JP2014182106A5 - - Google Patents

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Publication number
JP2014182106A5
JP2014182106A5 JP2013058416A JP2013058416A JP2014182106A5 JP 2014182106 A5 JP2014182106 A5 JP 2014182106A5 JP 2013058416 A JP2013058416 A JP 2013058416A JP 2013058416 A JP2013058416 A JP 2013058416A JP 2014182106 A5 JP2014182106 A5 JP 2014182106A5
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JP
Japan
Prior art keywords
light receiving
light
flue
unit
measurement
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JP2013058416A
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English (en)
Japanese (ja)
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JP2014182106A (ja
JP6271139B2 (ja
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Priority to JP2013058416A priority Critical patent/JP6271139B2/ja
Priority claimed from JP2013058416A external-priority patent/JP6271139B2/ja
Priority to US14/221,020 priority patent/US9506807B2/en
Priority to EP14001026.5A priority patent/EP2781900A1/en
Priority to CN201410108517.2A priority patent/CN104062028A/zh
Publication of JP2014182106A publication Critical patent/JP2014182106A/ja
Publication of JP2014182106A5 publication Critical patent/JP2014182106A5/ja
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Publication of JP6271139B2 publication Critical patent/JP6271139B2/ja
Expired - Fee Related legal-status Critical Current
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JP2013058416A 2013-03-21 2013-03-21 温度計 Expired - Fee Related JP6271139B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2013058416A JP6271139B2 (ja) 2013-03-21 2013-03-21 温度計
US14/221,020 US9506807B2 (en) 2013-03-21 2014-03-20 Optical gas temperature sensor
EP14001026.5A EP2781900A1 (en) 2013-03-21 2014-03-20 Thermometer
CN201410108517.2A CN104062028A (zh) 2013-03-21 2014-03-21 温度计

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013058416A JP6271139B2 (ja) 2013-03-21 2013-03-21 温度計

Publications (3)

Publication Number Publication Date
JP2014182106A JP2014182106A (ja) 2014-09-29
JP2014182106A5 true JP2014182106A5 (enExample) 2016-04-21
JP6271139B2 JP6271139B2 (ja) 2018-01-31

Family

ID=50343575

Family Applications (1)

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JP2013058416A Expired - Fee Related JP6271139B2 (ja) 2013-03-21 2013-03-21 温度計

Country Status (4)

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US (1) US9506807B2 (enExample)
EP (1) EP2781900A1 (enExample)
JP (1) JP6271139B2 (enExample)
CN (1) CN104062028A (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
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WO2015068048A1 (en) * 2013-11-11 2015-05-14 King Abdullah University Of Science And Technology High repetition rate thermometry system and method
US10161799B2 (en) 2015-02-25 2018-12-25 The University Of Tokyo Temperature measuring device and temperature measuring method
JP6523840B2 (ja) * 2015-07-16 2019-06-05 株式会社堀場製作所 ガス成分検出装置
TWI673482B (zh) * 2016-05-24 2019-10-01 美商應用材料股份有限公司 用於藉由布儒斯特角下的雙波長偏移進行的非接觸式溫度測量的系統、處理腔室與方法
US10212776B2 (en) * 2016-12-28 2019-02-19 Asahi Kasei Microdevices Corporation Light receiving device and light emitting and receiving device
JP6439030B2 (ja) * 2016-12-28 2018-12-19 旭化成エレクトロニクス株式会社 受光装置及び受発光装置
CN112204379A (zh) * 2018-06-04 2021-01-08 默克专利股份公司 用于光检测器的校准装置和用于为校准装置设置校准点的设置装置
US12098958B2 (en) * 2021-01-15 2024-09-24 Unison Industries, Llc Thermal measurement system
CN114136458B (zh) * 2021-11-09 2024-04-23 中南大学 一种熔融金属流体温度多态在线检测方法及系统

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DE2813089C2 (de) * 1978-03-25 1983-12-15 Gkss - Forschungszentrum Geesthacht Gmbh, 2000 Hamburg Empfangsvorrichtung für aus unterschiedlichen Entfernungsbereichen kommende rückgestreute Signale
JPS60211380A (ja) * 1984-04-05 1985-10-23 Optic:Kk 光波距離計
US5252060A (en) * 1992-03-27 1993-10-12 Mckinnon J Thomas Infrared laser fault detection method for hazardous waste incineration
DE4443016A1 (de) 1994-12-02 1996-06-05 Sick Optik Elektronik Erwin Gasanalytisches Meßgerät
JPH10142148A (ja) * 1996-11-08 1998-05-29 Mitsubishi Heavy Ind Ltd 濃度測定装置
JP4038631B2 (ja) 1998-08-28 2008-01-30 株式会社堀場製作所 半導体レーザ分光法を用いた温度・濃度・化学種の高速計測方法および計測システム
US6678541B1 (en) 1998-10-28 2004-01-13 The Governmemt Of The United States Of America Optical fiber probe and methods for measuring optical properties
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JP5347983B2 (ja) * 2010-01-19 2013-11-20 株式会社島津製作所 ガス分析装置
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