JP6176049B2 - タンデム四重極型質量分析装置 - Google Patents

タンデム四重極型質量分析装置 Download PDF

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Publication number
JP6176049B2
JP6176049B2 JP2013213315A JP2013213315A JP6176049B2 JP 6176049 B2 JP6176049 B2 JP 6176049B2 JP 2013213315 A JP2013213315 A JP 2013213315A JP 2013213315 A JP2013213315 A JP 2013213315A JP 6176049 B2 JP6176049 B2 JP 6176049B2
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Prior art keywords
ion
measurement
mrm
ions
product
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Japanese (ja)
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JP2015076338A5 (enExample
JP2015076338A (ja
Inventor
山本　英樹
英樹 山本
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2013213315A priority Critical patent/JP6176049B2/ja
Priority to US14/508,086 priority patent/US9142394B2/en
Priority to CN201410535497.7A priority patent/CN104569234B/zh
Priority to CN201810083648.8A priority patent/CN108287208A/zh
Publication of JP2015076338A publication Critical patent/JP2015076338A/ja
Publication of JP2015076338A5 publication Critical patent/JP2015076338A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2013213315A 2013-10-11 2013-10-11 タンデム四重極型質量分析装置 Active JP6176049B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2013213315A JP6176049B2 (ja) 2013-10-11 2013-10-11 タンデム四重極型質量分析装置
US14/508,086 US9142394B2 (en) 2013-10-11 2014-10-07 Tandem quadrupole mass spectrometer
CN201410535497.7A CN104569234B (zh) 2013-10-11 2014-10-11 串联四极型质谱仪
CN201810083648.8A CN108287208A (zh) 2013-10-11 2014-10-11 串联四极型质谱仪

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013213315A JP6176049B2 (ja) 2013-10-11 2013-10-11 タンデム四重極型質量分析装置

Publications (3)

Publication Number Publication Date
JP2015076338A JP2015076338A (ja) 2015-04-20
JP2015076338A5 JP2015076338A5 (enExample) 2016-03-10
JP6176049B2 true JP6176049B2 (ja) 2017-08-09

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JP2013213315A Active JP6176049B2 (ja) 2013-10-11 2013-10-11 タンデム四重極型質量分析装置

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US (1) US9142394B2 (enExample)
JP (1) JP6176049B2 (enExample)
CN (2) CN108287208A (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
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WO2017025892A1 (en) * 2015-08-13 2017-02-16 Dh Technologies Development Pte. Ltd. Deconvolution of mixed spectra
JP6406456B2 (ja) * 2015-09-15 2018-10-17 株式会社島津製作所 質量分析装置、質量分析方法、及び質量分析用プログラム
EP3384517B1 (en) * 2015-12-01 2020-08-05 DH Technologies Development Pte. Ltd. Sentinel signal for adaptive retention time in targeted ms methods
US10665442B2 (en) 2016-02-29 2020-05-26 Shimadzu Corporation Mass spectrometer
WO2017179147A1 (ja) * 2016-04-13 2017-10-19 株式会社島津製作所 質量分析を用いた異性体分析方法及びタンデム型質量分析装置
US10139379B2 (en) * 2016-06-22 2018-11-27 Thermo Finnigan Llc Methods for optimizing mass spectrometer parameters
JPWO2018011861A1 (ja) * 2016-07-11 2018-11-29 株式会社島津製作所 分析装置
WO2018109895A1 (ja) * 2016-12-15 2018-06-21 株式会社島津製作所 質量分析装置
US11456167B2 (en) * 2016-12-22 2022-09-27 Shimadzu Corporation Mass spectrometer and program for mass spectrometer
JP6834582B2 (ja) * 2017-02-23 2021-02-24 株式会社島津製作所 質量分析装置
JP6870406B2 (ja) * 2017-03-21 2021-05-12 株式会社島津製作所 タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法
JP6737396B2 (ja) 2017-03-23 2020-08-05 株式会社島津製作所 質量分析装置及びクロマトグラフ質量分析装置
GB2604834B (en) * 2017-04-12 2023-04-12 Micromass Ltd Optimised targeted analysis
GB2561378B (en) 2017-04-12 2022-10-12 Micromass Ltd Optimised targeted analysis
WO2020240506A1 (en) 2019-05-31 2020-12-03 Dh Technologies Development Pte. Ltd. Method for real time encoding of scanning swath data and probabilistic framework for precursor inference
WO2020241454A1 (ja) * 2019-05-31 2020-12-03 株式会社新日本科学 クロマトグラフ質量分析装置を用いた質量分析方法
WO2021122784A1 (en) 2019-12-17 2021-06-24 Roche Diagnostics Gmbh Method and device for multiple transition monitoring
US11587774B2 (en) * 2020-09-21 2023-02-21 Thermo Finnigan Llc Using real time search results to dynamically exclude product ions that may be present in the master scan
JP2024063856A (ja) * 2022-10-27 2024-05-14 株式会社島津製作所 質量分析方法、及びクロマトグラフ質量分析装置

