JP6237471B2 - 定量用データ処理装置 - Google Patents

定量用データ処理装置 Download PDF

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JP6237471B2
JP6237471B2 JP2014108097A JP2014108097A JP6237471B2 JP 6237471 B2 JP6237471 B2 JP 6237471B2 JP 2014108097 A JP2014108097 A JP 2014108097A JP 2014108097 A JP2014108097 A JP 2014108097A JP 6237471 B2 JP6237471 B2 JP 6237471B2
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value
quantitative
calibration point
calibration
data processing
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JP2015224889A5 (enExample
JP2015224889A (ja
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一真 前田
一真 前田
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Shimadzu Corp
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Shimadzu Corp
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JP2014108097A 2014-05-26 2014-05-26 定量用データ処理装置 Active JP6237471B2 (ja)

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JP2014108097A JP6237471B2 (ja) 2014-05-26 2014-05-26 定量用データ処理装置

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JP2015224889A JP2015224889A (ja) 2015-12-14
JP2015224889A5 JP2015224889A5 (enExample) 2016-10-27
JP6237471B2 true JP6237471B2 (ja) 2017-11-29

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Families Citing this family (3)

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Publication number Priority date Publication date Assignee Title
JP6862813B2 (ja) * 2016-12-13 2021-04-21 東ソー株式会社 多項式検量線による定量および補正方法
CN111679089B (zh) * 2020-08-13 2020-11-06 武汉生之源生物科技股份有限公司 一种检测设备的数据处理方法
CN113049631B (zh) * 2021-03-24 2022-10-04 海南红塔卷烟有限责任公司 一种用于热重逸出物质定量分析的滴注微萃取方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59168342A (ja) * 1983-03-16 1984-09-22 Hitachi Ltd 検量線近似法
JPS6073436A (ja) * 1983-09-30 1985-04-25 Shimadzu Corp 検量線作成装置
JPS63132166A (ja) * 1986-11-21 1988-06-04 Olympus Optical Co Ltd 検量線設定方法
JPH0617920B2 (ja) * 1989-03-18 1994-03-09 株式会社島津製作所 測定データ処理装置
JP3279756B2 (ja) * 1993-08-24 2002-04-30 東ソー株式会社 定量計算装置
JPH07120381A (ja) * 1993-10-25 1995-05-12 Hitachi Ltd 検量線作成方法および自動分析装置
US6277584B1 (en) * 1998-12-16 2001-08-21 Dade Behring Inc. Method for calibrating a chemical analyzer with improved accuracy at low signal levels

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