GB2532675B - Device and method for optically determining particle properties - Google Patents

Device and method for optically determining particle properties

Info

Publication number
GB2532675B
GB2532675B GB1603617.0A GB201603617A GB2532675B GB 2532675 B GB2532675 B GB 2532675B GB 201603617 A GB201603617 A GB 201603617A GB 2532675 B GB2532675 B GB 2532675B
Authority
GB
United Kingdom
Prior art keywords
particle properties
determining particle
optically determining
optically
properties
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1603617.0A
Other languages
English (en)
Other versions
GB201603617D0 (en
GB2532675A (en
Inventor
Wei Yi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Evident Technology Center Europe GmbH
Original Assignee
Olympus Soft Imaging Solutions GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Soft Imaging Solutions GmbH filed Critical Olympus Soft Imaging Solutions GmbH
Publication of GB201603617D0 publication Critical patent/GB201603617D0/en
Publication of GB2532675A publication Critical patent/GB2532675A/en
Application granted granted Critical
Publication of GB2532675B publication Critical patent/GB2532675B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0227—Investigating particle size or size distribution by optical means using imaging; using holography
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/1006—Beam splitting or combining systems for splitting or combining different wavelengths
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/288—Filters employing polarising elements, e.g. Lyot or Solc filters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G01N15/1433—Signal processing using image recognition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N2021/217—Measuring depolarisation or comparing polarised and depolarised parts of light
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
GB1603617.0A 2013-09-24 2014-09-10 Device and method for optically determining particle properties Active GB2532675B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102013219181.2A DE102013219181B4 (de) 2013-09-24 2013-09-24 Vorrichtung und Verfahren zur optischen Bestimmung von Partikeleigenschaften
PCT/EP2014/002440 WO2015043716A1 (de) 2013-09-24 2014-09-10 Vorrichtung und verfahren zur optischen bestimmung von partikeleigenschaften

Publications (3)

Publication Number Publication Date
GB201603617D0 GB201603617D0 (en) 2016-04-13
GB2532675A GB2532675A (en) 2016-05-25
GB2532675B true GB2532675B (en) 2018-08-29

Family

ID=51518738

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1603617.0A Active GB2532675B (en) 2013-09-24 2014-09-10 Device and method for optically determining particle properties

Country Status (6)

Country Link
US (1) US9612186B2 (enExample)
JP (1) JP6475231B2 (enExample)
CN (1) CN105579830B (enExample)
DE (1) DE102013219181B4 (enExample)
GB (1) GB2532675B (enExample)
WO (1) WO2015043716A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170186262A1 (en) * 2014-02-14 2017-06-29 Rotas Italia SRL Product authentication method
KR101766328B1 (ko) * 2015-05-28 2017-08-08 광주과학기술원 현미경
KR101638016B1 (ko) * 2015-05-28 2016-07-08 광주과학기술원 내시경
JP6817083B2 (ja) * 2017-01-19 2021-01-20 オリンパス株式会社 正立顕微鏡
WO2018149889A1 (en) * 2017-02-16 2018-08-23 Koninklijke Philips N.V. Particle characterization apparatus and method
DE102017109252A1 (de) * 2017-04-28 2018-10-31 Leica Microsystems Cms Gmbh Programmierbare Mikroskopsteuerungseinheit mit frei verwendbaren Ein- und Ausgängen, Mikroskopsystem mit einer Mikroskopsteuerungseinheit und Verfahren zum Betrieb einer Mikroskopsteuerungseinheit
NL2019089B1 (en) * 2017-06-17 2018-12-24 Acad Medisch Ct Polarization microscope
CN109387460A (zh) * 2017-08-14 2019-02-26 阅美测量系统（上海）有限公司 一种污染颗粒观察及测试装置及分析方法
CN113508288B (zh) * 2018-09-28 2025-04-18 西门子瑞士有限公司 具有波长选择偏振器的散射光烟雾探测器以及这种偏振器的合适用途
DE102019205654A1 (de) * 2019-04-18 2020-10-22 Krones Ag Durchlichtinspektionsvorrichtung und -verfahren zur Inspektion von Behältern
WO2021039900A1 (ja) * 2019-08-28 2021-03-04 公立大学法人兵庫県立大学 試料測定装置および試料測定方法
DE102020102419A1 (de) * 2020-01-31 2021-08-05 Carl Zeiss Microscopy Gmbh Partikelanalyse mit Lichtmikroskop und Mehrpixelpolarisationsfilter
US11782001B2 (en) 2020-12-04 2023-10-10 Attolight AG Dislocation type and density discrimination in semiconductor materials using cathodoluminescence measurements
TWI808554B (zh) * 2020-12-04 2023-07-11 亞光股份有限公司 使用陰極發光測量判別半導體材料中的位錯類型和密度的裝置與方法
CN115106191A (zh) * 2022-06-30 2022-09-27 扬州纳力新材料科技有限公司 柔性膜材表面金属颗粒的收集设备、收集方法和检测方法
EP4303562A1 (en) * 2022-07-08 2024-01-10 Socar Turkey Arastirma Gelistirme Ve Inovasyon A.S. The method and system of performing shape and size analysis of all solid particles with image processing
CN120525863B (zh) * 2025-07-11 2025-10-17 深圳市天鼎自动化科技有限公司 相机镜头缺陷检测方法、装置、存储介质及产品

