JP6331776B2 - 異方導電性フィルム及び接続構造体 - Google Patents
異方導電性フィルム及び接続構造体 Download PDFInfo
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- JP6331776B2 JP6331776B2 JP2014135375A JP2014135375A JP6331776B2 JP 6331776 B2 JP6331776 B2 JP 6331776B2 JP 2014135375 A JP2014135375 A JP 2014135375A JP 2014135375 A JP2014135375 A JP 2014135375A JP 6331776 B2 JP6331776 B2 JP 6331776B2
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- conductive film
- anisotropic conductive
- conductive particles
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- electronic component
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Description
平面視において導電粒子の存在しない直線状のライン(以下、消失線という)が所定間隔で存在する異方導電性フィルムを提供する。
図1は、本発明の一実施例の異方導電性フィルム1Aの平面図、図2は、その異方導電性フィルム1Aにおける導電粒子の配置図である。
例えば、導電粒子3としては、公知の異方導電性フィルムに用いられているものの中から適宜選択して使用することができる。例えば、ニッケル、コバルト、銀、銅、金、パラジウムなどの金属粒子、金属被覆樹脂粒子などが挙げられる。2種以上を併用することもできる。
実施例1〜6、比較例1〜3
表1に示すように、実施例1〜6及び比較例2、3では、導電粒子が図2(4方向格子)又は図6A(6方格子)に示す配置の異方導電性フィルムを、表1に示す導電粒子と樹脂を使用して作製した。この場合、導電粒子の第1の配列方向L1のピッチP1と第2の配列方向L2のピッチP2を表1に示す大きさとした。
比較例1においては、導電粒子の配置をランダムとした。
なお、比較例1では導電粒子を、低沸点溶媒に分散し噴霧してランダムに同一平面上に配置した。
次の(a)〜(e)の評価を行った。
(a)消失線の有無
各実施例及び比較例の異方導電性フィルムにおいて、任意の導電粒子を選択し、それを基点として第1の配列方向及び第2の配列方向にそれぞれ500×500μmの領域を設定し顕微鏡観察(倍率:100倍)により、所期の消失線上の格子点で導電粒子が欠落しているか否かを検査した。さらにこの領域が重複しない部分で、同様の検査を10回繰り返した。なお、観察領域の設定において、所定面積の領域を設定することに代えて、所定数の導電粒子が存在する領域(例えば、30個×30個)を設定してもよい。
(a)と同様にして各実施例及び比較例の異方導電性フィルムを観察し、2個以上の導電粒子が連結しているものが有るか否かを検査した。
この観察結果において、2個以上の導電粒子が連結して存在する部分の個数と、連結粒子が無い場合の設計粒子数との割合が5%以下のものを2個以上の連結粒子無し、それ以外のものを2個以上の連結粒子有りと評価した。その結果、比較例1では2個以上の連結粒子が有りと評価されたが、他は無しと評価された。なお、2個連結粒子の粒子数が、全粒子数の5%以下であれば実用上問題は無い。
消失線を含む500×500μmの領域に含まれる導電粒子の個数を、顕微鏡を用いた目視観察によりカウントした、次に、同じ領域に含まれる導電粒子の個数を、画像処理機(WinRoof:三谷商事社製)を用いてカウントし、次式により個数一致率を算出した。
個数一致率(%)=100−(│N1−N2│/N1)×100
(但し、N1:目視観察によりカウントした導電粒子の個数
N2:画像処理機によりカウントした導電粒子の個数)
A:個数一致率が97%以上
B:個数一致率が92%以上〜97%未満
C:個数一致率が85%以上92%未満
D:個数一致率が85%未満
各実施例及び比較例の異方導電性フィルムを、初期導通および導通信頼性の評価用FPCとガラス基板の間に挟み、加熱加圧(180℃、3MPa、5秒)して各評価用接続物を得、この評価用接続物の導通抵抗を測定した。結果を表1に示す。
ここで、この評価用FPCとガラス基板は、それらの端子パターンが対応しており、サイズは次の通りである。
ポリイミド基材(厚み25μm)
配線仕様:Cu配線(高さ18μm)、Auメッキ
