NL2019089B1 - Polarization microscope - Google Patents

Polarization microscope Download PDF

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Publication number
NL2019089B1
NL2019089B1 NL2019089A NL2019089A NL2019089B1 NL 2019089 B1 NL2019089 B1 NL 2019089B1 NL 2019089 A NL2019089 A NL 2019089A NL 2019089 A NL2019089 A NL 2019089A NL 2019089 B1 NL2019089 B1 NL 2019089B1
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Netherlands
Prior art keywords
light
polarizer
linear polarizer
sample
illumination device
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NL2019089A
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Dutch (nl)
Inventor
Walter Ted Ken Chin Kenneth
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Acad Medisch Ct
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Priority to NL2019089A priority Critical patent/NL2019089B1/en
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes

Abstract

The invention relates to a microscope 1, suitable for inspecting an object, comprising an illumination device 2, a first linear polarizer 3, a second linear polarizer 4, a viewing arrangement 5 and an inspection area 6, a first optical path 7 extending between the first illumination device 2 and the inspection area 6, 5 and a second optical path 8 extending between the inspection area 6 and the viewing arrangement 5, wherein said linear polarizer 3 is positioned in the first optical path 7 and said second linear polarizer 4 is positioned in the second optical path 8, wherein said first linear polarizer 3 has a first transmission axis 6… and said second linear polarizer 4 has a second transmission axis G…, 10 wherein said first transmission axis €… and/or said second transmission axis 6… is adjustable towards the inspection area 6. An advantage of the adjustability of one or both of the transmission axes is that thereby the contrast of light with different polarization angles.

Description

FIELD OF THE INVENTION
The present invention relates to a microscope using polarized light suitable for viewing large samples. In particular it relates to a microscope comprising adjustable polarizers.
BACKGROUND OF THE INVENTION
Polarized light microscopy includes any optical microscopy technique involving polarized light. Simple techniques include illumination of the sample with polarized light. Directly transmitted light can, optionally, be blocked with a polarizer orientated at 90 degrees to the illumination. Cross-polarized light illumination, sample contrast comes from rotation of polarized light through the sample. Conventional polarization microscopes have a small region of interest and are therefore used to view small samples at close range (millimeters), which have to be rotated to observe their optical behavior.
SUMMARY OF THE INVENTION
In view of the foregoing, the invention provides a microscopic device that is suitable to observe samples at the region of interest at approximately 20 cm. Using the microscope of the invention, it is not required to rotate the sample, instead the polarizers can be rotated. The microscope of the invention is optimized to view tissues of an animal or human during surgery.
The invention provides a microscope 1, suitable for inspecting an object, comprising an illumination device 2, a first linear polarizer 3, a second linear polarizer 4, a viewing arrangement 5 and an inspection area 6, a first optical path 7 extending between the first illumination device 2 and the inspection area 6, and a second optical path 8 extending between the inspection area 6 and the viewing arrangement 5, wherein said linear polarizer 3 is positioned in the first optical path 7 and said second linear polarizer 4 is positioned in the second optical path 8, wherein said first linear polarizer 3 has a first transmission axis θΤΑ1 and said second linear polarizer 4 has a second transmission axis ΘΤΑ2, wherein said first transmission axis 0TA1 and/or said second transmission axis 0TA2 is adjustable relative to the inspection area 6. An advantage of the adjustability of one or both of the transmission axes is that thereby the contrast of light with different polarization angles increases.
Preferably, said microscope comprises a collimator 9 positioned in said first light path 7, wherein said collimator 9 is configured to produce collimating light from said illumination device 2 to pass through said first linear polarizer 3. An advantage thereof is that this results in better contrast of the image. As the incident collimated polarized light generates a collimated polarized reflection, resulting in a higher intensity of the reflection, which can then be observed from a longer working distance.
Preferably, the microscope comprises a lens or lens assembly 10 positioned in the second optical path 8. The advantage thereof is that an image of the sample can be formed in the viewing arrangement 5.
In a preferred embodiment, said microscope comprises a disk 19 containing a central part which is partly or completely covered by said second linear polarizer 4 and a peripheral part, partly or fully covered by said first linear polarizer 3. An advantage thereof is that this allows the adjustment of the transmission axes of said first and said second linear polarizer in unison.
In another preferred embodiment, said microscope comprises a beam splitter 11, wherein the microscope is configured such that the beam splitter 11, the first linear polarizer 3, and said illumination device 2 are rotatable in a plane around an axis coinciding with said second optical path 8. An advantage thereof is that the polarization angle of the light illuminating a sample can be adjusted without moving the sample. Preferably, said second polarizer 4 is rotatable in unison with the beam splitter 11, the first linear polarizer 3, and said illumination device 2. Preferably said first and said second polarizer are in a crossed position.