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3341302A1 (de) * 1983-11-15 1985-05-23 C. Reichert Optische Werke Ag, Wien Optische anordnung fuer mikroskope
EP1396739A1 (de) * 2002-09-04 2004-03-10 CARL ZEISS JENA GmbH Verfahren und Anordnung zur einstellbaren Veränderung von Beleuchtungslicht und/oder Probenlicht bezüglich seiner spektralen Zusammensetzung und/oder Intensität
WO2006091221A2 (en) * 2004-06-30 2006-08-31 Chemimage Corporation Spectroscopic methods for component particle analysis
DE102005062439B3 (de) * 2005-12-23 2007-05-10 JOMESA Meßsysteme GmbH Verfahren für die Partikelanalyse und Partikelanalysesystem
EP2562513A1 (en) * 2010-04-01 2013-02-27 Nippon Steel & Sumitomo Metal Corporation Particle measuring system and particle measuring method

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8330813D0 (en) 1983-11-18 1983-12-29 Smiths Industries Plc Fibre-optic cable assemblies
US4678291A (en) * 1984-12-14 1987-07-07 C. Reichert Optische Werke Ag Optical arrangement for microscopes
FI96058C (fi) 1992-12-07 1996-04-25 Valtion Teknillinen Menetelmä ja laitteisto väliaineessa olevien hiukkasten analysoimiseksi ja väliaineeseen kosketuksissa olevien mekaanisten kontaktien kulumistilanteen jatkuvatoimiseksi määrittämiseksi
JPH09297004A (ja) * 1996-05-01 1997-11-18 Olympus Optical Co Ltd 顕微鏡装置
DE10052384B4 (de) 2000-10-20 2011-02-10 Schwartz, Margit Vorrichtung und Verfahren zur Bestimmung von Partikeleigenschaften und/oder Partikelkonzentrationen in einem fluiden Medium
IL145683A0 (en) * 2001-09-26 2002-06-30 Enoron Technologies Ltd Apparatus and method for measuring optically active materials
DE10247247A1 (de) * 2002-10-10 2004-04-22 Leica Microsystems Heidelberg Gmbh Optische Anordnung und Mikroskop
DE102004034961A1 (de) 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
JP5333215B2 (ja) * 2007-05-31 2013-11-06 株式会社ニコン チューナブルフィルタ、光源装置およびスペクトル分布測定装置
DE202007014466U1 (de) 2007-10-16 2008-01-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Klassifizierung transparenter Bestandteile in einem Materialstrom
DE102009014080B4 (de) 2009-03-23 2011-12-15 Baumer Innotec Ag Vorrichtung zum Bestimmen von Partikelgrössen
JP5428509B2 (ja) * 2009-05-11 2014-02-26 ソニー株式会社 ２次元固体撮像装置、及び、２次元固体撮像装置における偏光光データ処理方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3341302A1 (de) * 1983-11-15 1985-05-23 C. Reichert Optische Werke Ag, Wien Optische anordnung fuer mikroskope
EP1396739A1 (de) * 2002-09-04 2004-03-10 CARL ZEISS JENA GmbH Verfahren und Anordnung zur einstellbaren Veränderung von Beleuchtungslicht und/oder Probenlicht bezüglich seiner spektralen Zusammensetzung und/oder Intensität
WO2006091221A2 (en) * 2004-06-30 2006-08-31 Chemimage Corporation Spectroscopic methods for component particle analysis
DE102005062439B3 (de) * 2005-12-23 2007-05-10 JOMESA Meßsysteme GmbH Verfahren für die Partikelanalyse und Partikelanalysesystem
EP2562513A1 (en) * 2010-04-01 2013-02-27 Nippon Steel & Sumitomo Metal Corporation Particle measuring system and particle measuring method

Also Published As

Publication number Publication date
US20160202165A1 (en) 2016-07-14
DE102013219181A1 (de) 2015-03-26
JP2016535288A (ja) 2016-11-10
CN105579830B (zh) 2018-10-12
JP6475231B2 (ja) 2019-02-27
DE102013219181B4 (de) 2018-05-09
US9612186B2 (en) 2017-04-04
GB201603617D0 (en) 2016-04-13
CN105579830A (zh) 2016-05-11
WO2015043716A1 (de) 2015-04-02
GB2532675A (en) 2016-05-25

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