JP6182840B2 - 放射線検出器の製造方法 - Google Patents

放射線検出器の製造方法 Download PDF

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Publication number
JP6182840B2
JP6182840B2 JP2012201790A JP2012201790A JP6182840B2 JP 6182840 B2 JP6182840 B2 JP 6182840B2 JP 2012201790 A JP2012201790 A JP 2012201790A JP 2012201790 A JP2012201790 A JP 2012201790A JP 6182840 B2 JP6182840 B2 JP 6182840B2
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JP
Japan
Prior art keywords
radiation detector
partition
substrate
manufacturing
scintillator layer
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Expired - Fee Related
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JP2012201790A
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English (en)
Japanese (ja)
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JP2014029314A5 (cg-RX-API-DMAC7.html
JP2014029314A (ja
Inventor
川西　光宏
光宏 川西
五十嵐　崇裕
崇裕 五十嵐
真一 小口
真一 小口
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Sony Corp
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Sony Corp
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Priority to JP2012201790A priority Critical patent/JP6182840B2/ja
Priority to PCT/JP2013/002976 priority patent/WO2014002363A1/ja
Publication of JP2014029314A publication Critical patent/JP2014029314A/ja
Publication of JP2014029314A5 publication Critical patent/JP2014029314A5/ja
Application granted granted Critical
Publication of JP6182840B2 publication Critical patent/JP6182840B2/ja
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
JP2012201790A 2012-06-25 2012-09-13 放射線検出器の製造方法 Expired - Fee Related JP6182840B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012201790A JP6182840B2 (ja) 2012-06-25 2012-09-13 放射線検出器の製造方法
PCT/JP2013/002976 WO2014002363A1 (ja) 2012-06-25 2013-05-09 放射線検出器及びその製造方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012142132 2012-06-25
JP2012142132 2012-06-25
JP2012201790A JP6182840B2 (ja) 2012-06-25 2012-09-13 放射線検出器の製造方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2017145110A Division JP6515958B2 (ja) 2012-06-25 2017-07-27 放射線検出器及びその製造方法

Publications (3)

Publication Number Publication Date
JP2014029314A JP2014029314A (ja) 2014-02-13
JP2014029314A5 JP2014029314A5 (cg-RX-API-DMAC7.html) 2015-04-02
JP6182840B2 true JP6182840B2 (ja) 2017-08-23

Family

ID=49782565

Family Applications (1)

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JP2012201790A Expired - Fee Related JP6182840B2 (ja) 2012-06-25 2012-09-13 放射線検出器の製造方法

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JP (1) JP6182840B2 (cg-RX-API-DMAC7.html)
WO (1) WO2014002363A1 (cg-RX-API-DMAC7.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017191113A (ja) * 2012-06-25 2017-10-19 ソニー株式会社 放射線検出器及びその製造方法

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10087367B2 (en) 2013-01-21 2018-10-02 Siemens Medical Solutions Usa, Inc. Passivation of metal halide scintillators
US11098248B2 (en) 2013-01-21 2021-08-24 Siemens Medical Solutions Usa, Inc. Passivation of metal halide scintillators
US11597877B2 (en) 2013-01-21 2023-03-07 Siemens Medical Solutions Usa, Inc. Passivation of metal halide scintillators
US10176902B2 (en) 2013-11-20 2019-01-08 Toray Industries, Inc. Scintillator panel
US10393887B2 (en) * 2015-07-19 2019-08-27 Afo Research, Inc. Fluorine resistant, radiation resistant, and radiation detection glass systems
EP3193337A1 (en) * 2016-01-13 2017-07-19 Siemens Medical Solutions USA, Inc. Passivation of metal halide scintillators
JP6781868B2 (ja) * 2016-03-24 2020-11-11 国立大学法人静岡大学 放射線検出素子の製造方法
US10859512B2 (en) 2016-06-15 2020-12-08 Shimadzu Corporation X-ray phase contrast imaging apparatus
WO2018020555A1 (ja) * 2016-07-25 2018-02-01 野洲メディカルイメージングテクノロジー株式会社 シンチレータセンサ基板及びシンチレータセンサ基板の製造方法
EP3660542A1 (en) * 2018-11-29 2020-06-03 Koninklijke Philips N.V. Hybrid x-ray and optical detector
WO2020198176A1 (en) 2019-03-25 2020-10-01 Afo Research, Inc. Alkali free fluorophosphate based glass systems
JP6879426B1 (ja) * 2020-09-30 2021-06-02 日立金属株式会社 シンチレータ構造体およびその製造方法
CN116904183A (zh) 2020-09-30 2023-10-20 株式会社博迈立铖 闪烁体结构体及其制造方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09145845A (ja) * 1995-11-22 1997-06-06 Canon Inc 放射線検出器及び放射線検出装置
JP4097455B2 (ja) * 2001-06-25 2008-06-11 化成オプトニクス株式会社 デジタルラジオグラフィー用酸硫化ガドリニウム蛍光体、放射線像変換スクリーン及び放射線像撮像装置
JP2003262672A (ja) * 2002-03-11 2003-09-19 Canon Inc 放射線検出装置及びその製造方法
WO2003083513A1 (en) * 2002-03-28 2003-10-09 Kabushiki Kaisha Toshiba X-ray detector
JP2004239722A (ja) * 2003-02-05 2004-08-26 Toshiba Corp 放射線検出器
JP4307127B2 (ja) * 2003-04-02 2009-08-05 キヤノン株式会社 放射線撮影装置
JP2004317300A (ja) * 2003-04-16 2004-11-11 Toshiba Corp 放射線平面検出器及びその製造方法
JP2004340737A (ja) * 2003-05-15 2004-12-02 Toshiba Corp 放射線検出器及びその製造方法
DE102004056999A1 (de) * 2004-11-25 2006-06-01 Siemens Ag Verfahren zur Herstellung einer Szintillatorschicht für einen Röntgendetektor und Szintillatorschicht
JP5313632B2 (ja) * 2008-11-04 2013-10-09 富士フイルム株式会社 放射線画像検出器
JP2011007552A (ja) * 2009-06-24 2011-01-13 Konica Minolta Medical & Graphic Inc シンチレータパネル、放射線検出装置、及びシンチレータパネルの製造方法
JP5369979B2 (ja) * 2009-08-05 2013-12-18 コニカミノルタ株式会社 放射線画像検出装置
JP2011257339A (ja) * 2010-06-11 2011-12-22 Konica Minolta Medical & Graphic Inc 放射線画像検出装置
CN103563006B (zh) * 2011-05-26 2016-08-24 东丽株式会社 闪烁体面板以及闪烁体面板的制造方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017191113A (ja) * 2012-06-25 2017-10-19 ソニー株式会社 放射線検出器及びその製造方法

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Publication number Publication date
WO2014002363A1 (ja) 2014-01-03
JP2014029314A (ja) 2014-02-13

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