In a preferred embodiment of the microscope of the invention, said microscope comprises further an illumination device 12 provided with a UV or blue light source which is configured to illuminate the inspection area 6. An advantage thereof is that UV or blue light causes fluorescence in collagen, which enhances contrast with other tissues such as tendons and nerves.
Preferably, said further illumination device 12 is configured to illuminate the inspection area 6 with unpolarized light.
In a preferred embodiment, the difference between said first transmission axis θΤΑ1 and said second transmission axis θΤΑ2 varies between 80 and 100 degrees and is preferably around 90 degrees. An advantage thereof is that a linear polarizer blocks light most in cross position. Therefore, it provides optimal contrast between background and signal from sample structures which induce polarization of light.
Preferably, said microscope comprises an illumination device 2 with a white light emitting diode (LED) or a monochromatic light source.
In another preferred embodiment, said viewing arrangement 5 comprises an eyepiece lens 13.
In another preferred embodiment, said viewing arrangement 5 comprises an image capturing device 14.
In an embodiment, said microscope comprises a sample inspection surface, a stage or a sample holder 15. In a preferred embodiment, the sample inspection area is on an operating table.
In an embodiment, the microscope comprises one or more of the following; a housing 18, at least one convex lens or lens assembly 10, a tube 16, and a focusing means 17.
Preferably, said convex lens or lens assembly 10 has a suitable focal length which allows a minimal distance between a sample to be viewed and the convex lens 10 of at least 5 cm, 6, 7, 8, 9 or 10 cm. The advantage thereof is that a larger sample area can be viewed
BRIEF DESCRIPTION OF THE DRAWINGS
The invention will become more fully understood from the detailed description and accompanying drawings, which are given for illustration only, and thus are not limitative of the present invention, and wherein:
FIG. 1 shows linear polarizer 3 and 4 whose transmission angles make an angle Θ with each other.
FIG. 2 shows an unpolarized beam of light from illumination device 2 following the first optical path 7, passing a rotatable first linear polarizer 3 having a polarization angle in the y direction and hitting the sample inspection area 6. After hitting the sample inspection area, the light beam follows the second optical path 8, thereby passing a rotatable second linear polarizer 4 having a polarization angle in the x direction and passing a lens 10 to reach the viewing arrangement 5. The difference between said first transmission axis θΤΑι and said second transmission axis θΤΑ2 is 90 degrees.
FIG. 3 shows an unpolarized beam of light from illumination device 2 following the first optical path 7, passing a rotatable first linear polarizer 3 having a polarization angle in the y direction and hitting the sample inspection area 6. After hitting the sample inspection area, the light beam follows the second optical path 8, which is at an angle to the sample inspection area 6, thereby passing a rotatable second linear polarizer 4 having a polarization angle in the x direction and passing a lens 10 to reach the viewing arrangement 5. The difference between said first transmission axis θΤΑι and said second transmission axis ΘΤΑ2 is 90 degrees.
FIG. 4 is a photograph of an embodiment of the microscope according to the invention. The microscope 1 includes a housing 18, a convex lens 10, an illumination device 2 with an optional collimator 9, wherein said illumination device 2 attached to said housing using a mounting means, a first linear polarizer 3 and a second linear polarizer 4 and an image capturing device 14 and eye piece 13. The microscope 1 further comprises a stage 15 and a tube 16.
FIG. 5 is a schematic diagram showing a microscope according to an embodiment of the invention, and FIG. 6 is a schematic diagram a microscope as shown in Fig. 5 seen from a higher perspective, showing a first 3 and second linear polarizer 4 configured in a disk 19. Referring to FIGS. 5 and 6, the microscope 1 includes an optional convex lens or an assembly of lenses 10, an illumination device 2, configured with a collimator 9, a first linear polarizer 3 and a second linear polarizer 4 and an image capturing device 14. The illumination device 2 comprises a light source and is preferably located lateral of the image capturing device 14 and/or ocular 13 and the convex lens 10. Light emitted from the light source in the illumination device 2 passes through the collimator lens 9 and subsequently passes through said first linear polarizer 3, whereby the lights becomes collimated polarized light and then reaches the sample. Collimated polarized light then leaves the sample and passes through a second linear polarizer 4, passes through the lens assembly 10 and reaches the viewing arrangement 5. Said first and said second linear polarizers 3 and 4 can be rotated in unison as the polarizers are connected to each other in a disk 19. In a preferred embodiment said disk 19 is between 7 and 15 cm in diameter, preferably about 12 cm. Preferably, said disk 19 comprises cross polarizers which block the most light between 380-780 nm, more preferably between 550 - 700 nm.
Figure 7 is a schematic diagram a microscope according to another embodiment of the invention, wherein a rotating beam splitter with cross polarizers with illumination which rotates simultaneously with the beam splitter in a horizontal plane.
