JP6357353B2 - 結晶性シリコンウェハーのテクスチャエッチング液組成物及びテクスチャエッチング方法 - Google Patents

結晶性シリコンウェハーのテクスチャエッチング液組成物及びテクスチャエッチング方法 Download PDF

Info

Publication number
JP6357353B2
JP6357353B2 JP2014113698A JP2014113698A JP6357353B2 JP 6357353 B2 JP6357353 B2 JP 6357353B2 JP 2014113698 A JP2014113698 A JP 2014113698A JP 2014113698 A JP2014113698 A JP 2014113698A JP 6357353 B2 JP6357353 B2 JP 6357353B2
Authority
JP
Japan
Prior art keywords
crystalline silicon
texture
silicon wafer
composition
compound
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2014113698A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015023277A (ja
Inventor
勉奎 朴
勉奎 朴
亨杓 洪
亨杓 洪
大成 林
大成 林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dongwoo Fine Chem Co Ltd
Original Assignee
Dongwoo Fine Chem Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongwoo Fine Chem Co Ltd filed Critical Dongwoo Fine Chem Co Ltd
Publication of JP2015023277A publication Critical patent/JP2015023277A/ja
Application granted granted Critical
Publication of JP6357353B2 publication Critical patent/JP6357353B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0236Special surface textures
    • H01L31/02363Special surface textures of the semiconductor body itself, e.g. textured active layers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • C09K13/02Etching, surface-brightening or pickling compositions containing an alkali metal hydroxide
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • C09K13/04Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C09K13/06Etching, surface-brightening or pickling compositions containing an inorganic acid with organic material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30604Chemical etching

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Organic Chemistry (AREA)
  • Power Engineering (AREA)
  • Materials Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electromagnetism (AREA)
  • Weting (AREA)
  • Photovoltaic Devices (AREA)
JP2014113698A 2013-07-19 2014-06-02 結晶性シリコンウェハーのテクスチャエッチング液組成物及びテクスチャエッチング方法 Active JP6357353B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR20130085587 2013-07-19
KR10-2013-0085587 2013-07-19
KR10-2014-0011609 2014-01-29
KR1020140011609A KR102122049B1 (ko) 2013-07-19 2014-01-29 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법

Publications (2)

Publication Number Publication Date
JP2015023277A JP2015023277A (ja) 2015-02-02
JP6357353B2 true JP6357353B2 (ja) 2018-07-11

Family

ID=52482361

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014113698A Active JP6357353B2 (ja) 2013-07-19 2014-06-02 結晶性シリコンウェハーのテクスチャエッチング液組成物及びテクスチャエッチング方法

Country Status (3)

Country Link
JP (1) JP6357353B2 (zh)
KR (1) KR102122049B1 (zh)
TW (1) TW201506129A (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017069560A1 (ko) * 2015-10-23 2017-04-27 오씨아이 주식회사 실리콘 텍스쳐링 조성물 및 이의 제조방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4137123A (en) 1975-12-31 1979-01-30 Motorola, Inc. Texture etching of silicon: method
KR0180621B1 (ko) 1995-12-01 1999-04-15 이창세 실리콘 웨이퍼의 텍스쳐 에칭 방법 및 텍스쳐 용액
KR20120015485A (ko) * 2010-08-12 2012-02-22 동우 화인켐 주식회사 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭 방법
KR20130002258A (ko) * 2011-06-28 2013-01-07 동우 화인켐 주식회사 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
CN103890139A (zh) * 2011-10-19 2014-06-25 东友精细化工有限公司 结晶性硅晶片的织构蚀刻液组合物及织构蚀刻方法
KR20130043051A (ko) * 2011-10-19 2013-04-29 동우 화인켐 주식회사 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
CN104584232B (zh) * 2012-08-10 2017-03-08 第一工业制药株式会社 纹理形成用蚀刻液及使用其的纹理形成方法

Also Published As

Publication number Publication date
KR102122049B1 (ko) 2020-06-11
KR20150010558A (ko) 2015-01-28
JP2015023277A (ja) 2015-02-02
TW201506129A (zh) 2015-02-16

Similar Documents

Publication Publication Date Title
JP6645141B2 (ja) 導電性高分子水溶液、及び導電性高分子膜並びに該被覆物品
JP5799100B2 (ja) 結晶性シリコンウエハのテクスチャエッチング液組成物およびテクスチャエッチング方法
JP2014534630A (ja) 結晶性シリコンウェハーのテクスチャエッチング液組成物及びテクスチャエッチング方法
JP5799099B2 (ja) 結晶性シリコンウエハのテクスチャエッチング液組成物およびテクスチャエッチング方法
KR20130002258A (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
TW201326369A (zh) 結晶矽晶圓紋理蝕刻液組成物及紋理蝕刻方法
JP6357353B2 (ja) 結晶性シリコンウェハーのテクスチャエッチング液組成物及びテクスチャエッチング方法
KR20120078612A (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
TW201329207A (zh) 紋理蝕刻液組成物及結晶矽晶圓紋理蝕刻方法
KR20140082220A (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
JP2013504199A (ja) 太陽電池の後面電極用アルミニウムペースト
CN104294368A (zh) 结晶性硅晶片的织构蚀刻液组合物及织构蚀刻方法
KR101994084B1 (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
KR20140082222A (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
KR101804266B1 (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
KR101933527B1 (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
KR20150009712A (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
WO2013058477A2 (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
KR20110046308A (ko) 결정성 실리콘 웨이퍼의 텍스쳐용 에칭액 조성물
TWI586789B (zh) 紋理蝕刻液組成物及結晶矽晶圓紋理蝕刻方法
KR20130043051A (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
KR101892624B1 (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
KR101967164B1 (ko) 은 페이스트 조성물 및 이를 이용한 전극
WO2015020243A1 (ko) 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법
KR20140105644A (ko) 알루미늄 페이스트 조성물 및 이를 이용한 태양전지 소자

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170123

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20171025

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20171114

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180214

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20180612

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20180618

R150 Certificate of patent or registration of utility model

Ref document number: 6357353

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

S802 Written request for registration of partial abandonment of right

Free format text: JAPANESE INTERMEDIATE CODE: R311802

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250