JP6271139B2 - 温度計 - Google Patents

温度計 Download PDF

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Publication number
JP6271139B2
JP6271139B2 JP2013058416A JP2013058416A JP6271139B2 JP 6271139 B2 JP6271139 B2 JP 6271139B2 JP 2013058416 A JP2013058416 A JP 2013058416A JP 2013058416 A JP2013058416 A JP 2013058416A JP 6271139 B2 JP6271139 B2 JP 6271139B2
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JP
Japan
Prior art keywords
unit
light
flue
light receiving
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2013058416A
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English (en)
Japanese (ja)
Other versions
JP2014182106A (ja
JP2014182106A5 (enExample
Inventor
井戸　琢也
琢也 井戸
森　哲也
哲也 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP2013058416A priority Critical patent/JP6271139B2/ja
Priority to US14/221,020 priority patent/US9506807B2/en
Priority to EP14001026.5A priority patent/EP2781900A1/en
Priority to CN201410108517.2A priority patent/CN104062028A/zh
Publication of JP2014182106A publication Critical patent/JP2014182106A/ja
Publication of JP2014182106A5 publication Critical patent/JP2014182106A5/ja
Application granted granted Critical
Publication of JP6271139B2 publication Critical patent/JP6271139B2/ja
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0806—Focusing or collimating elements, e.g. lenses or concave mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0014—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation from gases, flames
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/04—Casings
    • G01J5/041—Mountings in enclosures or in a particular environment
    • G01J5/042—High-temperature environment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/05—Means for preventing contamination of the components of the optical system; Means for preventing obstruction of the radiation path
    • G01J5/051—Means for preventing contamination of the components of the optical system; Means for preventing obstruction of the radiation path using a gas purge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/084—Adjustable or slidable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/58—Radiation pyrometry, e.g. infrared or optical thermometry using absorption; using extinction effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
    • G01J5/602—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature using selective, monochromatic or bandpass filtering

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
JP2013058416A 2013-03-21 2013-03-21 温度計 Expired - Fee Related JP6271139B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2013058416A JP6271139B2 (ja) 2013-03-21 2013-03-21 温度計
US14/221,020 US9506807B2 (en) 2013-03-21 2014-03-20 Optical gas temperature sensor
EP14001026.5A EP2781900A1 (en) 2013-03-21 2014-03-20 Thermometer
CN201410108517.2A CN104062028A (zh) 2013-03-21 2014-03-21 温度计

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013058416A JP6271139B2 (ja) 2013-03-21 2013-03-21 温度計

Publications (3)

Publication Number Publication Date
JP2014182106A JP2014182106A (ja) 2014-09-29
JP2014182106A5 JP2014182106A5 (enExample) 2016-04-21
JP6271139B2 true JP6271139B2 (ja) 2018-01-31

Family

ID=50343575

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013058416A Expired - Fee Related JP6271139B2 (ja) 2013-03-21 2013-03-21 温度計

Country Status (4)

Country Link
US (1) US9506807B2 (enExample)
EP (1) EP2781900A1 (enExample)
JP (1) JP6271139B2 (enExample)
CN (1) CN104062028A (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015068048A1 (en) * 2013-11-11 2015-05-14 King Abdullah University Of Science And Technology High repetition rate thermometry system and method
US10161799B2 (en) 2015-02-25 2018-12-25 The University Of Tokyo Temperature measuring device and temperature measuring method
JP6523840B2 (ja) * 2015-07-16 2019-06-05 株式会社堀場製作所 ガス成分検出装置
TWI673482B (zh) * 2016-05-24 2019-10-01 美商應用材料股份有限公司 用於藉由布儒斯特角下的雙波長偏移進行的非接觸式溫度測量的系統、處理腔室與方法
US10212776B2 (en) * 2016-12-28 2019-02-19 Asahi Kasei Microdevices Corporation Light receiving device and light emitting and receiving device
JP6439030B2 (ja) * 2016-12-28 2018-12-19 旭化成エレクトロニクス株式会社 受光装置及び受発光装置
CN112204379A (zh) * 2018-06-04 2021-01-08 默克专利股份公司 用于光检测器的校准装置和用于为校准装置设置校准点的设置装置
US12098958B2 (en) * 2021-01-15 2024-09-24 Unison Industries, Llc Thermal measurement system
CN114136458B (zh) * 2021-11-09 2024-04-23 中南大学 一种熔融金属流体温度多态在线检测方法及系统

