CN105579830B - 用于光学地确定粒子特性的设备和方法 - Google Patents

用于光学地确定粒子特性的设备和方法 Download PDF

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Publication number
CN105579830B
CN105579830B CN201480052233.4A CN201480052233A CN105579830B CN 105579830 B CN105579830 B CN 105579830B CN 201480052233 A CN201480052233 A CN 201480052233A CN 105579830 B CN105579830 B CN 105579830B
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light
polarization
color
polarization direction
particle
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CN105579830A (zh
Inventor
魏熠
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Yijingtong Technology Center Europe Ltd
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Olympus Soft Imaging Solutions GmbH
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0227—Investigating particle size or size distribution by optical means using imaging; using holography
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/1006—Beam splitting or combining systems for splitting or combining different wavelengths
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/288—Filters employing polarising elements, e.g. Lyot or Solc filters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G01N15/1433—Signal processing using image recognition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N2021/217—Measuring depolarisation or comparing polarised and depolarised parts of light
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
CN201480052233.4A 2013-09-24 2014-09-10 用于光学地确定粒子特性的设备和方法 Active CN105579830B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102013219181.2A DE102013219181B4 (de) 2013-09-24 2013-09-24 Vorrichtung und Verfahren zur optischen Bestimmung von Partikeleigenschaften
DE102013219181.2 2013-09-24
PCT/EP2014/002440 WO2015043716A1 (de) 2013-09-24 2014-09-10 Vorrichtung und verfahren zur optischen bestimmung von partikeleigenschaften

Publications (2)

Publication Number Publication Date
CN105579830A CN105579830A (zh) 2016-05-11
CN105579830B true CN105579830B (zh) 2018-10-12

Family

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CN201480052233.4A Active CN105579830B (zh) 2013-09-24 2014-09-10 用于光学地确定粒子特性的设备和方法

Country Status (6)

Country Link
US (1) US9612186B2 (enExample)
JP (1) JP6475231B2 (enExample)
CN (1) CN105579830B (enExample)
DE (1) DE102013219181B4 (enExample)
GB (1) GB2532675B (enExample)
WO (1) WO2015043716A1 (enExample)

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US20170186262A1 (en) * 2014-02-14 2017-06-29 Rotas Italia SRL Product authentication method
KR101766328B1 (ko) * 2015-05-28 2017-08-08 광주과학기술원 현미경
KR101638016B1 (ko) * 2015-05-28 2016-07-08 광주과학기술원 내시경
JP6817083B2 (ja) * 2017-01-19 2021-01-20 オリンパス株式会社 正立顕微鏡
WO2018149889A1 (en) * 2017-02-16 2018-08-23 Koninklijke Philips N.V. Particle characterization apparatus and method
DE102017109252A1 (de) * 2017-04-28 2018-10-31 Leica Microsystems Cms Gmbh Programmierbare Mikroskopsteuerungseinheit mit frei verwendbaren Ein- und Ausgängen, Mikroskopsystem mit einer Mikroskopsteuerungseinheit und Verfahren zum Betrieb einer Mikroskopsteuerungseinheit
NL2019089B1 (en) * 2017-06-17 2018-12-24 Acad Medisch Ct Polarization microscope
CN109387460A (zh) * 2017-08-14 2019-02-26 阅美测量系统（上海）有限公司 一种污染颗粒观察及测试装置及分析方法
CN113508288B (zh) * 2018-09-28 2025-04-18 西门子瑞士有限公司 具有波长选择偏振器的散射光烟雾探测器以及这种偏振器的合适用途
DE102019205654A1 (de) * 2019-04-18 2020-10-22 Krones Ag Durchlichtinspektionsvorrichtung und -verfahren zur Inspektion von Behältern
WO2021039900A1 (ja) * 2019-08-28 2021-03-04 公立大学法人兵庫県立大学 試料測定装置および試料測定方法
DE102020102419A1 (de) * 2020-01-31 2021-08-05 Carl Zeiss Microscopy Gmbh Partikelanalyse mit Lichtmikroskop und Mehrpixelpolarisationsfilter
US11782001B2 (en) 2020-12-04 2023-10-10 Attolight AG Dislocation type and density discrimination in semiconductor materials using cathodoluminescence measurements
TWI808554B (zh) * 2020-12-04 2023-07-11 亞光股份有限公司 使用陰極發光測量判別半導體材料中的位錯類型和密度的裝置與方法
CN115106191A (zh) * 2022-06-30 2022-09-27 扬州纳力新材料科技有限公司 柔性膜材表面金属颗粒的收集设备、收集方法和检测方法
EP4303562A1 (en) * 2022-07-08 2024-01-10 Socar Turkey Arastirma Gelistirme Ve Inovasyon A.S. The method and system of performing shape and size analysis of all solid particles with image processing
CN120525863B (zh) * 2025-07-11 2025-10-17 深圳市天鼎自动化科技有限公司 相机镜头缺陷检测方法、装置、存储介质及产品

