IN2014CN03832A - - Google Patents
Info
- Publication number
- IN2014CN03832A IN2014CN03832A IN3832CHN2014A IN2014CN03832A IN 2014CN03832 A IN2014CN03832 A IN 2014CN03832A IN 3832CHN2014 A IN3832CHN2014 A IN 3832CHN2014A IN 2014CN03832 A IN2014CN03832 A IN 2014CN03832A
- Authority
- IN
- India
- Prior art keywords
- scintillator
- encapsulation
- ray
- electronic circuit
- pack
- Prior art date
Links
- 238000005538 encapsulation Methods 0.000 abstract 4
- 239000011358 absorbing material Substances 0.000 abstract 1
- 229910000416 bismuth oxide Inorganic materials 0.000 abstract 1
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
- G01T1/2019—Shielding against direct hits
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Radiology & Medical Imaging (AREA)
- Immunology (AREA)
- Theoretical Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pulmonology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Conversion Of X-Rays Into Visible Images (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161564407P | 2011-11-29 | 2011-11-29 | |
| PCT/IB2012/056665 WO2013080105A2 (en) | 2011-11-29 | 2012-11-23 | Scintillator pack comprising an x-ray absorbing encapsulation and x-ray detector array comprising such scintillator pack |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014CN03832A true IN2014CN03832A (enExample) | 2015-07-03 |
Family
ID=47603861
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN3832CHN2014 IN2014CN03832A (enExample) | 2011-11-29 | 2012-11-23 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9599728B2 (enExample) |
| EP (1) | EP2751595B1 (enExample) |
| JP (1) | JP6114300B2 (enExample) |
| CN (1) | CN103959098B (enExample) |
| BR (1) | BR112014012699A8 (enExample) |
| IN (1) | IN2014CN03832A (enExample) |
| RU (1) | RU2605520C2 (enExample) |
| WO (1) | WO2013080105A2 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BR112015008750A2 (pt) * | 2013-09-05 | 2017-07-04 | Koninklijke Philips Nv | elemento detector de radiação; método; dispositivo de imageamento médico; e método para construir um detector de radiação |
| CN106663685A (zh) * | 2014-06-06 | 2017-05-10 | 夏普株式会社 | 半导体装置及其制造方法 |
| JP6739423B2 (ja) * | 2014-09-25 | 2020-08-12 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 光を発生させるセラミック材料 |
| JP6671839B2 (ja) * | 2014-10-07 | 2020-03-25 | キヤノン株式会社 | 放射線撮像装置及び撮像システム |
| CN115047511B (zh) * | 2015-09-24 | 2025-07-29 | 棱镜传感器公司 | 模块化的x射线检测器 |
| CN109690351B (zh) | 2016-09-23 | 2022-12-09 | 深圳帧观德芯科技有限公司 | 半导体x射线检测器的封装 |
| EP3399344B1 (en) * | 2017-05-03 | 2021-06-30 | ams International AG | Semiconductor device for indirect detection of electromagnetic radiation and method of production |
| CN109709594B (zh) * | 2018-12-18 | 2020-12-11 | 北京纳米维景科技有限公司 | 闪烁屏封装结构制造方法、闪烁屏封装结构及影像探测器 |
| CN111697109A (zh) * | 2020-07-09 | 2020-09-22 | 上海大学 | 一种柔性x射线探测器的制备方法及系统 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08122492A (ja) | 1994-10-19 | 1996-05-17 | Sumitomo Electric Ind Ltd | 放射線遮蔽材及びその製造方法 |
| JP2002528730A (ja) * | 1998-10-28 | 2002-09-03 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | シンチレータ層による検出器を製造する方法 |
| JP2001099941A (ja) | 1999-09-30 | 2001-04-13 | Hitachi Metals Ltd | 放射線遮蔽板、放射線検出器及び放射線遮蔽板の製造方法 |
| US6298113B1 (en) * | 2000-02-07 | 2001-10-02 | General Electric Company | Self aligning inter-scintillator reflector x-ray damage shield and method of manufacture |
| AU2001274544A1 (en) | 2000-06-20 | 2002-01-02 | Kanebo Gohsen Limited | Radiation shielding material |
| JP2003084066A (ja) * | 2001-04-11 | 2003-03-19 | Nippon Kessho Kogaku Kk | 放射線検出器用部品、放射線検出器および放射線検出装置 |
| US6519313B2 (en) * | 2001-05-30 | 2003-02-11 | General Electric Company | High-Z cast reflector compositions and method of manufacture |