Figure 8 is a schematic diagram a microscope according to another embodiment of the invention, wherein the illumination and polarizers all rotate in the same horizontal plane, simultaneously.
Figure 9 is a schematic diagram the microscope as shown in Fig. 8 from a higher perspective.
DETAILED DESCRIPTION OF THE INVENTION
Definitions
The term inspection area as used herein refers to an area wherein a sample can be viewed. It is not required that it is located within the perimeter of the microscope. For instance, microscopes used in surgical operations typically have an inspection area which is below the microscope to enable inspection of a patient. Other microscopes of the invention comprise an inspection area which is located in an area defined by a dedicated sample area of said microscope, such as a stage or a sample holder 15.
The term optical path is used herein to indicate the path a beam of light takes along an optical axis in the microscope. As defined herein, the direction of an optical path is in the z direction. An optical path in a microscope is usually not in a straight line, for instance due to reflection. In such cases, as defined herein, the z direction follows the optical path. The x and y axes remain unchanged when the optical path 7 and 8 are in a straight line. The direction of the x and y axes therefore are considered herein as if the z axis is straight as in figure 2.
Light in which the electric field vector E oscillates in any one fixed plane is said to be plane polarized or linearly polarized. As used herein, the term polarization angle of linearly polarized light refers to the angle between the tangential plane in which the electric field of a light ray oscillates and a plane in the x-y direction. The x direction is herein defined as the horizontal line parallel to the viewing arrangement
5.
The term transmission axis as used herein refers to the angle in the tangential plane, said plane through which the electrical field of polarized light is passed through with least loss of intensity.

Claims (12)

EmbodimentsEmbodiments The present invention will be apparent from the following detailed description, which proceeds with reference to the accompanying drawings, wherein the same references relate to the same elements.The present invention will be apparent from the following detailed description, which proceeds with reference to the accompanying drawings, with the same references relate to the same elements. The microscope of the invention may be any light microscope which is suitable for polarization microscopy. An important aspect on which the invention is based is the presence of two linear polarizers in a first and a second optical path of the microscope.The microscope of the invention may be any light microscope which is suitable for polarization microscopy. An important aspect on which the invention is based is the presence of two linear polarizers in a first and a second optical path of the microscope. The positions of the linear polarizers in the first and second optical paths are illustrated in Figure 2. Herein, both optical paths 7 and 8 follow a light beam depicted by a dashed line, running in the z direction. The first optical path 7 is defined as running from the illumination device 2 to the sample inspection area 6. The second optical path 8 runs from the sample inspection area 6, to said viewing arrangement 5.The positions of the linear polarizers in the first and second optical paths are illustrated in Figure 2. Here, both optical paths 7 and 8 follow a light beam depicted by a dashed line, running in the z direction. The first optical path 7 is defined as running from the illumination device 2 to the sample inspection area 6. The second optical path 8 runs from the sample inspection area 6, to said viewing arrangement 5. A first linear polarizer 3 is positioned in said first optical path 7. Said first linear polarizer 3 has a transmission axis 6TAi and allows passing through light having polarization angle θι. The transmission axis ΘΤΑ1 and polarization angle θι are schematically indicated in figure 2 with an arrow. In the example of figure 2, the transmission angle is vertically orientated (thus in y direction of the illustration, 90 degrees from x), but it may be in any orientation. An unpolarized light beam from illumination device 2, after passing said first linear polarizer 3, will become linearly polarized at the same angle as the transmission axis 0TA1. A second linear polarizer 4 is positioned in said second optical path 8. By adjusting the difference in transmission angle between 0TAiand 0TA2, the amount of light having polarization angle θ! can be adjusted.A first linear polarizer 3 is positioned in said first optical path 7. Said first linear polarizer 3 has a transmission axis 6 TAi and allows passing through light having polarization angle θι. The transmission axis Τ ΤΑ1 and polarization angle θι are schematically indicated in figure 2 with an arrow. In the example of figure 2, the transmission angle is vertically oriented (thus in y direction of the illustration, 90 degrees from x), but it may be in any orientation. An unpolarized light beam from illumination device 2, after passing said first linear polarizer 3, will become linearly polarized at the same angle as the transmission axis 0 TA1 . A second linear polarizer 4 is positioned in said second optical path 8. By adjusting the difference in transmission angle between 0 TAi and 0 TA 2, the amount of light having