particle
assembly
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JP2016535288A5 (enExample
JP2016535288A (ja
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イー ウェイ
イー ウェイ
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オリンパス・ソフト・イメージング・ソリューションズ・ゲゼルシャフト・ミト・ベシュレンクテル・ハフツング
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0227—Investigating particle size or size distribution by optical means using imaging; using holography
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/1006—Beam splitting or combining systems for splitting or combining different wavelengths
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/288—Filters employing polarising elements, e.g. Lyot or Solc filters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G01N15/1433—Signal processing using image recognition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N2021/217—Measuring depolarisation or comparing polarised and depolarised parts of light

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
JP2016516953A 2013-09-24 2014-09-10 粒子特性を光学測定するための装置および方法 Active JP6475231B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102013219181.2A DE102013219181B4 (de) 2013-09-24 2013-09-24 Vorrichtung und Verfahren zur optischen Bestimmung von Partikeleigenschaften
DE102013219181.2 2013-09-24
PCT/EP2014/002440 WO2015043716A1 (de) 2013-09-24 2014-09-10 Vorrichtung und verfahren zur optischen bestimmung von partikeleigenschaften

Publications (3)

Publication Number Publication Date
JP2016535288A JP2016535288A (ja) 2016-11-10
JP2016535288A5 JP2016535288A5 (enExample) 2017-05-25
JP6475231B2 true JP6475231B2 (ja) 2019-02-27

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JP2016516953A Active JP6475231B2 (ja) 2013-09-24 2014-09-10 粒子特性を光学測定するための装置および方法

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US (1) US9612186B2 (enExample)
JP (1) JP6475231B2 (enExample)
CN (1) CN105579830B (enExample)
DE (1) DE102013219181B4 (enExample)
GB (1) GB2532675B (enExample)
WO (1) WO2015043716A1 (enExample)

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KR101638016B1 (ko) * 2015-05-28 2016-07-08 광주과학기술원 내시경
JP6817083B2 (ja) * 2017-01-19 2021-01-20 オリンパス株式会社 正立顕微鏡
WO2018149889A1 (en) * 2017-02-16 2018-08-23 Koninklijke Philips N.V. Particle characterization apparatus and method
DE102017109252A1 (de) * 2017-04-28 2018-10-31 Leica Microsystems Cms Gmbh Programmierbare Mikroskopsteuerungseinheit mit frei verwendbaren Ein- und Ausgängen, Mikroskopsystem mit einer Mikroskopsteuerungseinheit und Verfahren zum Betrieb einer Mikroskopsteuerungseinheit
NL2019089B1 (en) * 2017-06-17 2018-12-24 Acad Medisch Ct Polarization microscope
CN109387460A (zh) * 2017-08-14 2019-02-26 阅美测量系统（上海）有限公司 一种污染颗粒观察及测试装置及分析方法
CN113508288B (zh) * 2018-09-28 2025-04-18 西门子瑞士有限公司 具有波长选择偏振器的散射光烟雾探测器以及这种偏振器的合适用途
DE102019205654A1 (de) * 2019-04-18 2020-10-22 Krones Ag Durchlichtinspektionsvorrichtung und -verfahren zur Inspektion von Behältern
WO2021039900A1 (ja) * 2019-08-28 2021-03-04 公立大学法人兵庫県立大学 試料測定装置および試料測定方法
DE102020102419A1 (de) * 2020-01-31 2021-08-05 Carl Zeiss Microscopy Gmbh Partikelanalyse mit Lichtmikroskop und Mehrpixelpolarisationsfilter
US11782001B2 (en) 2020-12-04 2023-10-10 Attolight AG Dislocation type and density discrimination in semiconductor materials using cathodoluminescence measurements
TWI808554B (zh) * 2020-12-04 2023-07-11 亞光股份有限公司 使用陰極發光測量判別半導體材料中的位錯類型和密度的裝置與方法
CN115106191A (zh) * 2022-06-30 2022-09-27 扬州纳力新材料科技有限公司 柔性膜材表面金属颗粒的收集设备、收集方法和检测方法
EP4303562A1 (en) * 2022-07-08 2024-01-10 Socar Turkey Arastirma Gelistirme Ve Inovasyon A.S. The method and system of performing shape and size analysis of all solid particles with image processing
CN120525863B (zh) * 2025-07-11 2025-10-17 深圳市天鼎自动化科技有限公司 相机镜头缺陷检测方法、装置、存储介质及产品

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DE3341302C2 (de) * 1983-11-15 1985-09-12 C. Reichert Optische Werke Ag, Wien Optische Anordnung für Mikroskope
GB8330813D0 (en) 1983-11-18 1983-12-29 Smiths Industries Plc Fibre-optic cable assemblies
US4678291A (en) * 1984-12-14 1987-07-07 C. Reichert Optische Werke Ag Optical arrangement for microscopes
FI96058C (fi) 1992-12-07 1996-04-25 Valtion Teknillinen Menetelmä ja laitteisto väliaineessa olevien hiukkasten analysoimiseksi ja väliaineeseen kosketuksissa olevien mekaanisten kontaktien kulumistilanteen jatkuvatoimiseksi määrittämiseksi
JPH09297004A (ja) * 1996-05-01 1997-11-18 Olympus Optical Co Ltd 顕微鏡装置
DE10052384B4 (de) 2000-10-20 2011-02-10 Schwartz, Margit Vorrichtung und Verfahren zur Bestimmung von Partikeleigenschaften und/oder Partikelkonzentrationen in einem fluiden Medium
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Also Published As

Publication number Publication date
US20160202165A1 (en) 2016-07-14
DE102013219181A1 (de) 2015-03-26
JP2016535288A (ja) 2016-11-10
GB2532675B (en) 2018-08-29
CN105579830B (zh) 2018-10-12
DE102013219181B4 (de) 2018-05-09
US9612186B2 (en) 2017-04-04
GB201603617D0 (en) 2016-04-13
CN105579830A (zh) 2016-05-11
WO2015043716A1 (de) 2015-04-02
GB2532675A (en) 2016-05-25

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