Citations (2)

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US4678291A (en) * 1984-12-14 1987-07-07 C. Reichert Optische Werke Ag Optical arrangement for microscopes
CN102834689A (zh) * 2010-04-01 2012-12-19 新日本制铁株式会社 粒子测定装置以及粒子测定方法

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DE3341302C2 (de) * 1983-11-15 1985-09-12 C. Reichert Optische Werke Ag, Wien Optische Anordnung für Mikroskope
GB8330813D0 (en) 1983-11-18 1983-12-29 Smiths Industries Plc Fibre-optic cable assemblies
FI96058C (fi) 1992-12-07 1996-04-25 Valtion Teknillinen Menetelmä ja laitteisto väliaineessa olevien hiukkasten analysoimiseksi ja väliaineeseen kosketuksissa olevien mekaanisten kontaktien kulumistilanteen jatkuvatoimiseksi määrittämiseksi
JPH09297004A (ja) * 1996-05-01 1997-11-18 Olympus Optical Co Ltd 顕微鏡装置
DE10052384B4 (de) 2000-10-20 2011-02-10 Schwartz, Margit Vorrichtung und Verfahren zur Bestimmung von Partikeleigenschaften und/oder Partikelkonzentrationen in einem fluiden Medium
IL145683A0 (en) * 2001-09-26 2002-06-30 Enoron Technologies Ltd Apparatus and method for measuring optically active materials
DE10241472B4 (de) 2002-09-04 2019-04-11 Carl Zeiss Microscopy Gmbh Verfahren und Anordnung zur einstellbaren Veränderung von Beleuchtungslicht und/oder Probenlicht bezüglich seiner spektralen Zusammensetzung und/oder Intensität
DE10247247A1 (de) * 2002-10-10 2004-04-22 Leica Microsystems Heidelberg Gmbh Optische Anordnung und Mikroskop
WO2006091221A2 (en) * 2004-06-30 2006-08-31 Chemimage Corporation Spectroscopic methods for component particle analysis
DE102004034961A1 (de) 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
DE102005062439B3 (de) 2005-12-23 2007-05-10 JOMESA Meßsysteme GmbH Verfahren für die Partikelanalyse und Partikelanalysesystem
JP5333215B2 (ja) * 2007-05-31 2013-11-06 株式会社ニコン チューナブルフィルタ、光源装置およびスペクトル分布測定装置
DE202007014466U1 (de) 2007-10-16 2008-01-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Klassifizierung transparenter Bestandteile in einem Materialstrom
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JP5428509B2 (ja) * 2009-05-11 2014-02-26 ソニー株式会社 ２次元固体撮像装置、及び、２次元固体撮像装置における偏光光データ処理方法

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Publication number Priority date Publication date Assignee Title
US4678291A (en) * 1984-12-14 1987-07-07 C. Reichert Optische Werke Ag Optical arrangement for microscopes
CN102834689A (zh) * 2010-04-01 2012-12-19 新日本制铁株式会社 粒子测定装置以及粒子测定方法

Also Published As

Publication number Publication date
US20160202165A1 (en) 2016-07-14
DE102013219181A1 (de) 2015-03-26
JP2016535288A (ja) 2016-11-10
GB2532675B (en) 2018-08-29
JP6475231B2 (ja) 2019-02-27
DE102013219181B4 (de) 2018-05-09
US9612186B2 (en) 2017-04-04
GB201603617D0 (en) 2016-04-13
CN105579830A (zh) 2016-05-11
WO2015043716A1 (de) 2015-04-02
GB2532675A (en) 2016-05-25

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Address after: Muenster, Germany

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Address before: Muenster, Germany

Patentee before: OLYMPUS SOFT IMAGING SOLUTIONS GmbH

Country or region before: Germany

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