polarization angle θ! can be adjusted. Figure 1 shows how this works. Suppose the second linear polarizer 4, whose transmission axis makes an angle θ with that of the first linear polarizer 3. The E vector of the light between the two polarizers 3 andFigure 1 shows how this works. Suppose the second linear polarizer 4, whose transmission axis makes an angle with that of the first linear polarizer 3. The E vector of the light between the two polarizers 3 and 5 4 can be resolved into two components, one parallel and one perpendicular to the transmission axis of the second linear polarizer. If we call the direction of transmission of the second linear polarizer y',5 4 can be resolved into two components, one parallel and one perpendicular to the transmission axis or the second linear polarizer. If we call the direction of transmission or the second linear polarizer y ', E.r< = E stuff and E„. = EcosffE. r <= E stuff and E „. = Ecosff Only the second, / component is transmitted by the second linear polarizer 4. The intensity of light is proportional to the square of the electric field amplitude. Thus the intensity transmitted by both linear 10 polarizers 3 and 4 can be expressed as:Only the second, / component is transmitted by the second linear polarizer 4. The intensity of light is proportional to the square of the electric field amplitude. Thus the intensity transmitted by both linear 10 polarizers 3 and 4 can be expressed as: I (ff) = Ep = E2 ΘI (ff) = Ep = E 2 Θ If Λ, = E~2 js ι-^θ intensity between the two polarizers 3 and 4, the intensity transmitted by both of them would be:If Λ, ~ E = 2 j θ ^ s ι- intensity between the two polarizers 3 and 4, the intensity Transmitted by both of them would be: ƒ ($ ϊ = eos“ dƒ ($ ϊ = eos “d 15 This equation applies to any two polarizing elements whose transmission axes make an angle θ with each other. When the two linear polarizers 3 and 4 are placed in succession in a beam of light as described here, the transmission is zero when the transmission axes 0TA1and 0TA2are crossed.15 This equation applies to any two polarizing elements whose transmission axes make an angle with each other. When the two linear polarizers 3 and 4 are placed in succession in a beam of light as described here, the transmission is zero when the transmission axes 0 TA1 and 0 TA2 are crossed. Said first optical path 7 and said second optical path 8 can be in any orientation towards each other. In figure 2, they are in each other's extension, and in figure 3 they are at an angle a.Said first optical path 7 and said second optical path 8 can be in any orientation towards each other. In figure 2, they are in each other's extension, and in figure 3 they are at an angle. 20 It is essential that said first transmission axis θΤΑ1 and/or said second transmission axis 0TA2 can be adjusted with respect to said inspection area 6 and do/does not require rotation of a sample present in said inspection area 6. This may be effectuated by various means. For instance, one or both of the linear polarizers 3 and 4 can be provided with rotation means. As shown in figure 2, the first linear polarizer 3 is rotatable, thereby adjusting the first transmission axis ΘΤΑ1 vis-a-vis the sample inspection area 6. In20 It is essential that said first transmission axis Τ ΤΑ1 and / or said second transmission axis 0 TA2 can be adjusted with respect to said inspection area 6 and do / does not require rotation of a sample present in said inspection area 6. This may be effectuated by various means. For instance, one or both of the linear polarizers 3 and 4 can be provided with rotation means. As shown in figure 2, the first linear polarizer 3 is rotatable, continuously adjusting the first transmission axis Τ ΤΑ1 vis-a-vis the sample inspection area 6. In 25 the embodiment shown in figure 5 and 6, both linear polarizers 3 and 4 are positioned in a rotatable disk 19. By rotating this disk 19, the first transmission axis 6TA1and said second transmission axis θτΑ2 are adjusted in unison.25 the embodiment shown in figures 5 and 6, both linear polarizers 3 and 4 are positioned in a rotatable disk 19. By rotating this disk 19, the first transmission axis 6 TA1 and said second transmission axis θτ Α 2 are adjusted in unison. In another embodiment, said first transmission axis ΘΤΑ1 can be adjusted using a rotatable beam splitter. Said microscope comprises an assembly (indicated in figure 7 with a dashed box) comprising a beam splitter 11, said first polarizer 3, and illumination device 2, wherein said assembly is rotatably mounted around said second optical axis 8. Said assembly may be connected with each other by a rotatable mounting means. By rotating said mounting means, the polarization angle of said first polarizer 3 towards said sample inspection area 6 can be adjusted.In another embodiment, the aforementioned Said first transmission axis Θ ΤΑ1 can be adjusted using a Rotatable beam splitter. Said microscope comprising an assembly (indicated in figure 7 with a dashed box) including a beam splitter 11, said first polarizer 3, and illumination device 2, said assembly is rotatably mounted around said second optical axis 8. Said assembly may be connected with each other by a rotatable mounting means. By rotating said mounting means, the polarization angle or said first polarizer 3 towards said sample inspection area 6 can be adjusted. In another embodiment, as illustrated in figures 8 and 9, said first transmission axis θΤΑι can be adjusted