JP6301386B2 - 放射能汚染検査装置 - Google Patents

放射能汚染検査装置 Download PDF

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Publication number
JP6301386B2
JP6301386B2 JP2016061907A JP2016061907A JP6301386B2 JP 6301386 B2 JP6301386 B2 JP 6301386B2 JP 2016061907 A JP2016061907 A JP 2016061907A JP 2016061907 A JP2016061907 A JP 2016061907A JP 6301386 B2 JP6301386 B2 JP 6301386B2
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Japan
Prior art keywords
measurement
radioactive contamination
inspection apparatus
detection unit
unit
Prior art date
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Application number
JP2016061907A
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English (en)
Japanese (ja)
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JP2017173239A5 (enExample
JP2017173239A (ja
Inventor
英明 垣内
英明 垣内
洋 濱本
洋 濱本
真照 林
真照 林
哲史 東
哲史 東
西沢　博志
博志 西沢
理 笹野
理 笹野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Mitsubishi Electric Plant Engineering Corp
Original Assignee
Mitsubishi Electric Corp
Mitsubishi Electric Plant Engineering Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp, Mitsubishi Electric Plant Engineering Corp filed Critical Mitsubishi Electric Corp
Priority to JP2016061907A priority Critical patent/JP6301386B2/ja
Priority to US16/087,867 priority patent/US20210181360A1/en
Priority to EP16895462.6A priority patent/EP3435119A4/en
Priority to PCT/JP2016/068963 priority patent/WO2017163437A1/ja
Publication of JP2017173239A publication Critical patent/JP2017173239A/ja
Publication of JP2017173239A5 publication Critical patent/JP2017173239A5/ja
Application granted granted Critical
Publication of JP6301386B2 publication Critical patent/JP6301386B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/169—Exploration, location of contaminated surface areas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/167—Measuring radioactive content of objects, e.g. contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Measurement Of Radiation (AREA)
JP2016061907A 2016-03-25 2016-03-25 放射能汚染検査装置 Active JP6301386B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2016061907A JP6301386B2 (ja) 2016-03-25 2016-03-25 放射能汚染検査装置
US16/087,867 US20210181360A1 (en) 2016-03-25 2016-06-27 Radioactive contamination inspection device
EP16895462.6A EP3435119A4 (en) 2016-03-25 2016-06-27 DEVICE FOR TESTING RADIOACTIVE CONTAMINATION
PCT/JP2016/068963 WO2017163437A1 (ja) 2016-03-25 2016-06-27 放射能汚染検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016061907A JP6301386B2 (ja) 2016-03-25 2016-03-25 放射能汚染検査装置

Publications (3)

Publication Number Publication Date
JP2017173239A JP2017173239A (ja) 2017-09-28
JP2017173239A5 JP2017173239A5 (enExample) 2018-03-22
JP6301386B2 true JP6301386B2 (ja) 2018-03-28

Family

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Family Applications (1)

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JP2016061907A Active JP6301386B2 (ja) 2016-03-25 2016-03-25 放射能汚染検査装置

Country Status (4)

Country Link
US (1) US20210181360A1 (enExample)
EP (1) EP3435119A4 (enExample)
JP (1) JP6301386B2 (enExample)
WO (1) WO2017163437A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7079666B2 (ja) * 2018-05-31 2022-06-02 三菱重工業株式会社 放射能濃度表示装置、放射能濃度算出装置、放射能濃度表示方法及び放射能濃度算出方法
JP2020159870A (ja) * 2019-03-27 2020-10-01 三菱電機プラントエンジニアリング株式会社 タイヤハウス汚染自動検査方法
JP2021038970A (ja) * 2019-09-02 2021-03-11 三菱電機プラントエンジニアリング株式会社 タイヤハウス汚染検査装置
JP7183140B2 (ja) * 2019-11-19 2022-12-05 三菱電機株式会社 放射線検出器
JP7498205B2 (ja) * 2022-02-18 2024-06-11 三菱電機プラントエンジニアリング株式会社 放射能汚染測定装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1308249A (en) 1969-06-20 1973-02-21 Gen Foods Corp Process for treating green coffee
JPH0784054A (ja) * 1993-09-16 1995-03-31 Toshiba Corp 放射線検出器および放射線測定装置
JP3813656B2 (ja) 1996-03-07 2006-08-23 株式会社東芝 光ファイバ型大面積放射線モニタ
JP2002350552A (ja) * 2001-05-28 2002-12-04 Mitsubishi Electric Corp 放射線検出装置
JP2005172771A (ja) 2003-12-15 2005-06-30 Nuclear Fuel Ind Ltd α・β線検出装置及びα・β線検出方法
JP2005195459A (ja) * 2004-01-07 2005-07-21 Toshiba Corp 物品搬出モニタ装置
JP4697353B2 (ja) * 2009-04-28 2011-06-08 富士電機システムズ株式会社 物品搬出モニタ
US8908831B2 (en) * 2011-02-08 2014-12-09 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
JP5669782B2 (ja) 2012-03-29 2015-02-18 三菱電機株式会社 放射能検査装置
JP2014126555A (ja) * 2012-12-27 2014-07-07 Canon Electronics Inc 放射線量測定装置
JP2015180872A (ja) 2014-03-05 2015-10-15 エヌ・エム・ピイビジネスサポート株式会社 放射能測定装置および放射能測定方法
JP2016008884A (ja) * 2014-06-24 2016-01-18 日立Ｇｅニュークリア・エナジー株式会社 総合情報管理システム
JP5950015B2 (ja) * 2015-11-16 2016-07-13 富士電機株式会社 放射線モニタ

Also Published As

Publication number Publication date
WO2017163437A1 (ja) 2017-09-28
EP3435119A4 (en) 2019-11-13
EP3435119A9 (en) 2019-08-21
US20210181360A1 (en) 2021-06-17
JP2017173239A (ja) 2017-09-28
EP3435119A1 (en) 2019-01-30

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