JP6256152B2 - Ｘ線測定装置 - Google Patents

Ｘ線測定装置 Download PDF

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Publication number
JP6256152B2
JP6256152B2 JP2014068561A JP2014068561A JP6256152B2 JP 6256152 B2 JP6256152 B2 JP 6256152B2 JP 2014068561 A JP2014068561 A JP 2014068561A JP 2014068561 A JP2014068561 A JP 2014068561A JP 6256152 B2 JP6256152 B2 JP 6256152B2
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ray
signal
peak
detection
detector array
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JP2015190868A (ja
JP2015190868A5 (enExample
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隆雄 丸井
隆雄 丸井
桂次郎 鈴木
桂次郎 鈴木
理絵 小川
理絵 小川
和夫 小柳
和夫 小柳
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Shimadzu Corp
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Shimadzu Corp
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JP2014068561A 2014-03-28 2014-03-28 Ｘ線測定装置 Active JP6256152B2 (ja)

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JP2015190868A JP2015190868A (ja) 2015-11-02
JP2015190868A5 JP2015190868A5 (enExample) 2016-08-25
JP6256152B2 true JP6256152B2 (ja) 2018-01-10

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017067516A (ja) 2015-09-29 2017-04-06 株式会社ミツトヨ 計測機器用の信号処理装置
DE102016014213A1 (de) 2015-12-08 2017-07-06 Shimadzu Corporation Röntgenspektroskopische analysevorrichtung und elementaranalyseverfahren
JP2019211209A (ja) * 2018-05-31 2019-12-12 国立研究開発法人物質・材料研究機構 一次元または二次元検出器を用いた回折ｘ線の強度を測定する方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5698641A (en) * 1980-01-09 1981-08-08 Rigaku Denki Kk X-ray diffraction device
JPS59186481A (ja) * 1983-04-08 1984-10-23 Citizen Watch Co Ltd 撮像装置
JPH0678913A (ja) * 1992-09-03 1994-03-22 Toshiba Corp Ｃｔスキャナ
JP2003156565A (ja) * 2001-11-20 2003-05-30 Canon Inc 光電変換装置を用いた撮影装置
GB2496484B (en) * 2011-11-11 2016-04-06 Rigaku Denki Co Ltd X-Ray intensity correction method and x-ray diffractometer
JP5695589B2 (ja) * 2012-03-02 2015-04-08 株式会社リガク Ｘ線強度補正方法およびｘ線回折装置
JP5492173B2 (ja) * 2011-11-11 2014-05-14 株式会社リガク 回折ｘ線検出方法およびｘ線回折装置

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