using a rotatable illumination device. Said microscope 1 comprises an assembly comprising the first linear polarizer 3 and the illumination device 2, which are rotatable in unison around an axis which runs in parallel to the second optical path 8. Said assembly may be connected with each other by a rotatable mounting means. By rotating said mounting means, the polarization angle of said first polarizer 3 towards said sample inspection area 6 can be adjusted.In another embodiment, as illustrated in figures 8 and 9, said first transmission axis adjusted ΤΑ ι can be adjusted using a rotatable illumination device. Said microscope 1 comprises an assembly including the first linear polarizer 3 and the illumination device 2, which are rotatable in unison around an axis which runs in parallel to the second optical path 8. Said assembly may be connected with each other by a rotatable mounting means . By rotating said mounting means, the polarization angle or said first polarizer 3 towards said sample inspection area 6 can be adjusted. By adjustment of the transmission axis of said second linear polarizer 4, any light which has undergone polarization change due to polarization characteristics of a molecule in the sample can be allowed to pass said second linear polarizer 4, while reducing or blocking any light which has a different polarization angle. In a preferred embodiment, the transmission axis θΤΑ2 can be adjusted to allow any light polarized by the sample to pass through said second linear polarizer 4, while blocking or partly blocking light having polarization angle θι which hits the sample and is reflected without changing its polarization angle.By adjustment of the transmission axis or said second linear polarizer 4, any light which has undergone polarization change due to polarization characteristics of a molecule in the sample can be allowed to pass said second linear polarizer 4, while reducing or blocking any light which has a different polarization angle. In a preferred embodiment, the transmission axis 2 AR2 can be adjusted to allow any light polarized by the said second linear polarizer 4, while blocking or partly blocking light having polarization angle hitsι which hits the sample and is reflected without changing its polarization angle. In another preferred embodiment, the microscope comprises a further light source 12 in the blue spectrum to observe fluorescent behavior of collagen (connective tissue), which is advantageous in a further method to distinguish nerves from collagen.In another preferred embodiment, the microscope comprises a further light source 12 in the blue spectrum to observe fluorescent behavior or collages (connective tissue), which is advantageous in a further method of distinguishing nerves from collages. The further illumination device 12 is preferably mounted independently from the other light sources. The light from this source does not pass the first linear polarizer 3 or said second linear polarizer 4, and is capable of directly illuminating a sample on the sample inspecting area 6. It is preferred that said further illumination device 12 is disposed of an adjusting means to adjust the illumination angle towards the sample.The further illumination device 12 is preferably mounted independently from the other light sources. The light from this source does not pass the first linear polarizer 3 or said second linear polarizer 4, and is capable of directly illuminating a sample at the sample inspecting area 6. It is preferred that said further illumination device 12 is delivered or an adjusting means to adjust the illumination angle towards the sample. In a preferred embodiment, the illumination device 2 comprises a static white light emitting diode (LEDs). The intensity of the light source 2 can preferably be adjusted by a light adjustment means.In a preferred embodiment, the illumination device 2 comprises a static white light emitting diode (LEDs). The intensity of the light source 2 can preferably be adjusted by a light adjustment means. In a preferred embodiment, the angle of light source 12 is configurable, to provide a variable angle of the illumination with respect to a sample.In a preferred embodiment, the angle of light source 12 is configurable, to provide a variable angle or the illumination with respect to a sample. In a preferred embodiment, the center of said disc 19 is about 5 cm in diameter and contains the second linear polarizer 4. The outer rim, preferably about 3.5 cm in width of the same disk 19 is covered with the first linear polarizer 3. An advantage thereof is that the outer rim is broad enough to polarize most light from light source 2. The center of the disk 19 is located in the second optical path 8.In a preferred embodiment, the center of said disc 19 is about 5 cm in diameter and contains the second linear polarizer 4. The outer rim, preferably about 3.5 cm in width of the same disk 19 is covered with the first linear polarizer 3. An advantage is that the outer rim is broad enough to polarize most light from light source 2. The center of the disk 19 is located in the second optical path 8. In a preferred embodiment, the microscope is configured such that the emitted, and preferably collimated light from light source 2 only passes the first polarizer 3 on the outer rim of the disk 19 directly upon the sample inspection area 6, whereas the second polarizer 4 only passes the (preferably collimated) polarized reflected light from a sample in the sample inspection