| JP2003028986A (ja) | 2001-07-12 | 2003-01-29 | Mitsubishi Plastics Ind Ltd | 放射線遮蔽材料 |
| US7112799B2 (en) * | 2002-09-18 | 2006-09-26 | Koninklijke Philips Electronics N.V. | X-ray detector with a plurality of detector units |
| WO2004027453A1 (en) * | 2002-09-18 | 2004-04-01 | Koninklijke Philips Electronics N.V. | Radiation detector |
| JP4833554B2 (ja) * | 2003-01-06 | 2011-12-07 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 放射線検出器モジュールと該放射線検出器モジュールを用いたコンピュータ断層撮影用スキャナ、および放射線検出方法 |
| JP2004219318A (ja) * | 2003-01-16 | 2004-08-05 | Hamamatsu Photonics Kk | 放射線検出器 |
| CN1751543B (zh) | 2003-02-20 | 2011-02-02 | 因普有限公司 | 集成的x射线源模块 |
| JP4500010B2 (ja) * | 2003-06-16 | 2010-07-14 | 株式会社日立メディコ | Ｘ線検出器及びこれを用いたｘ線ｃｔ装置 |
| RU2251124C1 (ru) * | 2003-10-14 | 2005-04-27 | ГОУ ВПО Уральский государственный технический университет-УПИ | СЦИНТИЛЛЯЦИОННЫЙ ДАТЧИК ЭЛЕКТРОННОГО И β-ИЗЛУЧЕНИЯ |
| WO2005057235A1 (en) * | 2003-12-09 | 2005-06-23 | Philips Intellectual Property & Standards Gmbh | Shielding for an x-ray detector |
| US7166849B2 (en) * | 2004-08-09 | 2007-01-23 | General Electric Company | Scintillator array for use in a CT imaging system and method for making the scintillator array |
| CN101142497B (zh) * | 2005-03-16 | 2011-06-01 | 皇家飞利浦电子股份有限公司 | 具有像素内处理电路的x射线检测器 |
| EP1876955B1 (en) | 2005-04-26 | 2016-11-23 | Koninklijke Philips N.V. | Double decker detector for spectral ct |
| EP1877832B1 (en) * | 2005-04-26 | 2018-02-21 | Koninklijke Philips N.V. | Detector array for spectral ct |
| JP4192990B2 (ja) | 2006-03-13 | 2008-12-10 | 日立金属株式会社 | 放射線検出装置 |
| US7582879B2 (en) * | 2006-03-27 | 2009-09-01 | Analogic Corporation | Modular x-ray measurement system |
| US8710448B2 (en) * | 2006-03-30 | 2014-04-29 | Koninklijke Philips N.V. | Radiation detector array |
| US20080068815A1 (en) * | 2006-09-18 | 2008-03-20 | Oliver Richard Astley | Interface Assembly And Method for Integrating A Data Acquisition System on a Sensor Array |
| RU2487373C2 (ru) * | 2007-12-21 | 2013-07-10 | Конинклейке Филипс Электроникс Н.В. | Чувствительный к излучению детектор со сцинтиллятором в композиционной смоле |
| JP2010096616A (ja) | 2008-10-16 | 2010-04-30 | Fujifilm Corp | 放射線画像検出器 |
| US8373132B2 (en) * | 2009-02-06 | 2013-02-12 | Koninklijke Philips Electronics N. V. | Radiation detector with a stack of scintillator elements and photodiode arrays |
| WO2011089528A2 (en) | 2010-01-22 | 2011-07-28 | DenCT Ltd | Methods and apparatus for multi-camera x-ray flat panel detector |
-
2012
- 2012-11-23 JP JP2014542978A patent/JP6114300B2/ja not_active Expired - Fee Related
- 2012-11-23 RU RU2014126371/28A patent/RU2605520C2/ru active
- 2012-11-23 IN IN3832CHN2014 patent/IN2014CN03832A/en unknown
- 2012-11-23 US US14/358,058 patent/US9599728B2/en active Active
- 2012-11-23 BR BR112014012699A patent/BR112014012699A8/pt not_active Application Discontinuation
- 2012-11-23 CN CN201280058399.8A patent/CN103959098B/zh active Active
- 2012-11-23 EP EP12818815.8A patent/EP2751595B1/en active Active
- 2012-11-23 WO PCT/IB2012/056665 patent/WO2013080105A2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| CN103959098A (zh) | 2014-07-30 |
| RU2605520C2 (ru) | 2016-12-20 |
| JP2015503096A (ja) | 2015-01-29 |
| CN103959098B (zh) | 2017-04-26 |
| JP6114300B2 (ja) | 2017-04-12 |
| BR112014012699A8 (pt) | 2017-06-20 |
| US9599728B2 (en) | 2017-03-21 |
| EP2751595A2 (en) | 2014-07-09 |
| RU2014126371A (ru) | 2016-01-27 |
| WO2013080105A2 (en) | 2013-06-06 |
| WO2013080105A3 (en) | 2013-12-27 |
| EP2751595B1 (en) | 2017-07-05 |
| BR112014012699A2 (pt) | 2017-06-13 |
| US20140321609A1 (en) | 2014-10-30 |
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