Family Cites Families (19)

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Publication number Priority date Publication date Assignee Title
US5342580A (en) * 1990-04-17 1994-08-30 Alan Brenner Apparatus and method for measuring the amount of gas adsorbed on or desorbed from a solid and reactions of a gas with a solid
IL122300A (en) * 1997-11-25 2005-09-25 Rafael Armament Dev Authority Modular dielectric barrier discharge device for pollution abatement
CA2255122C (en) * 1998-12-04 2007-10-09 Mds Inc. Improvements in ms/ms methods for a quadrupole/time of flight tandem mass spectrometer
JP4515819B2 (ja) * 2003-08-13 2010-08-04 株式会社日立ハイテクノロジーズ 質量分析システム
JP4843250B2 (ja) * 2005-05-13 2011-12-21 株式会社日立ハイテクノロジーズ 質量分析を用いた物質の同定方法
JP4644560B2 (ja) * 2005-08-09 2011-03-02 株式会社日立ハイテクノロジーズ 質量分析システム
WO2007044935A2 (en) * 2005-10-13 2007-04-19 Applera Corporation Methods for the development of a biomolecule assay
JP2007121134A (ja) * 2005-10-28 2007-05-17 Hitachi High-Technologies Corp タンデム質量分析システム
US8271203B2 (en) * 2006-07-12 2012-09-18 Dh Technologies Development Pte. Ltd. Methods and systems for sequence-based design of multiple reaction monitoring transitions and experiments
US8335655B2 (en) * 2008-05-30 2012-12-18 Dh Technologies Development Pte. Ltd. Intelligent saturation control for compound specific optimization of MRM
JP2010019655A (ja) * 2008-07-10 2010-01-28 Shimadzu Corp クロマトグラフ質量分析装置
CN101629941A (zh) * 2009-08-03 2010-01-20 新疆出入境检验检疫局检验检疫技术中心 一种快速检测乳粉中三聚氰酸的方法
US10393754B2 (en) * 2010-02-17 2019-08-27 Cedars-Sinai Medical Center Methods of diagnosing and treating heart failure
JP5709155B2 (ja) * 2010-04-28 2015-04-30 独立行政法人理化学研究所 スケジューリング装置、スケジューリング方法、スケジューリングプログラム、記録媒体、および質量分析システム
JP5408107B2 (ja) * 2010-11-10 2014-02-05 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置及び同装置用プログラム
JP5799618B2 (ja) * 2011-07-06 2015-10-28 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置及び同装置用プログラム
CN102539573B (zh) * 2012-01-09 2013-04-24 浙江省中医药研究院 Uplc-tqd联用技术同时测定组织引流液中万古霉素与妥布霉素含量的方法
JP2013175297A (ja) * 2012-02-23 2013-09-05 Shimadzu Corp 三連四重極型質量分析装置
GB201205009D0 (en) * 2012-03-22 2012-05-09 Micromass Ltd Multi-dimensional survey scans for improved data dependent acquisitions (DDA)

Also Published As

Publication number Publication date
CN104569234A (zh) 2015-04-29
CN104569234B (zh) 2018-11-02
CN108287208A (zh) 2018-07-17
JP2015076338A (ja) 2015-04-20
US9142394B2 (en) 2015-09-22
US20150102219A1 (en) 2015-04-16

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