area 6.In a preferred embodiment, the microscope is configured such that the emitted, and preferably collimated light from light source 2 only passes the first polarizer 3 on the outer rim of the disk 19 directly upon the sample inspection area 6, whereas the second polarizer 4 only passes the (preferably collimated) polarized reflected light from a sample in the sample inspection area 6. In figure 7, another embodiment of the microscope of the invention is shown. The microscope 1 includes a lens assembly 10, an illumination device 2, a first linear polarizer 3 and a second linear polarizer 4, a beam splitter 11 and an image capturing device 14, viewing arrangement 5 or eyepiece 13.In figure 7, another embodiment of the microscope of the invention is shown. The microscope 1 includes a lens assembly 10, an illumination device 2, a first linear polarizer 3 and a second linear polarizer 4, a beam splitter 11 and an image capturing device 14, viewing arrangement 5 or eyepiece 13. As illustrated in figure 7, the microscope according to this embodiment comprises an assembly (indicated in figure 7 with a dashed box) comprising a beam splitter 11, said first polarizer 3, and illumination device 2 connected with each other by a rotatable mounting means. By rotating said assemby, the polarization angle of said first polarizer 3 in relation to the sample inspection area 6 can be adjusted. The first linear polarizer 3 is located in the first optical path 7 of the light. The light passing through the first linear polarizer 3 is reflected via the beam splitter 11 to the sample inspection area 6. The polarized light is then reflected through the beam splitter 11, passing the second linear polarizer 4 leading to the, viewing arrangement 5, which may for example be an image capturing device 14 or eyepiece 13. Preferably, said first polarizer 3 is configured such that is can be rotated vis a vis said beam splitter 11. Said second polarizer 4 is configured so that it can be rotated vis a vis the sample inspection area 6 and independently of said assembly comprising said first linear polarizer 3, illumination device 2 and optional collimator 9 and said beam splitter 11. In another embodiment, said second polarizer 4 is fixed to said ensemble comprising said first linear polarizer 3, illumination device 2, said optional collimator 9 and said beam splitter 11.As illustrated in figure 7, the microscope according to this embodiment comprises an assembly (indicated in figure 7 with a dashed box) including a beam splitter 11, said first polarizer 3, and illumination device 2 connected with each other by a rotatable mounting means. By rotating said assembly, the polarization angle or said first polarizer 3 in relation to the sample inspection area 6 can be adjusted. The first linear polarizer 3 is located in the first optical path 7 of the light. The light passing through the first linear polarizer 3 is reflected through the beam splitter 11 to the sample inspection area 6. The polarized light is then reflected through the beam splitter 11, passing the second linear polarizer 4 leading to the, viewing arrangement 5, which may or example be an image capturing device 14 or eyepiece 13. Preferably, said first polarizer 3 is configured such that is can be rotated fish a beam said beam splitter 11. Said second polarizer 4 is configured so that it can be rotated fish a fish the sample inspection area 6 and independently or said assembly including said first linear polarizer 3, illumination device 2 and optional collimator 9 and said beam splitter 11. In another embodiment, said second polarizer 4 is fixed to said ensemble including said first linear polarizer 3, illumination device 2, said optional collimator 9 and said beam splitter 11. In a preferred embodiment, a further illumination device 12 is mounted separately from the other light sources. The UV or blue light can directly illuminate the sample inspection area 6. When a biological sample is placed, the UV or blue light will allow some tissues to fluoresce, for example connective tissue. In contrast to the light from light source of illumination device 2, the fluorescent light generated by the sample will then pass through the center polarizer 4 and may be detected in the image capturing 5 or projected to the eye via an ocular 13.In a preferred embodiment, a further illumination device 12 is mounted separately from the other light sources. The UV or blue light can directly illuminate the sample inspection area 6. When a biological sample is placed, the UV or blue light will allow some tissues to fluoresce, for example connective tissue. In contrast to the light from light source or illumination device 2, the fluorescent light generated by the sample will then pass through the center polarizer 4 and may be detected in the image capturing 5 or projected to the eye via an ocular 13. Figure 8 shows another preferred embodiment of the microscope of the invention. This embodiment comprises the first linear polarizer 3 connected to illumination device 2 and optionally a collimator 9. The collimated polarized light directly illuminates the sample. Said first linear polarizer 3, illumination device 2 and optional collimator 9 are connected via a mounting means, to ensure that they can be rotated in unison with respect to the sample.Figure 8 shows another preferred embodiment of the microscope of the invention. This embodiment comprises the first linear polarizer 3 connected to illumination device 