JP6114300B2 - Ｘ線検出器アレイ及びｃｔスキャナ - Google Patents

Ｘ線検出器アレイ及びｃｔスキャナ Download PDF

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Publication number
JP6114300B2
JP6114300B2 JP2014542978A JP2014542978A JP6114300B2 JP 6114300 B2 JP6114300 B2 JP 6114300B2 JP 2014542978 A JP2014542978 A JP 2014542978A JP 2014542978 A JP2014542978 A JP 2014542978A JP 6114300 B2 JP6114300 B2 JP 6114300B2
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Japan
Prior art keywords
ray
scintillator
detector array
ray detector
sealing portion
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Expired - Fee Related
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JP2014542978A
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Japanese (ja)
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JP2015503096A (ja
Inventor
レヴィン，シムハ
フェーン，ニコラース ヨーハネス アントニユス ファン
フェーン，ニコラース ヨーハネス アントニユス ファン
グレゴリアン，レヴ
ラート，アントニユス ウィルヘルミュス マリア デ
ラート，アントニユス ウィルヘルミュス マリア デ
フランシスキュス コルネリス マリア レイテン，ヘラルデュス
フランシスキュス コルネリス マリア レイテン，ヘラルデュス
ゴーシェン，ラファエル
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/2019—Shielding against direct hits

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  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biochemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP2014542978A 2011-11-29 2012-11-23 Ｘ線検出器アレイ及びｃｔスキャナ Expired - Fee Related JP6114300B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161564407P 2011-11-29 2011-11-29
US61/564,407 2011-11-29
PCT/IB2012/056665 WO2013080105A2 (en) 2011-11-29 2012-11-23 Scintillator pack comprising an x-ray absorbing encapsulation and x-ray detector array comprising such scintillator pack

Publications (2)

Publication Number Publication Date
JP2015503096A JP2015503096A (ja) 2015-01-29
JP6114300B2 true JP6114300B2 (ja) 2017-04-12

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JP2014542978A Expired - Fee Related JP6114300B2 (ja) 2011-11-29 2012-11-23 Ｘ線検出器アレイ及びｃｔスキャナ

Country Status (8)

Country Link
US (1) US9599728B2 (enExample)
EP (1) EP2751595B1 (enExample)
JP (1) JP6114300B2 (enExample)
CN (1) CN103959098B (enExample)
BR (1) BR112014012699A8 (enExample)
IN (1) IN2014CN03832A (enExample)
RU (1) RU2605520C2 (enExample)
WO (1) WO2013080105A2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
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WO2015032865A1 (en) * 2013-09-05 2015-03-12 Koninklijke Philips N.V. Radiation detector element
CN106663685A (zh) * 2014-06-06 2017-05-10 夏普株式会社 半导体装置及其制造方法
US10899672B2 (en) * 2014-09-25 2021-01-26 Koninklijke Philips N.V. Ceramic material for generating light
JP6671839B2 (ja) * 2014-10-07 2020-03-25 キヤノン株式会社 放射線撮像装置及び撮像システム
KR102624385B1 (ko) * 2015-09-24 2024-01-11 프리스매틱 센서즈 에이비 모듈식 x선 검출기(modular x-ray detector)
CN109690351B (zh) 2016-09-23 2022-12-09 深圳帧观德芯科技有限公司 半导体x射线检测器的封装
EP3399344B1 (en) * 2017-05-03 2021-06-30 ams International AG Semiconductor device for indirect detection of electromagnetic radiation and method of production
CN109709594B (zh) * 2018-12-18 2020-12-11 北京纳米维景科技有限公司 闪烁屏封装结构制造方法、闪烁屏封装结构及影像探测器
CN111697109A (zh) * 2020-07-09 2020-09-22 上海大学 一种柔性x射线探测器的制备方法及系统

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JPH08122492A (ja) 1994-10-19 1996-05-17 Sumitomo Electric Ind Ltd 放射線遮蔽材及びその製造方法
EP1051643B1 (en) * 1998-10-28 2005-09-14 Koninklijke Philips Electronics N.V. Method of manufacturing a layered scintillation detector
JP2001099941A (ja) 1999-09-30 2001-04-13 Hitachi Metals Ltd 放射線遮蔽板、放射線検出器及び放射線遮蔽板の製造方法
US6298113B1 (en) * 2000-02-07 2001-10-02 General Electric Company Self aligning inter-scintillator reflector x-ray damage shield and method of manufacture
AU2001274544A1 (en) 2000-06-20 2002-01-02 Kanebo Gohsen Limited Radiation shielding material
JP2003084066A (ja) 2001-04-11 2003-03-19 Nippon Kessho Kogaku Kk 放射線検出器用部品、放射線検出器および放射線検出装置
US6519313B2 (en) * 2001-05-30 2003-02-11 General Electric Company High-Z cast reflector compositions and method of manufacture
JP2003028986A (ja) 2001-07-12 2003-01-29 Mitsubishi Plastics Ind Ltd 放射線遮蔽材料
AU2003250433A1 (en) * 2002-09-18 2004-04-08 Koninklijke Philips Electronics N.V. X-ray detector with a plurality of detector units
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JP4833554B2 (ja) * 2003-01-06 2011-12-07 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 放射線検出器モジュールと該放射線検出器モジュールを用いたコンピュータ断層撮影用スキャナ、および放射線検出方法
JP2004219318A (ja) * 2003-01-16 2004-08-05 Hamamatsu Photonics Kk 放射線検出器
CN101115344A (zh) * 2003-02-20 2008-01-30 因普有限公司 产生x射线的系统
JP4500010B2 (ja) 2003-06-16 2010-07-14 株式会社日立メディコ Ｘ線検出器及びこれを用いたｘ線ｃｔ装置
RU2251124C1 (ru) * 2003-10-14 2005-04-27 ГОУ ВПО Уральский государственный технический университет-УПИ СЦИНТИЛЛЯЦИОННЫЙ ДАТЧИК ЭЛЕКТРОННОГО И β-ИЗЛУЧЕНИЯ
JP2007514158A (ja) * 2003-12-09 2007-05-31 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Ｘ線検出器のシールド
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US20080068815A1 (en) * 2006-09-18 2008-03-20 Oliver Richard Astley Interface Assembly And Method for Integrating A Data Acquisition System on a Sensor Array
JP5587788B2 (ja) * 2007-12-21 2014-09-10 コーニンクレッカ フィリップス エヌ ヴェ 複合樹脂におけるシンチレータを備えた放射線感受性検出器
JP2010096616A (ja) * 2008-10-16 2010-04-30 Fujifilm Corp 放射線画像検出器
US8373132B2 (en) * 2009-02-06 2013-02-12 Koninklijke Philips Electronics N. V. Radiation detector with a stack of scintillator elements and photodiode arrays
JP2013518248A (ja) 2010-01-22 2013-05-20 デンシーティー リミテッド マルチカメラｘ線フラットパネル検出器のための方法及び装置

Also Published As

Publication number Publication date
WO2013080105A2 (en) 2013-06-06
BR112014012699A2 (pt) 2017-06-13
BR112014012699A8 (pt) 2017-06-20
RU2605520C2 (ru) 2016-12-20
IN2014CN03832A (enExample) 2015-07-03
EP2751595B1 (en) 2017-07-05
CN103959098B (zh) 2017-04-26
JP2015503096A (ja) 2015-01-29
CN103959098A (zh) 2014-07-30
US9599728B2 (en) 2017-03-21
RU2014126371A (ru) 2016-01-27
EP2751595A2 (en) 2014-07-09
WO2013080105A3 (en) 2013-12-27
US20140321609A1 (en) 2014-10-30

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