JP6140008B2 - 放射線撮像装置及び放射線検査装置 - Google Patents

放射線撮像装置及び放射線検査装置 Download PDF

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JP6140008B2
JP6140008B2 JP2013138444A JP2013138444A JP6140008B2 JP 6140008 B2 JP6140008 B2 JP 6140008B2 JP 2013138444 A JP2013138444 A JP 2013138444A JP 2013138444 A JP2013138444 A JP 2013138444A JP 6140008 B2 JP6140008 B2 JP 6140008B2
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signal
sensor
unit
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imaging apparatus
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JP2015012546A (ja
JP2015012546A5 (enExample
Inventor
貴史 山▲崎▼
貴史 山▲崎▼
齋藤　秀彦
秀彦 齋藤
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Canon Inc
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Canon Inc
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Priority to JP2013138444A priority Critical patent/JP6140008B2/ja
Priority to US14/308,829 priority patent/US9838619B2/en
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
JP2013138444A 2013-07-01 2013-07-01 放射線撮像装置及び放射線検査装置 Active JP6140008B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013138444A JP6140008B2 (ja) 2013-07-01 2013-07-01 放射線撮像装置及び放射線検査装置
US14/308,829 US9838619B2 (en) 2013-07-01 2014-06-19 Radiation imaging apparatus and radiation inspection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013138444A JP6140008B2 (ja) 2013-07-01 2013-07-01 放射線撮像装置及び放射線検査装置

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JP2017086496A Division JP6373442B2 (ja) 2017-04-25 2017-04-25 放射線撮像装置及び放射線検査装置

Publications (3)

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JP2015012546A JP2015012546A (ja) 2015-01-19
JP2015012546A5 JP2015012546A5 (enExample) 2016-08-12
JP6140008B2 true JP6140008B2 (ja) 2017-05-31

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US (1) US9838619B2 (enExample)
JP (1) JP6140008B2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6674222B2 (ja) * 2015-10-09 2020-04-01 キヤノン株式会社 放射線撮像装置および放射線撮像装置の制御方法
JP6708474B2 (ja) * 2016-04-28 2020-06-10 キヤノン株式会社 撮像装置及び放射線撮像システム
JP6853652B2 (ja) * 2016-11-07 2021-03-31 キヤノン株式会社 放射線撮像装置、放射線撮像システム、放射線撮像装置の駆動方法およびプログラム
JP6917752B2 (ja) 2017-04-03 2021-08-11 キヤノン株式会社 放射線撮影装置およびその制御方法、プログラム
JP7038506B2 (ja) 2017-08-25 2022-03-18 キヤノン株式会社 放射線撮像装置、放射線撮像システムおよび放射線撮像装置の作動方法
JP7033932B2 (ja) * 2018-01-17 2022-03-11 キヤノン株式会社 放射線撮像装置、放射線撮像装置の制御方法およびプログラム
JP7245001B2 (ja) * 2018-05-29 2023-03-23 キヤノン株式会社 放射線撮像装置および撮像システム
JP6860538B2 (ja) 2018-09-26 2021-04-14 キヤノン株式会社 放射線撮像装置、放射線撮像システム、放射線撮像装置の制御方法、および、プログラム

Family Cites Families (14)

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US6999119B1 (en) * 1998-04-10 2006-02-14 Nikon Corporation Image-capturing element, image-capturing circuit for processing signal from image-capturing element, image-capturing device, driving method of image-capturing element
US6078037A (en) * 1998-04-16 2000-06-20 Intel Corporation Active pixel CMOS sensor with multiple storage capacitors
JP3592106B2 (ja) * 1998-11-27 2004-11-24 キヤノン株式会社 固体撮像装置およびカメラ
US6972794B1 (en) * 1999-06-15 2005-12-06 Micron Technology, Inc. Dual sensitivity image sensor
JP4724313B2 (ja) 2001-05-18 2011-07-13 キヤノン株式会社 撮像装置、放射線撮像装置及びそれを用いた放射線撮像システム
US8843115B2 (en) 2008-06-23 2014-09-23 Qualcomm Incorporated Method and apparatus for managing system information modification in a wireless communication system
EP2294455B1 (en) * 2008-06-26 2015-07-22 Philips Intellectual Property & Standards GmbH High dynamic range x-ray detector with improved signal to noise ratio
JP5665484B2 (ja) * 2010-10-29 2015-02-04 キヤノン株式会社 撮像装置、放射線撮影システム、イメージセンサの制御方法
JP2013012886A (ja) * 2011-06-29 2013-01-17 Canon Inc 放射線撮像装置、方法、および放射線撮像システム
US8817153B2 (en) * 2011-07-25 2014-08-26 Aptina Imaging Corporation Column parallel readout image sensors with shared column analog-to-digital converter circuitry
JP6061532B2 (ja) * 2011-08-22 2017-01-18 キヤノン株式会社 制御装置、撮影装置および制御方法
JP6039926B2 (ja) 2012-06-12 2016-12-07 キヤノン株式会社 放射線撮影装置、放射線撮影装置の制御方法、およびプログラム
JP6116152B2 (ja) 2012-07-31 2017-04-19 キヤノン株式会社 イメージセンサ駆動装置および方法、放射線画像撮像装置
JP6159062B2 (ja) 2012-07-31 2017-07-05 キヤノン株式会社 撮影装置およびその制御方法

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JP2015012546A (ja) 2015-01-19
US9838619B2 (en) 2017-12-05

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