2 and optionally a collimator 9. The collimated polarized light directly illuminates the sample. Said first linear polarizer 3, illumination device 2 and optional collimator 9 are connected via a mounting means, to ensure that they can be rotated in unison with respect to the sample. Figures 8 and 9 show another preferred embodiment of the microscope of the invention. Herein, said first polarizer 3 and the illumination device 2, the second polarizer 4 and optionally said collimator 9 are connected and attached to a mounting means which can be moved in a circular motion (indicated in Fig. 9 in gray) around optical path 8. This circular motion changes the polarization angle of said first polarizer 3 vis a vis the sample inspection area 6. In a preferred embodiment, said first polarizer 3 is rotatably mounted in said mounting means. This allows further adjustment of the polarization angle towards the sample. Preferably, said second polarizer 4 is rotatably mounted in the housing 18 to allow adjustment of the polarization angle towards the sample.Figures 8 and 9 show another preferred embodiment of the microscope of the invention. Herein, said first polarizer 3 and the illumination device 2, the second polarizer 4 and optionally said collimator 9 are connected and attached to a mounting means which can be moved in a circular motion (indicated in Fig. 9 in gray) around optical path 8 This circular motion changes the polarization angle of said first polarizer 3 vis a vis the sample inspection area 6. In a preferred embodiment, said first polarizer 3 is rotatably mounted in said mounting means. This allows further adjustment of the polarization angle towards the sample. Preferably, said second polarizer 4 is rotatably mounted in the housing 18 to allow adjustment of the polarization angle towards the sample. As shown in FIG. 4-9, the microscope 1 comprises a illumination device 2, suitable for illuminating a sample. Said illumination device 2 may comprise any light source which is suitable for producing visible light and may include a ring light, a LED, a halogen light, or a tungsten light. As illustrated in figures 4-9, the microscope may comprise a further illumination device 12 comprising light source in the ultraviolet (UV) spectrum (e.g. a 'black light') to observe fluorescent behavior of collagen (connective tissue) as a secondary method to distinguish nerves from collagen.As shown in FIG. 4-9, the microscope 1 comprises an illumination device 2, suitable for illuminating a sample. Said illumination device 2 may contain any light source which is suitable for producing visible light and may include a ring light, a LED, a halogen light, or a tungsten light. As illustrated in figures 4-9, the microscope may include a further illumination device 12 including light source in the ultraviolet (UV) spectrum (eg a 'black light') to observe fluorescent behavior or collages (connective tissue) as a secondary method to distinguish nerves from collages. Although the invention has been described with reference to specific embodiments, this description is not meant to be construed in a limiting sense. Various modifications of the disclosed embodiments, as well as alternative embodiments, will be apparent to persons skilled in the art.Although the invention has been described with reference to specific, this description is not meant to be constructed in a limiting sense. Various modifications of the disclosed expat, as well as alternative expat, will be apparent to persons skilled in the art. CONCLUSIESCONCLUSIONS 1. Microscoop (1) geschikt om een preparaat te inspecteren, omvattende een belichtings apparaat (2), een eerste lineaire polarisator (3), een tweede lineaire polarisator (4), een observatie inrichting (5) en een inspectieruimte (6):A microscope (1) suitable for inspecting a specimen, comprising an illumination device (2), a first linear polarizer (3), a second linear polarizer (4), an observation device (5) and an inspection room (6): 5 omvattende een eerste lichtweg (7) die zich uitstrekt tussen het genoemde belichtingsappraat (2) en de inspectieruimte (6) en een tweede lichtweg (8) die zich uitstrekt tussen de inspectieruimte (6) en de genoemde observatie inrichting (5), waarbij de eerste lineaire polarisator (3) is geplaatst in de genoemde eerste lichtweg (7) en de tweede polarisator (4) is geplaatst in de genoemde tweede lichtweg (8),5 comprising a first light path (7) which extends between said exposure device (2) and the inspection space (6) and a second light path (8) which extends between the inspection space (6) and said observation device (5), wherein the first linear polarizer (3) is placed in said first light path (7) and the second polarizer (4) is placed in said second light path (8), 10 waarbij de genoemde eerste lineaire polarisator (3) een eerste transmissie-as θΤΑ1 en de genoemde tweede polarisator (4) een tweede transmissie-as ΘΤΑ2 bezit, en waarbij de genoemde eerste transmissie-as 0TAi en/of tweede transmissie-as 0TA2 instelbaar is ten opzichte van de inspectieruimte (6).10 wherein said first linear polarizer (3) has a first transmission axis θ ΤΑ1 and said second polarizer (4) has a second transmission axis Θ ΤΑ2 , and wherein said first transmission axis 0 TAi and / or second transmission axis axis 0 TA2 is adjustable with respect to the inspection room (6). 