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US3909132A (en) * 1974-06-11 1975-09-30 Allied Chem Spectroscopic temperature measurement
DE2813089C2 (de) * 1978-03-25 1983-12-15 Gkss - Forschungszentrum Geesthacht Gmbh, 2000 Hamburg Empfangsvorrichtung für aus unterschiedlichen Entfernungsbereichen kommende rückgestreute Signale
JPS60211380A (ja) * 1984-04-05 1985-10-23 Optic:Kk 光波距離計
US5252060A (en) * 1992-03-27 1993-10-12 Mckinnon J Thomas Infrared laser fault detection method for hazardous waste incineration
DE4443016A1 (de) 1994-12-02 1996-06-05 Sick Optik Elektronik Erwin Gasanalytisches Meßgerät
JPH10142148A (ja) * 1996-11-08 1998-05-29 Mitsubishi Heavy Ind Ltd 濃度測定装置
JP4038631B2 (ja) 1998-08-28 2008-01-30 株式会社堀場製作所 半導体レーザ分光法を用いた温度・濃度・化学種の高速計測方法および計測システム
US6678541B1 (en) 1998-10-28 2004-01-13 The Governmemt Of The United States Of America Optical fiber probe and methods for measuring optical properties
US6354733B2 (en) * 1999-01-15 2002-03-12 Ametex, Inc. System and method for determining combustion temperature using infrared emissions
JP2001249074A (ja) * 2000-03-07 2001-09-14 Mitsubishi Heavy Ind Ltd 炉内ガスの濃度計測装置、該濃度計測装置を備えた灰溶融炉、及び炉内ガスの濃度計測方法
US6593582B2 (en) * 2001-05-11 2003-07-15 Science & Engineering Services, Inc. Portable digital lidar system
JP2003042943A (ja) * 2001-08-01 2003-02-13 Japan Atom Energy Res Inst 高速信号分光法
US20070165235A1 (en) * 2006-01-17 2007-07-19 Honeywell International Inc. Horticultural sensor
US7884937B2 (en) * 2007-04-19 2011-02-08 Science & Engineering Services, Inc. Airborne tunable mid-IR laser gas-correlation sensor
CN101918830B (zh) * 2007-05-31 2014-10-08 S.A.E.阿菲金公司 用于分析流体的系统和方法
US8050884B2 (en) * 2007-12-06 2011-11-01 The Boeing Company Method and apparatus for determining the emissivity, area and temperature of an object
WO2009101659A1 (ja) * 2008-02-13 2009-08-20 Shikoku Research Institute Incorporated ガス濃度遠隔計測方法および装置
GB0901040D0 (en) * 2009-01-22 2009-03-11 Renishaw Plc Optical measuring method and system
KR101716917B1 (ko) * 2009-08-10 2017-03-15 졸로 테크놀러지스, 아이엔씨. 다중모드 전송 광섬유를 이용한 광신호 노이즈 저감
US20110150035A1 (en) * 2009-12-17 2011-06-23 Hanson Ronald K Non-intrusive method for sensing gas temperature and species concentration in gaseous environments
JP5347983B2 (ja) * 2010-01-19 2013-11-20 株式会社島津製作所 ガス分析装置
US8702302B2 (en) * 2010-09-13 2014-04-22 General Electric Company Hot gas temperature measurement in gas turbine using tunable diode laser

Also Published As

Publication number Publication date
US20140286376A1 (en) 2014-09-25
JP2014182106A (ja) 2014-09-29
US9506807B2 (en) 2016-11-29
CN104062028A (zh) 2014-09-24
EP2781900A1 (en) 2014-09-24

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