配線サイズ:幅25μm×長さ1000μm
ガラス材質:コーニング社製
外径:15×70mm
厚み:0.5mm
電極:ITO配線
初期導通抵抗の評価用FPCと各実施例及び比較例の異方導電性フィルムとの評価用接続物を温度85℃、湿度85%RHの恒温槽に500時間おいた後の導通抵抗を、初期導通抵抗と同様に測定した。結果を表1に示す。
なお、この導通抵抗が5Ω以上であると、接続した電子部品の実用的な導通安定性の点から好ましくない。
比較例1では、粒子がランダムに存在しているため、画像処理機がノイズと判定し、検出成功率が著しく低くなったと推察される。
2 絶縁接着剤層
3 導電粒子
4 接続端子
5 単位格子
10 視野
D1 異方導電性フィルムの長手方向
D2 異方導電性フィルムの幅方向
L1 第1の配列方向
L2 第2の配列方向
L3 消失線
P1 導電粒子の第1の配列方向のピッチ
P2 導電粒子の第2の配列方向のピッチ
α 傾斜角
β 傾斜角
γ 第1の配列方向L1と第2の配列方向L2がなす角
Claims (13)
- 絶縁接着剤層と、該絶縁接着剤層に分散した導電粒子を含む異方導電性フィルムであって、
平面視において導電粒子の存在しない直線状のライン(以下、消失線という)が所定間隔で存在し、
導電粒子が、第1の配列方向と第2の配列方向に配列することにより格子状に配置され、
消失線が、第1の配列方向又は第2の配列方向に対して傾斜した線上又は平行な線上の格子点に導電粒子が存在しないことにより形成されている異方導電性フィルム。 - 異方導電性フィルムが帯状に形成されており、その長手方向に対して斜めに消失線が形成されている請求項1記載の異方導電性フィルム。
- 異方導電性フィルムの長手方向と消失線がなす角度が、異方導電性フィルムの幅方向と消失線のなす角度よりも小さい請求項2記載の異方導電性フィルム。
- 導電粒子の第1の配列方向が異方導電性フィルムの長手方向と平行である請求項1〜3のいずれかに記載の異方導電性フィルム。
- 導電粒子の第1の配列方向と第2の配列方向が直交している請求項1〜4のいずれかに記載の異方導電性フィルム。
- 導電粒子の第1の配列方向と第2の配列方向が斜めに交わっている請求項1〜4のいずれかに記載の異方導電性フィルム。
- 導電粒子の密度が100〜100000個/mm2である請求項1〜6のいずれかに記載の異方導電性フィルム。
- 格子状に配列された導電粒子の第1の配列方向における配列ピッチと第2の配列方向における配列ピッチとが、それぞれ導電粒子径の0.5〜128倍である請求項1〜7のいずれかに記載の異方導電性フィルム。
- 絶縁接着剤層と、該絶縁接着剤層に分散した導電粒子を含む異方導電性フィルムであって、
平面視において導電粒子が互いに離間してランダムに配置され、導電粒子の存在しない直線状の領域が所定間隔で且つフィルムの長手方向に傾斜して存在している異方導電性フィルム。 - 請求項1〜9のいずれかに記載の異方導電性フィルムを用いて、第1電子部品の接続端子と第2電子部品の接続端子を異方導電性接続する接続方法であって、異方導電性フィルムの第1の配列方向又は第2の配列方向に略直交する方向を第1電子部品又は第2電子部品の接続端子の長手方向に合わせる接続方法。
- 接続端子の接続面の大きさが、幅8〜200μm、長さ1500μm以下である請求項10記載の接続方法。
- 請求項1〜9のいずれかに記載の異方導電性フィルムを用いて第1電子部品の接続端子と第2電子部品の接続端子とが異方導電性接続されている接続構造体。
- 請求項1〜9のいずれかに記載の異方導電性フィルムを用いて第1電子部品の接続端子と第2電子部品の接続端子とを異方導電性接続する、接続構造体の製造方法。
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US15/316,649 US10121756B2 (en) | 2014-06-30 | 2015-05-08 | Anisotropic conductive film and connection structure |
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US11359908B2 (en) | 2018-09-19 | 2022-06-14 | Tdk Corporation | Angle sensor system |
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TWI659432B (zh) | 2019-05-11 |
CN106663885A (zh) | 2017-05-10 |
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