2. Microscoop volgens conclusie 1, omvattende een collimator (9) in de genoemde eerste lichtweg (7)A microscope according to claim 1, comprising a collimator (9) in said first light path (7) 15 die geconfigureerd om het licht van het genoemde belichtings apparaat (2) te collimeren.15 which is configured to collimate the light from said exposure device (2). 3. Microscoop volgens conclusie 1 of 2, omvattende een lens of lens samenstel (10), geplaatst in de tweede lichtweg (8).A microscope according to claim 1 or 2, comprising a lens or lens assembly (10) disposed in the second light path (8). 4. Microscoop volgens een der conclusies 1-3, waarbij de genoemde eerste (3) en tweede lineaire polarisator (4) zijn gepositioneerd in een schijf (19) omvattende een perifeer deel, geheel of gedeeltelijkA microscope according to any one of claims 1-3, wherein said first (3) and second linear polarizer (4) are positioned in a disk (19) comprising a peripheral part, in whole or in part 20 corresponderend met de eerste lineaire polarisator (3) en een centraal deel, geheel of gedeeltelijk corresponderend met de tweede lineaire polarisator (4).20 corresponding to the first linear polarizer (3) and a central part, wholly or partially corresponding to the second linear polarizer (4). 5. Microscoop volgens een der conclusies 1-3, voorzien van een bundelsplitser (11) waarbij de microscoop zodanig is ingericht dat de genoemde bundelsplitser (11), de genoemde eerste polarisator (3) en het genoemde belichtings apparaat (2) samen om een as samenvallend met de tweede lichtwegA microscope according to any one of claims 1-3, provided with a beam splitter (11), wherein the microscope is arranged such that said beam splitter (11), said first polarizer (3) and said illumination device (2) together to form a axis coinciding with the second light path 25 (8) kunnen roteren in een vlak.25 (8) can rotate in a plane. 6. Microscoop volgens een der voorgaande conclusies, dat verder een belichtings apparaat (12) omvat met een ultraviolette of blauwe lichtbron, geconfigureerd om de inspectieruimte (6) te verlichten.A microscope according to any one of the preceding claims, further comprising an illumination device (12) with an ultraviolet or blue light source configured to illuminate the inspection space (6). 7. Microscoop volgens conclusie 6, waarbij het genoemde belichtingsapparaat (12) met ultraviolette of blauwe lichtbron is geconfigureerd om de inspectieruimte (6) met ongepolariseerd licht te belichten.The microscope of claim 6, wherein said ultraviolet or blue light source illumination device (12) is configured to illuminate the inspection space (6) with unpolarized light. 8. Microscoop volgens een der voorgaande conclusies, waarbij het verschil tussen de eerste transmissieas θΤΑ1 en de tweede transmissie-as ΘΤΑ2 instelbaar is tussen de 80 en 100 graden.A microscope according to any one of the preceding claims, wherein the difference between the first transmission axis θ ΤΑ1 and the second transmission axis Θ ΤΑ2 is adjustable between 80 and 100 degrees. 9. Microscoop volgens een der voorgaande conclusies, waarbij het genoemde belichtings apparaat een wit licht emitterende diode (LED) of een monochromatische lichtbron omvat.A microscope according to any one of the preceding claims, wherein said illumination device comprises a white light-emitting diode (LED) or a monochromatic light source. 55 10. Microscoop volgens een der voorgaande conclusies, waarbij de observatie inrichting (5) een oculair bevat.A microscope according to any one of the preceding claims, wherein the observation device (5) comprises an eyepiece. 11. Microscoop volgens een der voorgaande conclusies, waarbij de observatie inrichting (5) een beeld opname apparaat bevat.A microscope according to any one of the preceding claims, wherein the observation device (5) comprises an image recording device. 12. Microscoop volgens een der voorgaande conclusies, omvattende een object tafel of houder (15).A microscope according to any one of the preceding claims, comprising an object table or holder (15).
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Publication number Priority date Publication date Assignee Title
DE3602095A1 (en) * 1985-01-25 1986-07-31 Canon K.K., Tokio/Tokyo STEREOMICROSCOPE
EP0610945A1 (en) * 1993-02-12 1994-08-17 Orbotech Ltd Apparatus and method for optical inspection of articles
DE102013219181A1 (en) * 2013-09-24 2015-03-26 Olympus Soft Imaging Solutions Gmbh Apparatus and method for the optical determination of particle properties
DE102014114013A1 (en) * 2014-09-26 2016-03-31 Carl Zeiss Meditec Ag Medical optical observation device and method for contrasting polarization-rotating tissue
US20160103062A1 (en) * 2014-08-21 2016-04-14 Michael Shribak Polychromatic polarization state generator and its application for real-time birefringence imaging

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3602095A1 (en) * 1985-01-25 1986-07-31 Canon K.K., Tokio/Tokyo STEREOMICROSCOPE
EP0610945A1 (en) * 1993-02-12 1994-08-17 Orbotech Ltd Apparatus and method for optical inspection of articles
DE102013219181A1 (en) * 2013-09-24 2015-03-26 Olympus Soft Imaging Solutions Gmbh Apparatus and method for the optical determination of particle properties
US20160103062A1 (en) * 2014-08-21 2016-04-14 Michael Shribak Polychromatic polarization state generator and its application for real-time birefringence imaging
DE102014114013A1 (en) * 2014-09-26 2016-03-31 Carl Zeiss Meditec Ag Medical optical observation device and method for contrasting polarization-rotating tissue

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